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You searched on: Author: frank delrio

Displaying records 11 to 20 of 33 records.
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11. Controlled Chemistry for Studying Combined Effects of Extracellular Matrix Proteins
Published: 4/22/2013
Authors: Antony K. Chen, Frank W DelRio, Alexander W Peterson, Koo-Hyun Chung, Kiran Bhadriraju, Anne L Plant
Abstract: The extracellular matrix (ECM) consists of a complex mixture of biochemical and physical stimuli that together regulate cell behavior. Previously we showed that films composed of Type I collagen fibrils induce reproducible and physiologically relevan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910923

12. Interfacial Mechanical Properties of n-Alkylsilane Monolayers on Silicon Substrates
Published: 2/1/2013
Authors: Brian G Bush, Frank W DelRio, Cherno Jaye, Daniel A Fischer, Robert Francis Cook
Abstract: The interfacial properties of n-alkylsilane self-assembled monolayers on silicon were investigated by normal force spectroscopy and lateral force measurements and correlated with molecular structure via near-edge X-ray absorption fine structure (NEXA ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911464

13. ELUCIDATING THE SURFACE COMPOSITION OF MECHANICALLY MODULATED COLLAGEN FIBRIL FILMS WITH TOF-SIMS
Published: 1/17/2013
Authors: Christopher R Anderton, Kiran Bhadriraju, Frank W DelRio, Anne L Plant
Abstract: The extracellular matrix (ECM) environment plays a critical role in organism development and disease. Consequently, developing complementary analytical techniques to study bioactive scaffolds can assist in understanding cell-ECM processes. We have ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910931

14. Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
Published: 1/1/2013
Authors: Vincent A Hackley, Frank W DelRio
Abstract: The purpose of this document is to provide guidance on the quantitative application of atomic force microscopy (AFM)to determine the size of nanoparticles2 deposited in dry form on flat substrates using height (z-displacement) measurement. Unlike ele ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912221

15. Quantifying Dithiothreitol Displacement of Functional Ligands from Gold Nanoparticles
Published: 10/27/2012
Authors: De-Hao D. Tsai, Frank W DelRio, Sherrie R. Elzey, Suvajyoti S. Guha, Michael Russel Zachariah, Vincent A Hackley, Melanie P Shelton
Abstract: Dithiothreitol (DTT)-based displacement is widely utilized for separating ligands from their gold nanoparticle (AuNP) conjugates, a critical step for differentiating and quantifying surface-bound functional ligands and therefore the effective surface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911354

16. Tumor Necrosis Factor Interaction with Gold Nanoparticles
Published: 3/14/2012
Authors: De-Hao D. Tsai, Sherrie R. Elzey, Frank W DelRio, Robert I. MacCuspie, Suvajyoti S. Guha, Michael Russel Zachariah, Athena M Keene, Jeffrey D Clogston, Vincent A Hackley
Abstract: We report on a systematic investigation of molecular conjugation of tumor necrosis factor protein-α (TNF) onto gold nanoparticles (AuNPs) and the subsequent binding behavior to its antibody (anti-TNF). We employ a combination of physical and spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909899

17. Nanomechanical properties of polyethylene glycol brushes on gold substrates
Published: 2/15/2012
Authors: Gheorghe Stan, Frank W DelRio, Robert I. MacCuspie, Robert Francis Cook
Abstract: Brushes of polyethylene glycol (PEG) were directly anchored onto bare gold substrates in solution. The nucleation kinetics of PEG binding were investigated successively in solution and dry air using atomic force microscopy (AFM) imaging. In additio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906238

18. Deformation and fracture of single-crystal silicon theta-like specimens
Published: 10/28/2011
Authors: Michael S. Gaither, Frank W DelRio, Richard Swift Gates, Robert Francis Cook
Abstract: Miniaturized test specimens of single-crystal silicon, fabricated by lithography and deep reactive ion etching (DRIE), were used to measure deformation and fracture properties at the micro scale. Two specimen geometries, both in the form of a Greek l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908887

19. Micro-scale measurement and modeling of stress in silicon surrounding a tungsten-filled through-silicon via
Published: 10/11/2011
Authors: Ryan P. Koseski, William A Osborn, Stephan J Stranick, Frank W DelRio, Mark D Vaudin, Thuy Dao, Vance H. Adams, Robert Francis Cook
Abstract: The stress in silicon surrounding a tungsten-filled through-silicon via (TSV) is measured using confocal Raman microscopy line scans across the TSV both before and after etch removal of an oxide stack used as a mask to define the TSV during fabricati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908908

20. Structure-property relationships for methyl-terminated alkyl self-assembled monolayers
Published: 7/20/2011
Authors: Frank W DelRio, Dave Rampulla, Cherno Jaye, Gheorghe Stan, Richard Swift Gates, Daniel A Fischer, Robert Francis Cook
Abstract: Structure-property relationships for methyl-terminated alkyl self-assembled monolayers (SAMs) are developed using near-edge X-ray absorption fine structure spectroscopy (NEXAFS) and atomic force microscopy (AFM). NEXAFS C K-edge spectra are used to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908238



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