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Author: yvonne gerbig
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1. Accurate Spring Constant Calibration for very Stiff Atomic Force Microscopy Cantilevers
Published: 11/26/2013
Authors: Scott Grutzik, Richard Swift Gates, Yvonne Beatrice Gerbig, Douglas T Smith, Robert Francis Cook, Alan Zehnder
Abstract: There are many atomic force microscopy (AFM) applications that rely on quantifying the force between the AFM cantilever tip and the sample. The AFM does not explicitly measure force, however, so in such cases knowledge of the cantilever stiffness ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912481

2. Combinatorial study of the crystallinity boundary in the HfO2-TiO2-Y2O3 system using pulsed laser deposition library thin films
Published: 5/16/2008
Authors: Peter K. Schenck, Jennifer L Klamo, Nabil Bassim, Peter G. Burke, Yvonne Beatrice Gerbig, Martin L Green
Abstract: HfO2-TiO2-Y2O3 is an interesting high-k dielectric system.  Combinatorial library films of this system enable the study of the role of composition on phase formation as well as optical and mechanical properties.  A library film of this syst ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853610

3. Comparison of Nanoscale Measurements of Strain and Stress using Electron Back Scattered Diffraction and Confocal Raman Microscopy
Published: 12/12/2008
Authors: Mark D Vaudin, Yvonne Beatrice Gerbig, Stephan J Stranick, Robert Francis Cook
Abstract: Strains in Si as small as 104 (corresponding to stresses of 10 MPa) have been measured using electron back scatter diffraction (EBSD), with spatial resolution close to 10 nm, and confocal Raman microscopy (CRM) with spatial resolution app ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854129

4. Direct observation of phase transformation anisotropy in indented silicon using confocal Raman microscopy
Published: 5/31/2011
Authors: Yvonne Beatrice Gerbig, Stephan J Stranick, Robert Francis Cook
Abstract: The theoretically-predicted anisotropic nature of the indentation phase transformation in silicon (Si) is observed directly in experiments using hyperspectral, confocal Raman microscopy. The anisotropy is reflected in the two-dimensional distribution ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906105

5. Effect of crystallographic orientation on phase transformations during indentation of silicon
Published: 3/9/2009
Authors: Yvonne Beatrice Gerbig, Dylan Morris, Stephan J Stranick, Mark D Vaudin, Robert Francis Cook
Abstract: In a statistical nanoindentation study using a spherical probe, the effect of crystallographic orientation on the phase transformation of silicon (Si) was investigated. The presence and pressure at which events associated with phase transformation oc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854143

6. High Confidence Level Calibration for AFM Based Fracture Testing of Nanobeams
Published: 6/11/2012
Authors: Scott Grutzik, Richard Swift Gates, Yvonne Beatrice Gerbig, Robert Francis Cook, Melissa Hines, Alan Zehnder
Abstract: When designing micro- or nanoelectromechanical systems, (MEMS and NEMS), it is important to consider whether structural elements will withstand loads experienced during operation. Fracture behavior at length scales present in MEMS and NEMS is much di ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911026

7. Improving Fatigue Strength of Alumina through Surface Grading
Published: 5/9/2011
Authors: Yvonne Beatrice Gerbig, Linlin Ren, Lela Liu, Sanjit Bhowmick, Malvin Janal, Van Thompson, Yu Zhang
Abstract: Porcelain veneered alumina crown restorations often fail from bulk fracture resulting from radial cracks that initiate at the cementation surface with repeated flexure of the stiffer crown layers on the soft dentin support. We hypothesize that bulk f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907566

8. In situ observation of the indentation-induced phase transformation of silicon thin films
Published: 3/5/2012
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Aaron M Forster, Robert Francis Cook
Abstract: Indentation-induced phase transformation processes were studied by in situ Raman microspectroscopy of the deformed contact region of silicon on sapphire samples during contact loading and unloading. During loading, the formation of Si-II and another ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910047

9. Indentation device for in situ Raman spectroscopic and optical studies
Published: 12/12/2012
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Aaron M Forster, John W Hettenhouser, Walter Eric Byrd, Dylan J. Morris, Robert Francis Cook
Abstract: Instrumented indentation is a widely used technique to study the mechanical behavior of materials at small length scales and thus has been exploited in particular for metals, ceramics, glasses, and polymers. Mechanical tests of bulk materials, micros ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911470

10. Measurement of residual stress field anisotropy at indentations in silicon
Published: 6/23/2010
Authors: Yvonne Beatrice Gerbig, Stephan J Stranick, Robert Francis Cook
Abstract: The residual stress field around spherical indentations on single crystal silicon (Si) of different crystallographic orientation is mapped by confocal Raman microscopy. All orientations exhibit an anisotropic stress pattern with an orientation spec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905445



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