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1. 3D Molecular Imaging SIMS
Published: 7/1/2006
Authors: John G Gillen, Albert J. Fahey, M Wagner, Christine M. Mahoney
Abstract: Thin monolayer and bilayer filsm of spin cast poly(methyl methacrylate) (PMMA), poly(2-hydroxyethyl methacrylate) (PHEMA), poly(lactic) acid (PLA) and PLA doped with several pharmaceuticals have been analyzed by dynamic SIMS using SF^d5^+ polyatomic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831393

2. Application of Inkjet Printing Technology to Produce Test Materials of 1,3,5-Trinitro-1,3,5 Triazcyclohexane for Trace Explosive Analysis
Published: 10/15/2010
Authors: Eric S Windsor, Marcela C Najarro, Anna N. Bloom, Bruce A Benner Jr, Robert A Fletcher, John G Gillen, Richard Lareau, Inho Cho, Mike Boldmand
Abstract: The feasibility of using piezoelectric drop-on-demand inkjet printing to prepare test materials for trace explosive analysis is demonstrated. Both pure high explosives and plastic-bonded putty explosives were formulated into inkjet printable solut ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902979

3. Automated Analysis of Organic Particles Using Cluster SIMS
Published: 6/1/2004
Authors: John G Gillen, Cynthia J Zeissler, Christine M. Mahoney, Abigail P. Lindstrom, Robert A Fletcher, P Chi, Jennifer R Verkouteren, David S. Bright, R Lareau, M Boldman
Abstract: Cluster primary ion bombardment combined with secondary ion imaging is used in an ion microscope secondary ion mass spectrometer for the spatially resolved analysis of organic particles on various surfaces. Compared to the use of monoatomic primary ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831316

4. Automated SIMS for Determining Isotopic Distributions in Particle Polutations
Published: 2/1/1998
Authors: David S Simons, John G Gillen, Cynthia J Zeissler, R H Fleming, P J McNitt
Abstract: A System has been developed to make rapid automated measurements of isotopic ratios from many individual micrometer-sized particles dispersed on a substrate. High particle throughput is achieved by using a commercial secondary ion microscope to coll ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831041

5. Bevel Depth Profiling SIMS for Analysis of Layer Structures
Published: 9/1/2003
Authors: John G Gillen, Scott A Wight, P Chi, Albert J. Fahey, Jennifer R Verkouteren, Eric S Windsor, D. B. Fenner
Abstract: We are evaluating the use of bevel depth profiling Secondary Ion Mass Spectrometry (SIMS) for the characterization of layered semiconductor materials. In this procedure, a sub-degree angle bevel is cut into the analytical sample with an oxygen or ce ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831302

6. Channeling-Induced Asymmetric Distortion of Depth Profiles from Polycrystalline-TiN/Ti/TiN(001) Trilayers During Secondary Ion Mass Spectrometry
Published: 5/1/2000
Authors: G Ramanath, J E Greene, I Petrov, J E Baker, L H Allen, John G Gillen
Abstract: Asymmetric depth profiles of elemental and molecular secondary ions are observed during secondary ion mass spectrometry (SIMS) analyses of polycrystalline-TiN/Ti/TiN(001) trilayers using a Cs+ ion beam. The sputter-etching rate R and the secondary i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831134

7. Characterization and Ion-Induced Degradation of Cross-Linked Poly(Methyl Methacylate) Studies Using Time of Flight Secondary Ion Mass Spectrometry
Published: 12/30/2006
Authors: M S. Wagner, K Lenghaus, John G Gillen, Michael J Tarlov
Abstract: In this study, a series of random copolymers of methyl methacrylate (MMA) and ethylene glycol dimethacrylate (EGDMA) were prepared as surface-initiated polymer (SIP) films on silicon substrates using atom transfer radical polymerization. Positive and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831017

8. Characterization of Gunpowder Samples Using Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Published: 4/1/2006
Authors: Christine M. Mahoney, John G Gillen, Albert J. Fahey
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901923

9. Characterization of High Explosive Particles Using Cluster Secondary Ion Mass Spectrometry
Published: 1/1/2006
Authors: John G Gillen, Scott A Wight, Christine M. Mahoney, Richard T. Lareau
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901035

10. Characterization of the Electron Beam Specimen Interaction in the ESEM with SIM Imaging
Published: 7/1/2000
Authors: Scott A Wight, John G Gillen, G B. Saupe
Abstract: A Secondary Ion Mass Spectrometry (SIMS) study has been undertaken to examine surfaces and films modified in the environmental scanning electron microscope (ESEM). Examination of the modifications induced by ESEM electrons and ions lead to a better ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830163