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You searched on: Author: jon geist

Displaying records 31 to 40 of 88 records.
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31. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion
Published: 8/1/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907056

32. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion
Published: 6/8/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905421

33. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion"
Published: 6/7/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907081

34. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion"
Published: 6/6/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907057

35. Polyelectrolyte Multilayer-Treated Electrodes for Real-Time Electronic Sensing Cell Proliferation
Series: Journal of Research (NIST JRES)
Published: 4/1/2010
Authors: Geraldine I. Mijares, Darwin R Reyes-Hernandez, Jon C Geist, Michael Gaitan
Abstract: The feasibility of using and the performance of non-biological polyelectrolyte multilayer (PEM) films to facilitate cell attachment on titanium-tungsten alloy/gold (TiW/Au) electrodes for the detection of cellular responses in cell assays are investi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33183

36. Accurate optical analysis of single molecule entrapment in nanoscale vesicles
Published: 1/1/2010
Authors: Joseph E. Reiner, Andreas Jahn, Samuel M Stavis, Michael J Culbertson, Wyatt N Vreeland, Daniel L Burden, Jon C Geist, Michael Gaitan
Abstract: We present a non-destructive method to characterize low analyte concentrations in nanometer scale lipid vesicle formulations. Our method is based on the application of fluorescence fluctuation analysis (FFA) and multi-angle laser light scattering (M ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902169

37. Temperature-Programmed Gas-Sensing With Microhotplates: An Opportunity to Enhance Microelectronic Gas Sensor Metrology
Published: 10/5/2009
Authors: Jon C Geist, Muhammad Yaqub Afridi
Abstract: It is only recently that the ITRS (International Technical Roadmap for Semiconductors) has identified functional diversification through heterogeneous integration as a key enabler of future industry growth. This paper describes a powerful temperatur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902948

38. Generalized temperature measurement equations for rhodamine B dye solution and its application to microfluidics
Published: 9/2/2009
Authors: Jayna J Shah, Michael Gaitan, Jon C Geist
Abstract: Contact-less mapping of temperature distributions based on ratios of fluorescent signals is a ubiquitous temperature detection technique. However, application of calibration equations that relate fluorescence intensity ratios to temperature pose sev ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902127

39. Analog BIST Functionality for Microhotplate Temperature Sensors
Published: 9/1/2009
Authors: Muhammad Yaqub Afridi, Christopher B Montgomery, Elliott cooper-Balis, Stephen Semancik, Kenneth Gruber Kreider, Jon C Geist
Abstract: In this paper we describe a novel microhotplate temperature sensor calibration technique suitable for Built-In Self Test. The technique only requires short-term temperature stability from the four-wire polysilicon heater/temperature sensors that are ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902033

40. Mapping the Edge-Roughness of Test Structure Features for Nanometer-Level CD Reference-Materials
Published: 4/2/2009
Authors: Michael W. Cresswell, M Davidson, Geraldine I. Mijares, Richard A Allen, Jon C Geist, M R Bishop
Abstract: The near-term objective of the work reported here is developing a protocol for rapidly mapping CD and edge roughness from high-resolution SEM images of reference-material features patterned on SCCDRM chips. The longer term mission is to formulate a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901520



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