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Author: raju datla

Displaying records 71 to 80 of 101 records.
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71. An Apparatus for Transmittance and Reflectance Measurements at Cryogenic Temperatures
Published: 1/1/1996
Authors: Z M Zhang, Leonard M Hanssen, Raju Vsnu Datla, H D Drew
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104287

72. Conference Report - Metrology Issues In Terahertz Physics and Technology
Published: 1/1/1996
Authors: Raju Vsnu Datla, E Grossman, M K Hobish
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103711

73. NIST Low Background Infrared Spectral Calibration Facility
Published: 1/1/1996
Authors: Steven Ray Lorentz, S C Ebner, J H Walker, Raju Vsnu Datla
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103977

74. Optimally Toothed Apertures for Reduced Diffraction
Published: 1/1/1996
Authors: Eric L Shirley, Raju Vsnu Datla
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104755

75. Polarization-Dependent Angular Reflectance of Silicon and Germanium in the Infrared
Published: 1/1/1996
Authors: Z M Zhang, Leonard M Hanssen, Raju Vsnu Datla
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104286

76. Absolute Radiometry Using Correlated Photons, ed. by G.A. Lampropoulos
Published: 1/1/1995
Authors: Alan L Migdall, Raju Vsnu Datla, A V Sergienko, Y H Shih
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104632

77. Development of Neutral-Density Infrared Filters Using Metallic Thin Films
Published: 1/1/1995
Authors: Z M Zhang, Raju Vsnu Datla, Leonard M Hanssen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104288

78. High-optical-density Out-of-band Spectral Transmittance Measurements of Bandpass Filters
Published: 1/1/1995
Authors: Z M Zhang, Leonard M Hanssen, Raju Vsnu Datla
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104815

79. Proc. - Metrology Issues In Terahertz Physics and Technology
Published: 1/1/1995
Authors: Raju Vsnu Datla, E Grossman, M K Hobish
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104382

80. Proc. - Metrology Issues In Terahertz Physics and Technology,
Series: NIST Interagency/Internal Report (NISTIR)
Published: 1/1/1995
Authors: Raju Vsnu Datla, E Grossman, M K And hobish
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104829



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