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Author: george eppeldauer

Displaying records 111 to 120 of 126 records.
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111. Development of the NIST Detector-based Color Temperature Scale
Published: Date unknown
Authors: George P Eppeldauer, Yoshihiro Ohno
Abstract: Based on the spectral responsivity of the channels of a tristimulus colorimeter, a color temperature scale is being developed at NIST. The low uncertainty of the spectral responsivity measurements can dominate the chromaticity measurement uncertainty ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841031

112. Improved Accuracy Tristimulus Colorimeters Calibrated With Standard
Published: Date unknown
Author: George P Eppeldauer
Abstract: A new method has been developed to calibrate tristimulus colorimeters for high accuracy color measurements. Instead of traditional lamp standards, modern, high accuracy detector standards are suggested for calibration. After high accuracy absolute ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841335

113. Improved Facility for Optical Detector Characterization
Published: Date unknown
Authors: T Flournoy, George P Eppeldauer
Abstract: The detector characterization and calibration facility of the Army Primary Standards Laboratory (APSL) has been extended. In addition to the traditional filter and monochromator based spectral measurements, laser-based sphere sources and high perfor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841706

114. Irradiance Responsibility Scale Realization Between 1 mu and 2.5 mu
Published: Date unknown
Authors: George P Eppeldauer, Joseph Paul Rice
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841829

115. LED-Based Spectrally Tunable Source for Radiometric, Photometric and Colorimetric Applications
Published: Date unknown
Authors: Irena Fryc, Steven W Brown, George P Eppeldauer, Yoshihiro Ohno
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841847

116. New Photometer Standards for Low Uncertainty Illuminance Scale Realization
Published: Date unknown
Authors: George P Eppeldauer, Carl C Miller, Yoshihiro Ohno
Abstract: Improved performance photometers have been developed at the National Institute of Standards and Technology (NIST) to utilize the low spectral responsivity uncertainty of spectral irradiance responsivity measurements performed on the facility of Spect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841066

117. New Working Standards to Disseminate NIST Radiometric and Photometric Scales
Published: Date unknown
Authors: George P Eppeldauer, Richard Austin, Charles Lustenberger
Abstract: A new generation radiometer-photometer system has been developed in a National Institute of Standards and Technology (NIST) and Gamma Scientific (GS) cooperation to satisfy the increased requirements in the dissemination of NIST responsivity scales. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841067

118. Performance Comparisons of InGaAs, Extended InGaAs and Short-Wave HgCdTe Detectors Between 1 [mu]m and 2.5 [mu]m
Published: Date unknown
Authors: Howard W Yoon, Matt Dopkiss, George P Eppeldauer
Abstract: In this study, three different detectors, regular InGaAs, short-wave infrared extended-InGaAs (exInGaAs) with the bandgap wavelength at 2.6 mm and short-wave HgCdTe (swMCT) with the bandgap wavelength at 2.8 mm are studied. The detectors have active ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841047

119. SSE- and Noise-Optimized InGaAs Radiation Thermometer
Published: Date unknown
Authors: Howard W Yoon, Charles E Gibson, V B Khromchenko, George P Eppeldauer
Abstract: For the measurements of radiance temperatures in the range from 150 ?C to 1000 ?C, low uncertainties in the temperature measurements can be achieved by using near-infrared InGaAs radiation thermometers. We describe the design and construction of the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841126

120. Spectral Irradiance Responsivity Measurements Between 1mu m and 5 mu m
Published: Date unknown
Authors: George P Eppeldauer, Joseph Paul Rice, Jun Zhang, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841819



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