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1. Assessing consistency of a Mueller matrix measurement by rotation of the sample under test
Published: 9/27/2013
Author: Thomas Avery Germer
Abstract: We present a method for checking the consistency of a Mueller matrix measurement. The method is based upon the rotational properties of a Mueller matrix. The sample is placed in the polarimeter in a precision rotation stage. The Mueller matrix is th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914354

2. The NIST Robotic Optical Scatter Instrument (ROSI) and its Application to BRDF Measurements of Diffuse Reflectance Standards for Remote Sensing
Published: 9/23/2013
Authors: Heather J Patrick, Clarence Joseph Zarobila, Thomas Avery Germer
Abstract: We describe the robotic optical scatter instrument (ROSI), a new robotic arm-based goniometer for in-plane and out-of-plane reflectance and bidirectional reflectance distribution function (BRDF) measurements of surfaces. The goniometer enables BRDF ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914430

3. Gaps Analysis for CD Metrology Beyond the 22 nm Node
Published: 4/10/2013
Authors: Benjamin D. Bunday, Thomas Avery Germer, Victor Vartanian, Aaron Cordes, Aron Cepler, Charles Settens
Abstract: This paper will examine the future for critical dimension (CD) metrology. First we will present the extensive list of applications for which CD metrology solutions are needed, showing commonalities and differences among the various applications. We ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913543

4. Intercomparison between optical and x-ray scatterometry measurements of FinFET structures
Published: 4/8/2013
Authors: Paul Lemaillet, Thomas Avery Germer, Regis J Kline, Daniel Franklin Sunday, Chengqing C. Wang, Wen-Li Wu
Abstract: In this paper, we present a comparison of profile measurements of vertical field effect transistor (FinFET) fin arrays by optical critical dimension (OCD) metrology and critical dimension small angle X-ray scattering (CD-SAXS) metrology. Spectroscopi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913230

5. Remote sensing of chiral signatures on Mars
Published: 11/1/2012
Authors: William Sparks, James H. Hough, Thomas Avery Germer, Frank Robb, Ludmilla Kolokolova
Abstract: We describe circular polarization as a remote sensing diagnostic of chiral signatures which may be applied to Mars. The remarkable phenomenon of homochirality provides a unique biosignature which can be amenable to remote sensing through circular ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910692

6. Anisotropic, Hierarchical Surface Patterns via Surface Wrinkling of Nanoimprinted Polymer Films
Published: 10/22/2012
Authors: Junghyun Lee, Hyun W. Ro, Rui Huang, Thomas Avery Germer, Paul Lemaillet, Christopher Soles, Christopher M Stafford
Abstract: we demonstrated the wrinkling behavior of nanopatterned PS films, whose wrinkle wavelength and resultant morphology depend strongly on geometric parameters of surface patterns as well as the direction of the applied strain relative to the nanopattern ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912044

7. Tunable Supercontinuum Fiber Laser Source for BRDF Measurements in the STARR II Gonioreflectometer
Published: 9/27/2012
Authors: Heather J Patrick, Clarence Joseph Zarobila, Thomas Avery Germer, Victor Alan Ying, Catherine C Cooksey, Benjamin K Tsai
Abstract: STARR II is a planned NIST facility for spectral measurements of specular reflectance and diffuse bidirectional reflectance distribution function (BRDF) that is the follow-on to the current NIST STARR (Spectral Tri-function Automated Reference Reflec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912019

8. Upper roughness limitations on the TIS/RMS relationship
Published: 9/27/2012
Authors: J C Stover, Sven Schroeder, Thomas Avery Germer
Abstract: The relationship between total integrated scatter (TIS) and root mean square (rms) roughness was developed in the radar literature and enabled the first use of scatter measurements to monitor optical roughness. This relationship has been used and mi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911799

9. A compact and robust method for full Stokes spectropolarimetry
Published: 8/1/2012
Authors: William Sparks, Thomas Avery Germer, John MacKenty, Frans Snik
Abstract: We present an approach to spectropolarimetry which requires neither moving parts nor time dependent modulation, and which o ers the prospect of achieving high sensitivity. The concept, which is one of those generically known as channeled polarimetry, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911231

10. Out-of-plane Stokes imaging polarimeter for early skin cancer diagnosis
Published: 7/1/2012
Authors: P. Ghassemi, Paul Lemaillet, Thomas Avery Germer, J. W. Shupp, S. Venna, M. E. Boisvert, K. E. Flanagan, M. H. Jordan, J. C. Ramella-Roman
Abstract: Optimal treatment of skin cancer before it metastasizes depends critically on early diagnosis and treatment. Imaging spectroscopy and polarized remittance have been utilized in the past for diagnostic purposes, but valuable information can be also o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910098



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