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You searched on: Author: robert downing

Displaying records 21 to 30 of 32 records.
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21. Neutron Depth Profiling with the New NIST Cold Neutron Source
Published: 12/1/1997
Authors: George Paul Lamaze, H H Chen-mayer, J K Langland, Robert G Downing
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100515

22. Boron Analysis in Synthetic Diamond Films Using Cold Neutron Depth Profiling
Published: 12/1/1996
Authors: George Paul Lamaze, Robert G Downing
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100513

23. Capillary Neutron Optics for Boron Neutron Capture Therapy
Published: 12/1/1996
Authors: Q F Xiao, V. A. Sharov, D M Gibson, H Chen, D F Mildner, Robert G Downing
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100564

24. Characteristics and Applications of a Polycapillary Neutron Focusing Lens
Published: 12/1/1996
Authors: D F Mildner, H H Chen-mayer, Robert G Downing
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100526

25. Monolithic Polycapillary Neutron Focusing Lenses: Experimental Characterizations
Published: 12/1/1996
Authors: H H Chen-mayer, D F Mildner, V. A. Sharov, J B Ullrich, I Yu Ponomarev, Robert G Downing
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100491

26. Neutron Beam Control Using Polycapillary Optics
Published: 12/1/1996
Authors: Q F Xiao, V. A. Sharov, Robert G Downing, H H Chen-mayer, D F Mildner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100565

27. Modeling Detector Response for Neutron Depth Profiling
Published: 12/1/1995
Authors: K Coakley, Robert G Downing, George Paul Lamaze
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100495

28. Near Surface Profiling of Semiconductor Materials Using Depth Profiling
Published: 12/1/1995
Authors: Robert G Downing, George Paul Lamaze
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100499

29. Nondestructive Characterization of Semiconductor Materials Using Neutron Depth Profiling
Published: 12/1/1995
Authors: Robert G Downing, George Paul Lamaze
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100498

30. The Development of Standard Reference Material 2137 - A Boron Implant in Silicon Standard for Secondary Ion Mass Spectrometry
Published: 12/1/1995
Authors: David S Simons, P Chi, Robert G Downing, George Paul Lamaze
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100550



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