NIST logo

Publications Portal

You searched on: Author: robert cook

Displaying records 31 to 40 of 65 records.
Resort by: Date / Title

31. Direct observation of phase transformation anisotropy in indented silicon using confocal Raman microscopy
Published: 5/31/2011
Authors: Yvonne Beatrice Gerbig, Stephan J Stranick, Robert Francis Cook
Abstract: The theoretically-predicted anisotropic nature of the indentation phase transformation in silicon (Si) is observed directly in experiments using hyperspectral, confocal Raman microscopy. The anisotropy is reflected in the two-dimensional distribution ...

32. Size Measurement of Nanoparticles using Atomic Force Microscopy
Published: 1/1/2011
Authors: Jaroslaw Grobelny, Frank W DelRio, Pradeep Narayanan Namboodiri, Doo-In Kim, Vincent A Hackley, Robert Francis Cook
Abstract: This chapter outlines procedures for sample preparation and the determination of nanoparticle size using atomic force microscopy (AFM). To start, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imagin ...

33. Advanced Nanoscale Elastic Property Measurement by Contact-Resonance Atomic Force Microscopy
Published: 6/23/2010
Authors: Gheorghe Stan, Robert Francis Cook
Abstract: In atomic force microscopy (AFM)-based techniques, material information (topography, mechanical, electrical, magnetic, etc.) is retrieved from the nanoscale interaction between the AFM tip and the material probed. As the size of the apex of the AFM ...

34. Measurement of residual stress field anisotropy at indentations in silicon
Published: 6/23/2010
Authors: Yvonne Beatrice Gerbig, Stephan J Stranick, Robert Francis Cook
Abstract: The residual stress field around spherical indentations on single crystal silicon (Si) of different crystallographic orientation is mapped by confocal Raman microscopy. All orientations exhibit an anisotropic stress pattern with an orientation spec ...

35. Mechanical properties of one-dimensional nanostructures
Published: 5/23/2010
Authors: Gheorghe Stan, Robert Francis Cook
Abstract: The elastic mechanical properties of one-dimensional nanostructures are considered, with an emphasis on the use of contact-resonance atomic force microscopy methods to determine elastic moduli. Various methods used to determine elastic moduli of one- ...

36. Elastic, adhesive, and charge transport properties of a metal-molecule-metal junction: the role of molecular orientation, order, and coverage
Published: 5/20/2010
Authors: Frank W DelRio, Kristen L. Steffens, Cherno Jaye, Daniel A Fischer, Robert Francis Cook
Abstract: The elastic, adhesive, and charge transport properties of a metal-molecule-metal junction are studied via conducting-probe atomic force microscopy (AFM) and correlated with molecular structure by near edge x-ray absorption fine structure (NEXAFS) spe ...

37. Strength distribution of single-crystal silicon theta-like specimens
Published: 5/18/2010
Authors: Michael S. Gaither, Frank W DelRio, Richard Swift Gates, Edwin R. Fuller, Robert Francis Cook
Abstract: A new test specimen has been developed for micro-scale tensile strength measurements, allowing direct assessment of surface effects on strength. Specimens were formed by deep reactive ion etching, tested with instrumented indentation, and test resul ...

38. Probing the Nanoscale
Published: 4/23/2010
Author: Robert Francis Cook
Abstract: Nanoscale probes can now measure all manner of nanomechanical properties, opening up opportunities for new science and new devices.

39. Compressive stress effect on the radial elastic modulus of oxidized Si nanowires
Published: 3/23/2010
Authors: Gheorghe Stan, Sergiy Krylyuk, Albert Davydov, Robert Francis Cook
Abstract: Detailed understanding and optimal control of the properties of Si nanowires are essential steps in developing Si nanoscale circuitry. In this work, we have investigated mechanical properties of as-grown and oxidized Si nanowires as a function of the ...

40. Theta-like specimen to determine tensile strength at the micro-scale
Published: 3/10/2010
Authors: Michael S. Gaither, Frank W DelRio, Richard Swift Gates, Edwin R. Fuller, Robert Francis Cook
Abstract: Micro- and nano-electromechanical systems are typically formed via lithographic and etching processes that leave residual surface features, stresses, and chemistry that ultimately control component strength and device reliability. Here, we describe ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series