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You searched on: Author: john gillen

Displaying records 61 to 70 of 87 records.
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61. Development of a Triplasmatron Ion Source for the Generation of SF^d5^+ and F- Primary Ion Beams on an Ion Microscope Secondary Ion Mass Spectrometry Instrument
Published: 5/1/1999
Authors: John G Gillen, R Lance King, F Chmara
Abstract: A hot filament duoplasmatron ion source operating with argon has been modified by addition of an enclosed expansion cup mounted to the extraction side of the duoplasmatron anode. Using sulfur hexafluoride (SF^d6^) as a feed gas, this triplasmatron i ...

62. Elemental and Molecular Imaging of Human Hair Using Secondary Ion Mass Spectrometry
Published: 4/1/1999
Authors: John G Gillen, S V. Roberson, C M. Ng, M Stranick
Abstract: Secondary ion mass spectrometry (SIMS) is used to image the spatial distribution of elemental and molecular species on the surface and in cross-sections of doped human hair using a magnetic sector SIMS instrument operated as an ion microprobe. Analy ...

63. Preliminary Evaluation of an SF5+ Polyatomic Primary Ion Beam for Analysis of Organic Thin Films by Secondary Ion Mass Spectrometry
Published: 12/1/1998
Authors: John G Gillen, S V. Roberson

64. Quantitative secondary ion mass spectrometry imaging of self-assembled monolayer films for electron beam dose mapping in the environmental scanning electron microscope
Published: 7/1/1998
Authors: John G Gillen, Scott A Wight, David S. Bright, T M. Herne
Abstract: Fluorinated alkanethiol self assembled monolayers (SAM) films immobilized on gold substrates have been used as electron-sensitive resists to map quantitatively the spatial distribution of the primary electron beam scattering in an environmental scann ...

65. Automated SIMS for Determining Isotopic Distributions in Particle Polutations
Published: 2/1/1998
Authors: David S Simons, John G Gillen, Cynthia J Zeissler, R H Fleming, P J McNitt
Abstract: A System has been developed to make rapid automated measurements of isotopic ratios from many individual micrometer-sized particles dispersed on a substrate. High particle throughput is achieved by using a commercial secondary ion microscope to coll ...

66. The Scanning Scattering Microscopy for Surface and Buried Interface Roughness and Defect Imaging
Published: 12/1/1997
Authors: J Lorincik, J Fine, John G Gillen

67. Development of Environmental Scanning Electron Microscopy Electron Beam Profile Imaging with Self-assembled Monolayers and Secondary Ion Mass Spectroscopy
Published: 2/3/1997
Authors: Scott A Wight, John G Gillen, Tonya Herne

68. Use of Secondary Ion Mass Spectrometry to Image (44) Calcium Uptake in the Cell Walls of Apple Fruit
Published: 9/1/1995
Authors: Sandip Roy, John G Gillen, W.S. Conway, A.E. Watada, W.P. Wergin

69. Patterning of Self-assembled Alkanethiol Monolayers on Silver by Microfocus Ion and Electron Beam Bombardment
Published: 4/1/1994
Authors: John G Gillen, Scott A Wight, Joe Bennett, Michael J Tarlov
Abstract: Decanethiol [CH3(CH2)9SH] self-assembled monolayer films on silver substrates have been irradiated in selected areas by focused ion or electron bombardment. Subsequent immersion of the irradiated sample in a solution of a fluoromercaptan [CF3(CF2)2(C ...

70. Molecular Imaging Secondary Ion Mass Spectrometry for the Characterization of Patterned Self-assembled Monolayers on Silver and Gold
Published: 1/1/1994
Authors: John G Gillen, J. Bennett, Michael J Tarlov, Donald R Burgess Jr.
Abstract: Self-assembly of alkanethiol monolayers on gold and silver substrates is a fast, easy, and convenient method for preparing stable organic films with well-defined physical and chemical properties that can be modified by changing the terminal functiona ...

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