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Author: joseph fu

Displaying records 61 to 70 of 73 records.
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61. Finish and Figure Metrology for Soft X­ray Optics
Published: 1/1/1997
Authors: Theodore Vincent Vorburger, Christopher J. Evans, V W. Tsai, Joseph Fu, E. C. Williams, Ronald G Dixson, P Sullivan, T. McWaid
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901981

62. Pitch and Step Height Measurements Using NIST
Published: 1/1/1997
Authors: R Koning, Ronald G Dixson, Joseph Fu, V W. Tsai, Theodore Vincent Vorburger, Edwin Ross Williams, X Wang
Abstract: The use of the atomic force microscope (AFM) for step height and pitch measurements in industrial applications is rapidly increasing. To compare the results obtained by different instruments and to achieve high accuracy, the scales of an AFM must be ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820847

63. Calibration of Scanning Electron Microscope Magnification Standards SRM-484
Published: 5/1/1996
Authors: Joseph Fu, Theodore Vincent Vorburger, D Ballard
Abstract: Standard Reference Material (SRM) 484 is an artifact for calibrating the magnification scale of a scanning electron microscope. Since 1977 the National Institute of Standards and Technology (NIST) has produced seven issues of SRM484 amounting to app ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820793

64. In Situ Testing and Calibrating of Z-Piezo of an Atomic Force Microscope
Published: 7/1/1995
Author: Joseph Fu
Abstract: By scanning a slightly tilted, smooth surface with an atomic force microscope (AFM), it is possible to obtain hysteresis loops which contain information on the nonlinearity and hysteresis in the z axis of the AFM''s piezoelectric actuator. A 15% vari ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820740

65. The Measurement and Uncertainty of a Calibration Standard for the SEM
Published: 3/1/1994
Authors: Joseph Fu, M Croarkin, Theodore Vincent Vorburger
Abstract: Standard Reference Material 484 is an artifact for calibration the magnification scale of a Scanning Electron Microscope (SEM) within the range of 1000X to 20000X. Seven issues, SRM-484, and SRM-484a to SRM-484f, have been certified between 1977 and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820682

66. Junction Locations by Scanning Tunneling Microscopy: In-Air-Ambient Investigation of Passivated GaAs pn Junctions
Published: 2/1/1994
Authors: W. F. Tseng, John A. Dagata, Richard M Silver, Joseph Fu, J R. Lowney
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13544

67. Microwave Properties of YBa^d2^Cu^d3^O^d7-x^ Films at 35 GHz from Magnetotransmission and Magnetoreflection Measurements
Published: 2/1/1994
Authors: E K Moser, W J Tomasch, M J McClorey, Joseph Fu, M. W. Coffey, C L Pettiette-Hall, S M Schwarzbek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30473

68. A Study of the Surface Texture of Polycrystalline Phosphor Films Using AFM
Published: 1/1/1994
Authors: Zsolt Revay, J Schneir, D Brower, John S Villarrubia, Joseph Fu, et al
Abstract: Stimulable phosphor thin films are being investigated for use as optical data storage media. We have successfully applied atomic force microscopy (AFM) to the measurement of the surface texture of these films. Determination of the surface texture of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820709

69. Methods Divergence Between Measurements of Micrometer and Sub-Micrometer Surface Features
Published: 1/1/1994
Authors: T Mcwaid, Theodore Vincent Vorburger, Joseph Fu, Jun-Feng Song, Eric Paul Whitenton
Abstract: Measurements of micrometer and sub-micrometer surface features have been made using a stylus profiler, an STM, an AFM, and a phase-measuring interferometric microscope. The differences between measurements of the same surface feature as obtained with ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820696

70. Junction Locations by Scanning Tunneling Microscopy: In-Air-Ambient Investigation of Passivated GaAs pn Junctions
Published: 9/5/1993
Authors: H. W. Tseng, John A. Dagata, Richard M Silver, Joseph Fu, J R. Lowney
Abstract: Scanning tunneling microscopy (STM) and atomic force microscopy operating in air have been used to investigate locations of molecular-beam epitaxially grown GaAs multiple pn junctions cleaved and passivated with P(2)S(5). Symmetrically and asymmetric ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820723



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