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You searched on: Author: frank delrio

Displaying records 21 to 30 of 33 records.
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21. Quantitative Determination of Competitive Molecular Adsorption on Gold Nanoparticles Using Attenuated Total Reflectance-Fourier Transform Infrared Spectroscopy
Published: 6/28/2011
Authors: De-Hao D. Tsai, Melissa Davila-Morris, Frank W DelRio, Suvajyoti S. Guha, Vincent A Hackley, Michael R Zachariah
Abstract: Surface-sensitive quantitative studies of competitive molecular adsorption on nanoparticles were conducted using a modified Attenuated attenuated Total total Reflectionreflectance-Fourier Transform transform Infrared infrared (ATR-FTIR) spectroscopy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907586

22. Hydrodynamic Fractionation of Finite Size Nano Gold Clusters
Published: 6/15/2011
Authors: De-Hao D. Tsai, Tae Joon Cho, Frank W DelRio, Julian S. Taurozzi, Michael Russel Zachariah, Vincent A Hackley
Abstract: We demonstrate a high resolution in situ experimental method for performing simultaneous size-classification and characterization of functional nanoscale gold clusters (NGCs) based on asymmetric-flow field flow fractionation (AFFF). Field emission sc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908232

23. Adsorption and Conformation of Serum Albumin Protein on Gold Nanoparticles
Published: 2/22/2011
Authors: De-Hao D. Tsai, Frank W DelRio, Athena M Keene, Katherine M Tyner, Robert I. MacCuspie, Tae Joon Cho, Michael Russel Zachariah, Vincent A Hackley
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906801

24. Size Measurement of Nanoparticles using Atomic Force Microscopy
Published: 1/1/2011
Authors: Jaroslaw Grobelny, Frank W DelRio, Pradeep Narayanan Namboodiri, Doo-In Kim, Vincent A Hackley, Robert Francis Cook
Abstract: This chapter outlines procedures for sample preparation and the determination of nanoparticle size using atomic force microscopy (AFM). To start, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imagin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854151

25. Elastic, adhesive, and charge transport properties of a metal-molecule-metal junction: the role of molecular orientation, order, and coverage
Published: 5/20/2010
Authors: Frank W DelRio, Kristen L. Steffens, Cherno Jaye, Daniel A Fischer, Robert Francis Cook
Abstract: The elastic, adhesive, and charge transport properties of a metal-molecule-metal junction are studied via conducting-probe atomic force microscopy (AFM) and correlated with molecular structure by near edge x-ray absorption fine structure (NEXAFS) spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903177

26. Strength distribution of single-crystal silicon theta-like specimens
Published: 5/18/2010
Authors: Michael S. Gaither, Frank W DelRio, Richard Swift Gates, Edwin R. Fuller, Robert Francis Cook
Abstract: A new test specimen has been developed for micro-scale tensile strength measurements, allowing direct assessment of surface effects on strength. Specimens were formed by deep reactive ion etching, tested with instrumented indentation, and test resul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904988

27. Theta-like specimen to determine tensile strength at the micro-scale
Published: 3/10/2010
Authors: Michael S. Gaither, Frank W DelRio, Richard Swift Gates, Edwin R. Fuller, Robert Francis Cook
Abstract: Micro- and nano-electromechanical systems are typically formed via lithographic and etching processes that leave residual surface features, stresses, and chemistry that ultimately control component strength and device reliability. Here, we describe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904555

28. A ROUND ROBIN EXPERIMENT TO PROVIDE PRECISION AND BIAS FOR SEMI MS5: TEST METHOD FOR WAFER BOND STRENGTH MEASUREMENTS USING MICRO-CHEVRON TEST STRUCTURES
Published: 12/7/2009
Authors: Richard A Allen, Winthrop A. Baylies, Paul Langer, Ralph Danzl, Frank W DelRio, Gavin Horn, Roy Knechtel, Michael Mattes, David Thomas Read, Sumant Sood, Kevin T. Turner
Abstract: An international round robin was organized to update SEMI Standard MS5: Test Method for Wafer Bond Strength Measurements using Micro-Chevron Test Structures. Results from the round robin allowed for inclusion of a Precision and Bias statement. The ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904232

29. Size Measurement of Nanoparticles using Atomic Force Microscopy
Published: 10/1/2009
Authors: Jaroslaw Grobelny, Frank W DelRio, Pradeep Narayanan Namboodiri, Doo-In Kim, Vincent A Hackley, Robert Francis Cook
Abstract: In this assay protocol, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via intermittent contact mode AFM are first described. The procedures for AFM calibration and ope ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854085

30. Elastic and adhesive properties of alkanethiol self-assembled monolayers on gold
Published: 3/30/2009
Authors: Frank W DelRio, Cherno Jaye, Daniel A Fischer, Robert Francis Cook
Abstract: Elastic and adhesive properties of alkanethiol (CH3(CH2)n 1SH) self-assembled monolayers on gold are investigated by atomic force microscopy and correlated with surface structure via near edge x-ray absorption fine structure spectroscopy. As the cha ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901545



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