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Author: thomas germer

Displaying records 151 to 159.
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151. Specular and Diffuse Reflection Measurements of Electronic Displays
Published: 5/1/1996
Authors: George R Jones, Edward D. Kelley, Thomas Avery Germer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25380

152. Specular and Diffuse Reflection Measurements of Electronic Displays
Published: 1/1/1996
Authors: G R Jones, E F Kelley, Thomas Avery Germer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104563

153. Picosecond Time-Resolved Adsorbate Response to Substrate Heating: Spectroscopy and Dynamics of CO/Cu(100)
Published: 1/1/1994
Authors: Thomas Avery Germer, John C. Stephenson, Edwin J Heilweil, Richard R Cavanagh
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103807

154. Hot Carrier Excitation of Adlayers: Time-resolved Measurement of Adsorbate-Lattice Coupling
Published: 1/1/1993
Authors: Thomas Avery Germer, John C. Stephenson, Edwin J Heilweil, Richard R Cavanagh
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103809

155. Picosecond Measurement of Substrate-to-adsorbate Energy Transfer: The Frustrated Translation of CO/Pt(111)
Published: 1/1/1993
Authors: Thomas Avery Germer, John C. Stephenson, Edwin J Heilweil, Richard R Cavanagh
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103808

156. Time-resolved Measurements of Substrate to Adsorbate Energy Transfer
Published: 1/1/1993
Authors: Richard R Cavanagh, Thomas Avery Germer, Edwin J Heilweil, John C. Stephenson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104358

157. A Novel Hemispherical Spectro-Polarimetric Scattering Instrument for Skin Lesion Imaging
Published: Date unknown
Authors: Bruno Boulbry, Thomas Avery Germer, J C Ramella-Roman
Abstract: We present a novel spectro-polarimetric instrument based on hemispherical backscattering for the assessment of superficial skin lesions. The system is capable of capturing polarized light images non-invasively. The effect of the rough skin backscatte ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841010

158. Modeling, Measurement, and Standards for Wafer Inspection
Published: Date unknown
Authors: George William Mulholland, Thomas Avery Germer, J C Stover
Abstract: The major technical issues regarding the calibration of Surface Scanning Inspection Systems (SSIS) are presented including descriptions of the salient features of SSISs and the deposition system using the differential mobility analyzer. The role of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=861216

159. Size-Monodisperse Metal Nanoparticles Via Hydrogen-Free Spray Pyrolysis
Published: Date unknown
Authors: Jae Hyun Kim, Thomas Avery Germer, George William Mulholland, S H Ehrman
Abstract: Pure copper nanoparticles were produced using a co-solvent approach avoiding use of hydrogen or other reducing gas. Compared with the particles formed without the co-solvent, the addition of alcohol has a significant effect in preventing oxidation, w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=861090



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