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Author: john gillen

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61. Molecular Imaging Secondary Ion Mass Spectrometry for the Characterization of Patterned Self-assembled Monolayers on Silver and Gold
Published: 1/1/1994
Authors: John G Gillen, J. Bennett, Michael J Tarlov, Donald R Burgess Jr
Abstract: Self-assembly of alkanethiol monolayers on gold and silver substrates is a fast, easy, and convenient method for preparing stable organic films with well-defined physical and chemical properties that can be modified by changing the terminal functiona ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902092

62. UV Photopatterning of Alkanethiolate Monolayers Self-Assembled on Gold and Silver
Published: 6/1/1993
Authors: Michael J Tarlov, Donald R Burgess Jr, John G Gillen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902027

63. Compositional Changes in Aluminum-Lithium-Base Alloys Caused by Oxidation
Published: 1/1/1993
Authors: K K Soni, D. V. Williams, Dale E Newbury, John G Gillen, P. Chi, David S. Bright
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902078

64. Doped Gelatin Films as a Model Matrix for Molecular Secondary Ion Mass-Spectrometry Studies of Biological Soft-Tissue
Published: 1/1/1993
Authors: John G Gillen, S.M. Hues
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902076

65. Formation and Emission of Tetraalkylammonium Salt Molecular-Ions Sputtered from a Gelatin Matrix
Published: 1/1/1993
Authors: John G Gillen, J. Bennett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902077

66. High Dynamic Range SIMS Depth Profiling on In Situ Ion-beam-generated Mesas Using the Ion Microscope
Published: 7/1/1992
Author: John G Gillen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902082

67. Localization of Labeled Compounds in Human Hair Using SIMS
Published: 6/5/1992
Authors: John G Gillen, Cynthia J Zeissler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902150

68. The Use of Kinetic-Engergy Distributions to Determine the Relative Contributions of Gas-Phase and Surface Fragmentation in Kiloelectronvolt Ion Sputtering of an Quaternary Ammonium Salt
Published: 4/15/1991
Author: John G Gillen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902064

69. Image Depth Profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7-x single-crystal superconductors
Published: 1/1/1991
Authors: John G Gillen, Debra L. Kaiser, Jay S. Wallace
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902083

70. Molecular Ion Imaging and Dynamic Secondary Ion Mass Spectrometry Analysis of Organic Compounds
Published: 1/1/1990
Authors: John G Gillen, David S Simons, P. Williams
Abstract: An ion microscope equipped with a resistive anode encoder imaging system has been used to acquire molecular secondary ion images, with lateral resolutions on the order of 1 μm, from several quaternary ammonium salts an amino acid, and a polynucl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902091