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Author: frank delrio

Displaying records 11 to 20 of 21 records.
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11. Adsorption and Conformation of Serum Albumin Protein on Gold Nanoparticles
Published: 2/22/2011
Authors: De-Hao Tsai, Frank W DelRio, Athena M Keene, Katherine M Tyner, Robert I MacCuspie, Tae Joon Cho, Michael Russel Zachariah, Vincent A Hackley
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906801

12. Size Measurement of Nanoparticles using Atomic Force Microscopy
Published: 1/1/2011
Authors: Jaroslaw Grobelny, Frank W DelRio, Pradeep Narayanan Namboodiri, Doo-In Kim, Vincent A Hackley, Robert Francis Cook
Abstract: This chapter outlines procedures for sample preparation and the determination of nanoparticle size using atomic force microscopy (AFM). To start, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imagin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854151

13. Elastic, adhesive, and charge transport properties of a metal-molecule-metal junction: the role of molecular orientation, order, and coverage
Published: 5/20/2010
Authors: Frank W DelRio, Kristen L Steffens, Cherno Jaye, Daniel A Fischer, Robert Francis Cook
Abstract: The elastic, adhesive, and charge transport properties of a metal-molecule-metal junction are studied via conducting-probe atomic force microscopy (AFM) and correlated with molecular structure by near edge x-ray absorption fine structure (NEXAFS) spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903177

14. Strength distribution of single-crystal silicon theta-like specimens
Published: 5/18/2010
Authors: Michael S. Gaither, Frank W DelRio, Richard Swift Gates, Edwin R. Fuller, Robert Francis Cook
Abstract: A new test specimen has been developed for micro-scale tensile strength measurements, allowing direct assessment of surface effects on strength. Specimens were formed by deep reactive ion etching, tested with instrumented indentation, and test resul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904988

15. Theta-like specimen to determine tensile strength at the micro-scale
Published: 3/10/2010
Authors: Michael S. Gaither, Frank W DelRio, Richard Swift Gates, Edwin R. Fuller, Robert Francis Cook
Abstract: Micro- and nano-electromechanical systems are typically formed via lithographic and etching processes that leave residual surface features, stresses, and chemistry that ultimately control component strength and device reliability. Here, we describe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904555

16. A ROUND ROBIN EXPERIMENT TO PROVIDE PRECISION AND BIAS FOR SEMI MS5: TEST METHOD FOR WAFER BOND STRENGTH MEASUREMENTS USING MICRO-CHEVRON TEST STRUCTURES
Published: 12/7/2009
Authors: Richard A Allen, Winthrop A. Baylies, Paul Langer, Ralph Danzl, Frank W DelRio, Gavin Horn, Roy Knechtel, Michael Mattes, David Thomas Read, Sumant Sood, Kevin T. Turner
Abstract: An international round robin was organized to update SEMI Standard MS5: Test Method for Wafer Bond Strength Measurements using Micro-Chevron Test Structures. Results from the round robin allowed for inclusion of a Precision and Bias statement. The ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904232

17. Size Measurement of Nanoparticles using Atomic Force Microscopy
Published: 10/1/2009
Authors: Jaroslaw Grobelny, Frank W DelRio, Pradeep Narayanan Namboodiri, Doo-In Kim, Vincent A Hackley, Robert Francis Cook
Abstract: In this assay protocol, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via intermittent contact mode AFM are first described. The procedures for AFM calibration and ope ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854085

18. Elastic and adhesive properties of alkanethiol self-assembled monolayers on gold
Published: 3/30/2009
Authors: Frank W DelRio, Cherno Jaye, Daniel A Fischer, Robert Francis Cook
Abstract: Elastic and adhesive properties of alkanethiol (CH3(CH2)n 1SH) self-assembled monolayers on gold are investigated by atomic force microscopy and correlated with surface structure via near edge x-ray absorption fine structure spectroscopy. As the cha ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901545

19. A Standard Method for Measuring Wafer Bond Strength for MEMS Applications
Published: 12/23/2008
Authors: Richard A Allen, Janet M Cassard, Winthrop A. Baylies, David Thomas Read, George David Quinn, Frank W DelRio, Kevin T. Turner, Michael Bernasch, Joerg Bagdahn
Abstract: A round robin, to provide precision and bias data for SEMI standard MS5-1107, Test Method for Wafer Bond Strength Measurements Using Micro-Chevron Test Structures, in underway. The precision and bias data, combined with experience in applying the tes ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33132

20. Mechanical and electrical coupling at metal-insulator-metal nano-scale contacts
Published: 5/22/2008
Authors: Doo-In Kim, Pradeep Narayanan Namboodiri, Frank W DelRio, Robert Francis Cook
Abstract: Mechanical and electrical coupling at nano-scale metallic contacts was investigated using a conducting-probe atomic force microscope (AFM). The current-voltage responses were non-Ohmic, symmetric about zero bias, with conductance values smaller than ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854471