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You searched on: Author: joseph fu

Displaying records 71 to 74.
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71. Junction Locations by Scanning Tunneling Microscopy: In-Air-Ambient Investigation of Passivated GaAs pn Junctions
Published: 9/5/1993
Authors: H. W. Tseng, John A Dagata, Richard M Silver, Joseph Fu, J R. Lowney
Abstract: Scanning tunneling microscopy (STM) and atomic force microscopy operating in air have been used to investigate locations of molecular-beam epitaxially grown GaAs multiple pn junctions cleaved and passivated with P(2)S(5). Symmetrically and asymmetric ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820723

72. Transmission and Reflection of Superconducting YBa^d2^Cu^d3^O^d7-x^ Films at 35 GHz
Published: 3/1/1993
Authors: E K Moser, W J Tomasch, Joseph Fu, M. W. Coffey, J R Clem
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30483

73. Surface Metrology of Soft X-ray Optics
Published: 1/1/1993
Authors: Theodore Vincent Vorburger, T. McWade, Joseph Fu, Christopher J. Evans, William Tyler Estler, R Parks
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901970

74. XUV Optics Characterization at the National Institute of Standards and Technology
Published: 1/1/1993
Authors: R N. Watts, Charles S Tarrio, Thomas B Lucatorto, R P. Madden, R Deslattes, Ariel Caticha, William Tyler Estler, Christopher J. Evans, T. McWade, Joseph Fu, Theodore Vincent Vorburger
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901965



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