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1. A Low Cost Digital Vibration Meter
Journal of Research (NIST JRES)
William V Payne, Jon Geist
This report describes the development of a low cost vibration amplitude sensor. The processes used to develop this sensor involve the use of Micro-Electronic and Mechanical Systems (MEMS) manufacturing techniques. The major mechanical element of th ...
2. A Simple, Low-Contrast Thermal Resolution Test Target
Jon C Geist, J. E. Luther, Donald B. Novotny, J. Vahakangas
3. A localized transition in the size variation of circular DNA in nanofluidic slitlike confinement
Elizabeth A Strychalski, Samuel M Stavis, Jon C Geist
We report strong evidence for a localized transition in the size variation of circular DNA between
strong and moderate regimes of slitlike confinement. A novel and rigorous statistical analysis was
applied to our recent experimental measurements ...
4. Abstracts for the MSEL Assessment Panel, March 2001
Leslie E Smith, Alamgir Karim, Leonid A Bendersky, C Lu, J J Scott, Ichiro Takeuchi, Kathleen M. Flynn, Vinod K Tewary, Davor Balzar, G A Alers, Stephen E Russek, Charles C. Dr. Han, Haonan Wang, William E Wallace, Daniel A Fischer, K Efimenko, Wen-Li Wu, Jan Genzer, Joseph C Woicik, Thomas H Gnaupel-Herold, Henry Joseph Prask, Charles F Majkrzak, Norman F. Berk, John Barker, Charles Joseph Glinka, Eric K Lin, Ward L Johnson, Paul R Heyliger, David Thomas Read, R R Keller, J Blendell, Grady S White, Lin-Sien H Lum, Eric J Cockayne, Igor Levin, C E Johnson, Maureen E Williams, Gery R Stafford, William J Boettinger, Kil-Won Moon, Daniel Josell, Daniel Wheeler, Thomas P Moffat, W H Huber, Lee J Richter, Clayton S. Yang, Robert D. Shull, R A. Fry, Robert D McMichael, William F. Egelhoff Jr., Ursula R Kattner, James A Warren, Jonathan E Guyer, Steven P Mates, Stephen D Ridder, Frank S. Biancaniello, D Basak, Jon C Geist, Kalman D Migler
Abstracts relating to research and development in the NIST Materials Science and Engineering Laboratory (MSEL) are presented for a poster session to be presented to the 2001 MSEL Assessment Panel.
5. Accurate optical analysis of single molecule entrapment in nanoscale vesicles
Joseph E. Reiner, Andreas Jahn, Samuel M Stavis, Michael J Culbertson, Wyatt N Vreeland, Daniel L Burden, Jon C Geist, Michael Gaitan
We present a non-destructive method to characterize low analyte concentrations in nanometer scale lipid vesicle formulations. Our method is based on the application of fluorescence fluctuation analysis (FFA) and multi-angle laser light scattering (M ...
6. An Accurate Value for the Absorption Coefficient of Silicon at 633 nm
Journal of Research (NIST JRES)
Jon C Geist, A. R. Schaefer, J-F. Song, Y. H. Wang, E. F. Zalewski
7. An X-Ray Monochromator Crystal Which Detects the Bragg Condition
Terrence J Jach, Donald B. Novotny, G. P. Carver, Jon C Geist, R D Spal
8. Analog BIST Functionality for Microhotplate Temperature Sensors
Muhammad Yaqub Afridi, Christopher B Montgomery, Elliott cooper-Balis, Stephen Semancik, Kenneth Gruber Kreider, Jon C Geist
In this paper we describe a novel microhotplate temperature sensor calibration technique suitable for Built-In Self Test. The technique only requires short-term temperature stability from the four-wire polysilicon heater/temperature sensors that are ...
9. Analytic Representation of the Silicon Absorption Coefficient in the Indirect Transision Region
Jon C Geist, A. Migdall, H. P. Baltes
10. Blocked Impurity Band and Superlattice Detectors: Prospects for Radiometry
Jon C Geist