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You searched on: Author: jon geist

Displaying records 51 to 60 of 88 records.
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51. Microhotplate-Based Sensor Platform for Submicron SoC Designs
Published: 12/9/2005
Authors: Muhammad Yaqub Afridi, Allen R Hefner Jr., Jon C Geist, Colleen E. Hood, Ankush Varma, Bruce Jacob

52. Calibration of a Two-Color Imaging Pyrometer and Its Use for Particle Measurements in Controlled Air Plasma Spray Experiments
Published: 6/1/2002
Authors: Steven P Mates, D Basak, Frank S. Biancaniello, Stephen D Ridder, Jon C Geist
Abstract: Advances in digital imaging technology have enabled the development of sensors that can measure the temperature and velocity of individual spray particles over a large volume of the spray plume simultaneously using imaging pyrometry (IP) and particle ...

53. Abstracts for the MSEL Assessment Panel, March 2001
Published: 1/26/2001
Authors: Leslie E Smith, Alamgir Karim, Leonid A Bendersky, C Lu, J J Scott, Ichiro Takeuchi, Kathleen M. Flynn, Vinod K Tewary, Davor Balzar, G A Alers, Stephen E Russek, Charles C. Dr. Han, Haonan Wang, William E Wallace, Daniel A Fischer, K Efimenko, Wen-Li Wu, Jan Genzer, Joseph C Woicik, Thomas H. Gnaeupel-Herold, Henry Joseph Prask, Charles F Majkrzak, Norman F. Berk, John Barker, Charles J. Glinka, Eric K Lin, Ward L Johnson, Paul R Heyliger, David Thomas Read, R R Keller, J Blendell, Grady S White, Lin-Sien H Lum, Eric J Cockayne, Igor Levin, C E Johnson, Maureen E Williams, Gery R Stafford, William J Boettinger, Kil-Won Moon, Daniel Josell, Daniel Wheeler, Thomas P Moffat, W H Huber, Lee J Richter, Clayton S. Yang, Robert D Shull, R A. Fry, Robert D McMichael, William F. Egelhoff Jr., Ursula R Kattner, James A Warren, Jonathan E Guyer, Steven P Mates, Stephen D Ridder, Frank S. Biancaniello, D Basak, Jon C Geist, Kalman D Migler
Abstract: Abstracts relating to research and development in the NIST Materials Science and Engineering Laboratory (MSEL) are presented for a poster session to be presented to the 2001 MSEL Assessment Panel.

54. In-Flight Measurement of Thermal Spray Particle Temperatures Using Two-Color Optical Pyrometry
Published: 10/11/2000
Authors: Frank S. Biancaniello, Steven P Mates, Stephen D Ridder, D Basak, D W Bonnell, Jon C Geist
Abstract: Thermal spray is a materials processing technique used to deposit coatings to provide improved wear, corrosion, and/or thermal protection for engineering components. Thick (>10 {micro}m) thermal spray coatings are made up of individual solidified spl ...

55. Off-line Handwriting Recognition from Forms
Published: 10/8/1996
Authors: Michael D Garris, J L. Blue, Gerald T. Candela, Darrin L. Dimmick, Jon C Geist, Patrick J Grother, Stanley Janet, Charles L. Wilson

56. Public Domain Optical Character Recognition
Published: 2/8/1995
Authors: Michael D Garris, J L. Blue, Gerald T. Candela, Darrin L. Dimmick, Jon C Geist, Patrick J Grother, Stanley Janet, Charles L. Wilson

57. The Second Census Optical Character Recognition Systems Conference
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5452
Published: 6/6/1994
Authors: Jon C Geist, R. Allen Wilkinson, Stanley Janet, Patrick J Grother, Bob Hammond, Norman W. Larsen, Randy Klear, Mark J Matsko, Christopher J.C. Burges, Robert Creecy, Jonathan J. Hull, Thomas P. Vogl, Charles L. Wilson

58. OCR Error Rate versus Rejection Rate for Isolated Handprint Characters
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 4990
Published: 12/10/1992
Authors: Jon C Geist, R. Allen Wilkinson

59. A Simple, Low-Contrast Thermal Resolution Test Target
Published: 6/1/1992
Authors: Jon C Geist, J. E. Luther, Donald B. Novotny, J. Vahakangas

60. Optical Calibration of a Submicrometer Magnification Standard
Series: Journal of Research (NIST JRES)
Published: 4/30/1992
Authors: Jon C Geist, Barbara J Belzer, M. L. Miller, Peter Roitman

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  • SP 250-XX: Calibration Services
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  • SP 400-XX: Semiconductor Measurement Technology
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