Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Author: john gillen

Displaying records 71 to 80 of 87 records.
Resort by: Date / Title

71. UV Photopatterning of Alkanethiolate Monolayers Self-Assembled on Gold and Silver
Published: 6/1/1993
Authors: Michael J Tarlov, Donald R Burgess Jr., John G Gillen

72. Compositional Changes in Aluminum-Lithium-Base Alloys Caused by Oxidation
Published: 1/1/1993
Authors: K K Soni, D. V. Williams, Dale E Newbury, John G Gillen, P. Chi, David Seymour Bright

73. Doped Gelatin Films as a Model Matrix for Molecular Secondary Ion Mass-Spectrometry Studies of Biological Soft-Tissue
Published: 1/1/1993
Authors: John G Gillen, S.M. Hues

74. Formation and Emission of Tetraalkylammonium Salt Molecular-Ions Sputtered from a Gelatin Matrix
Published: 1/1/1993
Authors: John G Gillen, J. Bennett

75. High Dynamic Range SIMS Depth Profiling on In Situ Ion-beam-generated Mesas Using the Ion Microscope
Published: 7/1/1992
Author: John G Gillen

76. Localization of Labeled Compounds in Human Hair Using SIMS
Published: 6/5/1992
Authors: John G Gillen, Cynthia J Zeissler

77. The Use of Kinetic-Engergy Distributions to Determine the Relative Contributions of Gas-Phase and Surface Fragmentation in Kiloelectronvolt Ion Sputtering of an Quaternary Ammonium Salt
Published: 4/15/1991
Author: John G Gillen

78. Image Depth Profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7-x single-crystal superconductors
Published: 1/1/1991
Authors: John G Gillen, Debra L. Kaiser, Jay S. Wallace

79. Molecular Ion Imaging and Dynamic Secondary Ion Mass Spectrometry Analysis of Organic Compounds
Published: 1/1/1990
Authors: John G Gillen, David S Simons, P. Williams
Abstract: An ion microscope equipped with a resistive anode encoder imaging system has been used to acquire molecular secondary ion images, with lateral resolutions on the order of 1 μm, from several quaternary ammonium salts an amino acid, and a polynucl ...

80. Secondary Ion Yield Matrix Effects in SIMS Depth Profiles of Si/Ge Multilayers
Published: 4/1/1989
Authors: John G Gillen, J M. Phelps, Randall W. Nelson, Peter Williams, Steven M. Hues
Abstract: Thin multilayer samples of Si/Ge, with individual layer thicknesses of 4-33 nm, have been analyzed by secondary ion mass spectrometry (SIMS) using Ar+, O2+ and Cs+ primary ion beams. Bombardment with both Ar+ and O2+ produced positive secondary ion d ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series