Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Author: john curry Sorted by: title

Displaying records 1 to 10 of 38 records.
Resort by: Date / Title

1. A Compilation of Wavelengths, Energy Levels, and Transition Probabilities for Ba I and Ba II
Published: 8/13/2004
Author: John J Curry
Abstract: Energy levels, wavelengths, and transition probabilities for Ba I and Ba II have been compiled. The data are obtained from a critical evaluation of experimental measurements, and some transition probability calculations, described in the literature.

2. Absolute transition probabilities for 559 strong lines of neutral cerium
Published: 6/17/2009
Author: John J Curry
Abstract: Absolute radiative transition probabilities are reported for 559 strong lines of neutral cerium covering the wavelength range 340 nm to 880 nm. These transition probabilities are obtained by scaling published relative line intensities\cite{MCS75} w ...

3. Asymmetrically cut crystal pair as x-ray magnifier for imaging at high intensity laser facilities.
Published: 10/20/2010
Authors: Lawrence T Hudson, Albert Henins, C.I Szabo, Uri Feldman, John F Seely, John J Curry
Abstract: The potential of an x-ray magnifier prepared from a pair of asymmetrically cut crystals is studied to explore high energy x-ray imaging capabilities at high intensity laser facilities. OMEGA-EP and NIF when irradiating mid and high Z targets can be ...

4. Bench-Top X-Ray Absorption Imaging of Hg in Ceramic Metal-Halide Lamps
Published: Date unknown
Authors: B Lafitte, John J Curry
Abstract: This publication is an extended abstract.

5. Cold light from hot atoms
Published: 1/1/2011
Authors: John J Curry, G G Lister
Abstract: The introduction of rare earth atoms and molecules into lighting discharges led to great advances in efficacy of these lamps. Atoms such as Dy, Ho and Ce provide excellent radiation sources for lighting applications1, with strong radiation bands in ...

6. Compilation of Wavelengths, Energy Levels, and Transition Probabilities for Ba I and Ba II
Published: 1/1/2004
Author: John J Curry

7. Continuous-feed optical sorting of aerosol particles
Published: 6/15/2016
Authors: John J Curry, Zachary H Levine
Abstract: We consider the problem of sorting, by size, spherical particles of order 100 nm radius. The scheme we analyze consists of a heterogeneous stream of spherical particles flowing at an oblique angle across a Gaussian mode optical standing wave. Sorti ...

8. Development and evaluation of interface-stabilized and reactive-sputtered oxide-capped multilayers for EUV lithography
Published: 3/16/2015
Authors: Michael Kriese, Jim Rodriguez, Gary Fournier, Steven E Grantham, Shannon Bradley Hill, John J Curry, Charles S Tarrio, Yuriy Platonov
Abstract: A critical component of high-performance EUV lithography source optics is the reflecting multilayer coating. The ideal multilayer will have both high reflectance and high stability to thermal load. Additionally the capping layers must provide resis ...

9. Deviations From Equilibrium of Thallium Level Populations in a Metal Halide Arc Lamp
Published: 7/1/2004
Authors: D Karahourniotis, John J Curry, E Drakakis, Eric C Benck
Abstract: The excitation equilibrium in a metal halide lamp was studied using a method based on optically thick lines without the assumption of local thermodynamic equilibrium (LTE). The lamp has a diameter of 15.4 mm, an electrode gap of 28 mm, and was operat ...

10. Deviations from equilibrium of thallium level populations in a metal halide arc lamp, ed. by G. Zissis
Published: 1/1/2004
Authors: D Karaborniotis, John J Curry, E Drakakis, Eric C Benck

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series