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Author: frank delrio
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1. Effect of Organic SAMs on the Evolution of Strength of Silicon Nanostructures
Published: 6/3/2016
Authors: Scott Grutzik, Brian G Bush, Frank W DelRio, Richard Swift Gates, Melissa Hines, Alan Zehnder
Abstract: The ability to accurately predict the strength of nanoscale, single crystal structures is critical in micro- and nano-electromechanical systems (MEMS and NEMS) design. Because of the small length scales involved failure does not always follow the sam ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913502

2. Stress mapping of micromachined polycrystalline silicon devices via confocal Raman microscopy
Published: 6/15/2014
Authors: Grant A Myers, Siddharth Hazra, Maarten de Boer, Chris A Michaels, Stephan J Stranick, Ryan P. Koseski, Robert Francis Cook, Frank W DelRio
Abstract: Stress mapping of micromachined polycrystalline silicon devices with components in various levels of uniaxial tension was performed. Confocal Raman microscopy was used to form two-dimensional maps of Raman spectral shifts, which exhibited variations ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915909

3. Frictional properties of native and functionalized type I collagen thin films
Published: 10/2/2013
Authors: Koo-hyun Chung, Antony Chen, Christopher Anderton, Kiran Bhadriraju, Anne L Plant, Brian G Bush, Robert Francis Cook, Frank W DelRio
Abstract: Frictional properties of native and fibronectin (FN)-functionalized type I collagen (COL) thin films were studied via atomic force microscopy. The COL lateral contact stiffness was dependent only on the hydration state, indicating that shear deformat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914307

4. Decoupling small-scale roughness and long-range features on deep reactive ion etched silicon surfaces
Published: 9/19/2013
Authors: Frank W DelRio, Lawrence H Friedman, Michael S. Gaither, William A Osborn, Robert Francis Cook
Abstract: Roughness scaling of three different deep reactive ion etched (DRIE) silicon surfaces is investigated using atomic force microscopy. At small distances, height-height correlations H reveal power-law behavior with equal scaling exponents for all surf ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913812

5. Temperature-Programmed Electrospray-Differential Mobility Analysis for Characterization of Ligated Nanoparticles in Complex Media
Published: 8/12/2013
Authors: De-Hao D. Tsai, Frank W DelRio, John M Pettibone, Pin Ann Lin, Jiaojie Tan, Michael Russel Zachariah, Vincent A Hackley
Abstract: In this study, an electrospray-differential mobility analyzer (ES-DMA) was operated with an aerosol flow-mode, temperature-programmed approach to enhance its ability to characterize the particle size distributions (PSDs) of nanoscale particles (NPs) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913860

6. On the bending strength of single-crystal silicon theta-like specimens
Published: 7/10/2013
Authors: Rebecca R. Kirkpatrick, William A Osborn, Michael S. Gaither, Richard Swift Gates, Frank W DelRio, Robert Francis Cook
Abstract: A new theta geometry was developed for micro-scale bending strength measurements. The new ,gapŠ theta specimen was a simple modification of the arch theta specimen that enabled micro-scale tensile testing. The gap theta was demonstrated here on sin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913369

7. Etching process effects on surface structure, fracture strength, and reliability of single-crystal silicon theta-like specimens
Published: 5/30/2013
Authors: Michael S. Gaither, Richard Swift Gates, Rebecca R. Kirkpatrick, Robert Francis Cook, Frank W DelRio
Abstract: The etching processes used to produce microelectromechanical systems (MEMS) leave residual surface features that typically limit device strength and, consequently, device lifetime and reliability. In order to optimize MEMS device reliability, it is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912389

8. Controlled Chemistry for Studying Combined Effects of Extracellular Matrix Proteins
Published: 4/22/2013
Authors: Antony K. Chen, Frank W DelRio, Alexander W Peterson, Koo-Hyun Chung, Kiran Bhadriraju, Anne L Plant
Abstract: The extracellular matrix (ECM) consists of a complex mixture of biochemical and physical stimuli that together regulate cell behavior. Previously we showed that films composed of Type I collagen fibrils induce reproducible and physiologically relevan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910923

9. Interfacial Mechanical Properties of n-Alkylsilane Monolayers on Silicon Substrates
Published: 2/1/2013
Authors: Brian G Bush, Frank W DelRio, Cherno Jaye, Daniel A Fischer, Robert Francis Cook
Abstract: The interfacial properties of n-alkylsilane self-assembled monolayers on silicon were investigated by normal force spectroscopy and lateral force measurements and correlated with molecular structure via near-edge X-ray absorption fine structure (NEXA ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911464

10. ELUCIDATING THE SURFACE COMPOSITION OF MECHANICALLY MODULATED COLLAGEN FIBRIL FILMS WITH TOF-SIMS
Published: 1/17/2013
Authors: Christopher R Anderton, Kiran Bhadriraju, Frank W DelRio, Anne L Plant
Abstract: The extracellular matrix (ECM) environment plays a critical role in organism development and disease. Consequently, developing complementary analytical techniques to study bioactive scaffolds can assist in understanding cell-ECM processes. We have ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910931



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