Publications Portal
You searched on:
Author: steven grantham
Displaying records 11 to 20 of 44 records.
Resort by: Date / Title
11.
NIST VUV metrology programs to support space-based research
Published: 1/1/2006
Authors: Robert Edward Vest, Yaniv Barad, Mitchell L. Furst, Steven Grantham, Charles S. Tarrio, Ping-Shine Shaw
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104243
12.
Saturation effects in solid state photodiodes and impact on EUVL pulse energy measurements,
Published: 1/1/2006
Authors: Robert Edward Vest, Shannon Bradley Hill, Steven Grantham
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101785
13.
Synchrotron Beamline for Extreme-Ultraviolet Multilayer Mirror Endurance Testing
Published: 5/1/2005
Authors: Charles S. Tarrio, Steven Grantham
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840203
14.
A Simple Transfer-Optics System for an Extreme-Ultraviolet Synchrotron Beamline
Published: 4/1/2005
Authors: Charles S. Tarrio, Steven Grantham, Robert Edward Vest, K Liu
Abstract: Beamlines at synchrotron radiation facilities often have interchangeable endstations to allow several different experiments to use the output of a single monochromator. However, for endstations that are sufficiently large, this is not possible. We
...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840198
15.
A simple transfer-optics system for an extreme-ultraviolet synchrotron beamline,
Published: 1/1/2005
Authors: Charles S. Tarrio, Steven Grantham, Robert Edward Vest, K Liu
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101759
16.
A synchrotron beamline for extreme-ultraviolet multilayer mirror testing,
Published: 1/1/2005
Authors: Charles S. Tarrio, Steven Grantham
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101760
17.
Optics go to extremes in EUV lithography
Published: 1/1/2005
Authors: Steven Grantham, Charles S. Tarrio, Shannon Bradley Hill, Thomas B Lucatorto
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101546
18.
Improved Radiometry For Extreme-Ultraviolet Lithography
Published: 11/1/2004
Authors: Charles S. Tarrio, Robert Edward Vest, Steven Grantham, K Liu, Thomas B Lucatorto, Ping-Shine Shaw
Abstract: The absolute cryogenic radiometer (ACR), an electrical-substitution-based detector, is the most accurate method for measurement of radiant power in the extreme ultraviolet. At the National Institute of Standards and Technology, ACR-based measurements
...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840173
19.
Imaging Material Components of an Integrated Circuit Interconnect
Published: 1/1/2004
Authors: Zachary H Levine, Steven Grantham, D J Paterson, I McNulty, I C Noyan, T M Levin
Abstract: Two regions of interest on a copper/tungsten integrated circuit interconnect were imaged using two techniques: (a) the absorption spectrum was measured at 15 x-ray energies between 1687 eV and 1897 eV; and (b) the x-ray fluorescence spectrum was reco
...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840160
20.
Imaging material components of an integrated circuit interconnect
Published: 1/1/2004
Authors: Zachary H Levine, Steven Grantham, D Paterson, I McNulty, I C Noyan, T M Levin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101597