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You searched on: Author: frank delrio

Displaying records 11 to 20 of 38 records.
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11. Temperature-Programmed Electrospray-Differential Mobility Analysis for Characterization of Ligated Nanoparticles in Complex Media
Published: 8/12/2013
Authors: De-Hao D. Tsai, Frank W DelRio, John M Pettibone, Pin Ann Lin, Jiaojie Tan, Michael Russel Zachariah, Vincent A Hackley
Abstract: In this study, an electrospray-differential mobility analyzer (ES-DMA) was operated with an aerosol flow-mode, temperature-programmed approach to enhance its ability to characterize the particle size distributions (PSDs) of nanoscale particles (NPs) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913860

12. On the bending strength of single-crystal silicon theta-like specimens
Published: 7/10/2013
Authors: Rebecca R. Kirkpatrick, William A Osborn, Michael S. Gaither, Richard Swift Gates, Frank W DelRio, Robert Francis Cook
Abstract: A new theta geometry was developed for micro-scale bending strength measurements. The new ,gapŠ theta specimen was a simple modification of the arch theta specimen that enabled micro-scale tensile testing. The gap theta was demonstrated here on sin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913369

13. Effect of Organic SAMs on the Evolution of Strength of Silicon Nanostructures
Published: 6/3/2013
Authors: Scott Grutzik, Brian G Bush, Frank W DelRio, Richard Swift Gates, Melissa Hines, Alan Zehnder
Abstract: The ability to accurately predict the strength of nanoscale, single crystal structures is critical in micro- and nano-electromechanical systems (MEMS and NEMS) design. Because of the small length scales involved failure does not always follow the sam ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913502

14. Etching process effects on surface structure, fracture strength, and reliability of single-crystal silicon theta-like specimens
Published: 5/30/2013
Authors: Michael S. Gaither, Richard Swift Gates, Rebecca R. Kirkpatrick, Robert Francis Cook, Frank W DelRio
Abstract: The etching processes used to produce microelectromechanical systems (MEMS) leave residual surface features that typically limit device strength and, consequently, device lifetime and reliability. In order to optimize MEMS device reliability, it is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912389

15. Controlled Chemistry for Studying Combined Effects of Extracellular Matrix Proteins
Published: 4/22/2013
Authors: Antony K. Chen, Frank W DelRio, Alexander W Peterson, Koo-Hyun Chung, Kiran Bhadriraju, Anne L Plant
Abstract: The extracellular matrix (ECM) consists of a complex mixture of biochemical and physical stimuli that together regulate cell behavior. Previously we showed that films composed of Type I collagen fibrils induce reproducible and physiologically relevan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910923

16. Interfacial Mechanical Properties of n-Alkylsilane Monolayers on Silicon Substrates
Published: 2/1/2013
Authors: Brian G Bush, Frank W DelRio, Cherno Jaye, Daniel A Fischer, Robert Francis Cook
Abstract: The interfacial properties of n-alkylsilane self-assembled monolayers on silicon were investigated by normal force spectroscopy and lateral force measurements and correlated with molecular structure via near-edge X-ray absorption fine structure (NEXA ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911464

17. ELUCIDATING THE SURFACE COMPOSITION OF MECHANICALLY MODULATED COLLAGEN FIBRIL FILMS WITH TOF-SIMS
Published: 1/17/2013
Authors: Christopher R Anderton, Kiran Bhadriraju, Frank W DelRio, Anne L Plant
Abstract: The extracellular matrix (ECM) environment plays a critical role in organism development and disease. Consequently, developing complementary analytical techniques to study bioactive scaffolds can assist in understanding cell-ECM processes. We have ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910931

18. Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
Published: 1/1/2013
Authors: Vincent A Hackley, Frank W DelRio
Abstract: The purpose of this document is to provide guidance on the quantitative application of atomic force microscopy (AFM)to determine the size of nanoparticles2 deposited in dry form on flat substrates using height (z-displacement) measurement. Unlike ele ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912221

19. Quantifying Dithiothreitol Displacement of Functional Ligands from Gold Nanoparticles
Published: 10/27/2012
Authors: De-Hao D. Tsai, Frank W DelRio, Sherrie R. Elzey, Suvajyoti S. Guha, Michael Russel Zachariah, Vincent A Hackley, Melanie P Shelton
Abstract: Dithiothreitol (DTT)-based displacement is widely utilized for separating ligands from their gold nanoparticle (AuNP) conjugates, a critical step for differentiating and quantifying surface-bound functional ligands and therefore the effective surface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911354

20. Tumor Necrosis Factor Interaction with Gold Nanoparticles
Published: 3/14/2012
Authors: De-Hao D. Tsai, Sherrie R. Elzey, Frank W DelRio, Robert I. MacCuspie, Suvajyoti S. Guha, Michael Russel Zachariah, Athena M Keene, Jeffrey D Clogston, Vincent A Hackley
Abstract: We report on a systematic investigation of molecular conjugation of tumor necrosis factor protein-α (TNF) onto gold nanoparticles (AuNPs) and the subsequent binding behavior to its antibody (anti-TNF). We employ a combination of physical and spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909899



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