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Author: michael gaitan

Displaying records 141 to 150 of 155 records.
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141. Application of CMOS-Compatible Micro-Hotplates for In-Situ Process Monitors
Published: 12/31/1992
Authors: John S Suehle, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14325

142. Design Methodology for Micromechanical Systems at Commercial CMOS Foundries Through MOSIS
Published: 12/31/1992
Authors: Michael Gaitan, A. Parameswaran, Mona Elwakkad Zaghloul, Janet M Cassard, Donald B. Novotny, John S Suehle
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2103

143. High-Level CAD Melds Micromachined Devices with Foundries
Published: 11/1/1992
Authors: Janet M Cassard, M. Parameswaran, Mona Elwakkad Zaghloul, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13719

144. High-Level CAD Melds Micromachined Devices with Foundries
Series: NIST Interagency/Internal Report (NISTIR)
Published: 5/1/1992
Authors: Janet M Cassard, M. Parameswaran, Mona Elwakkad Zaghloul, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=17856

145. Methodology for the Computer-Aided Design of Silicon Micromachined Devices in a Standard CMOS Process
Series: NIST Interagency/Internal Report (NISTIR)
Published: 5/1/1992
Authors: Janet M Cassard, M. Parameswaran, Mona Elwakkad Zaghloul, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16419

146. A Modified Sliding Wire Potentiometer Test Structure for Mapping Nanometer-Level Distances
Published: 12/31/1991
Authors: Michael W Cresswell, Michael Gaitan, Richard A Allen, Loren W. Linholm
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21586

147. Commercial CMOS Fabricated Integrated Dynamic Thermal Scene Simulator
Published: 12/31/1991
Authors: M. Parameswaran, R. Chung, Michael Gaitan, R. B. Johnson, M. Syrzycki
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1549

148. Micromachined Thermal Radiation Emitter from a Commercial CMOS Process
Published: 2/1/1991
Authors: M. Parameswaran, A. M. Robinson, David L. Blackburn, Michael Gaitan, Jon C Geist
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24752

149. Investigation of the Threshold Voltage of MOSFETs with Position- and Potential- Dependent Interface Trap Distributions Using a Fixed-Point Iteration Method
Published: 4/30/1990
Authors: Michael Gaitan, I. D. Mayergoyz, C. E. Korman
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25597

150. A Numerical Analysis for the Small-Signal Response of the MOS Capacitor
Published: 12/31/1989
Authors: Michael Gaitan, I. D. Mayergoyz
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14307



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