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You searched on: Author: frank delrio

Displaying records 21 to 30 of 37 records.
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21. Size Measurement of Nanoparticles Using Atomic Force Microscopy, ASTM E2859-11
Report Number: 1200-7
Published: 1/2/2012
Authors: Jaroslaw Grobelny, Frank W DelRio, Pradeep Narayanan Namboodiri, Doo-In Kim, Vincent A Hackley, Robert Francis Cook
Abstract: The purpose of this document is to provide guidance on the quantitative application of atomic force microscopy (AFM) to determine the size of nanoparticles2 deposited in dry form on flat substrates using height (z-displacement) measurement. Unlike el ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910685

22. Deformation and fracture of single-crystal silicon theta-like specimens
Published: 10/28/2011
Authors: Michael S. Gaither, Frank W DelRio, Richard Swift Gates, Robert Francis Cook
Abstract: Miniaturized test specimens of single-crystal silicon, fabricated by lithography and deep reactive ion etching (DRIE), were used to measure deformation and fracture properties at the micro scale. Two specimen geometries, both in the form of a Greek l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908887

23. Micro-scale measurement and modeling of stress in silicon surrounding a tungsten-filled through-silicon via
Published: 10/11/2011
Authors: Ryan P. Koseski, William A Osborn, Stephan J Stranick, Frank W DelRio, Mark D Vaudin, Thuy Dao, Vance H. Adams, Robert Francis Cook
Abstract: The stress in silicon surrounding a tungsten-filled through-silicon via (TSV) is measured using confocal Raman microscopy line scans across the TSV both before and after etch removal of an oxide stack used as a mask to define the TSV during fabricati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908908

24. Structure-property relationships for methyl-terminated alkyl self-assembled monolayers
Published: 7/20/2011
Authors: Frank W DelRio, Dave Rampulla, Cherno Jaye, Gheorghe Stan, Richard Swift Gates, Daniel A Fischer, Robert Francis Cook
Abstract: Structure-property relationships for methyl-terminated alkyl self-assembled monolayers (SAMs) are developed using near-edge X-ray absorption fine structure spectroscopy (NEXAFS) and atomic force microscopy (AFM). NEXAFS C K-edge spectra are used to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908238

25. Quantitative Determination of Competitive Molecular Adsorption on Gold Nanoparticles Using Attenuated Total Reflectance-Fourier Transform Infrared Spectroscopy
Published: 6/28/2011
Authors: De-Hao D. Tsai, Melissa Davila-Morris, Frank W DelRio, Suvajyoti S. Guha, Vincent A Hackley, Michael R Zachariah
Abstract: Surface-sensitive quantitative studies of competitive molecular adsorption on nanoparticles were conducted using a modified Attenuated attenuated Total total Reflectionreflectance-Fourier Transform transform Infrared infrared (ATR-FTIR) spectroscopy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907586

26. Hydrodynamic Fractionation of Finite Size Nano Gold Clusters
Published: 6/15/2011
Authors: De-Hao D. Tsai, Tae Joon Cho, Frank W DelRio, Julian S. Taurozzi, Michael Russel Zachariah, Vincent A Hackley
Abstract: We demonstrate a high resolution in situ experimental method for performing simultaneous size-classification and characterization of functional nanoscale gold clusters (NGCs) based on asymmetric-flow field flow fractionation (AFFF). Field emission sc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908232

27. Adsorption and Conformation of Serum Albumin Protein on Gold Nanoparticles
Published: 2/22/2011
Authors: De-Hao D. Tsai, Frank W DelRio, Athena M Keene, Katherine M Tyner, Robert I. MacCuspie, Tae Joon Cho, Michael Russel Zachariah, Vincent A Hackley
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906801

28. Size Measurement of Nanoparticles using Atomic Force Microscopy
Published: 1/1/2011
Authors: Jaroslaw Grobelny, Frank W DelRio, Pradeep Narayanan Namboodiri, Doo-In Kim, Vincent A Hackley, Robert Francis Cook
Abstract: This chapter outlines procedures for sample preparation and the determination of nanoparticle size using atomic force microscopy (AFM). To start, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imagin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854151

29. Elastic, adhesive, and charge transport properties of a metal-molecule-metal junction: the role of molecular orientation, order, and coverage
Published: 5/20/2010
Authors: Frank W DelRio, Kristen L. Steffens, Cherno Jaye, Daniel A Fischer, Robert Francis Cook
Abstract: The elastic, adhesive, and charge transport properties of a metal-molecule-metal junction are studied via conducting-probe atomic force microscopy (AFM) and correlated with molecular structure by near edge x-ray absorption fine structure (NEXAFS) spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903177

30. Strength distribution of single-crystal silicon theta-like specimens
Published: 5/18/2010
Authors: Michael S. Gaither, Frank W DelRio, Richard Swift Gates, Edwin R. Fuller, Robert Francis Cook
Abstract: A new test specimen has been developed for micro-scale tensile strength measurements, allowing direct assessment of surface effects on strength. Specimens were formed by deep reactive ion etching, tested with instrumented indentation, and test resul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904988



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