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You searched on: Author: robert cook

Displaying records 31 to 40 of 78 records.
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31. Ultimate bending strength of Si nanowires
Published: 4/11/2012
Authors: Gheorghe Stan, Sergiy Krylyuk, Albert Davydov, Igor Levin, Robert Francis Cook
Abstract: Test platforms for the ideal strength of materials are provided by almost defect-free nanostructures (nanowires, nanotubes, nanoparticles, for example). In this work, the ultimate bending strengths of Si nanowires with radii in the 20 nm to 60 nm r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910821

32. In situ observation of the indentation-induced phase transformation of silicon thin films
Published: 3/5/2012
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Aaron M Forster, Robert Francis Cook
Abstract: Indentation-induced phase transformation processes were studied by in situ Raman microspectroscopy of the deformed contact region of silicon on sapphire samples during contact loading and unloading. During loading, the formation of Si-II and another ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910047

33. Nanomechanical properties of polyethylene glycol brushes on gold substrates
Published: 2/15/2012
Authors: Gheorghe Stan, Frank W DelRio, Robert I. MacCuspie, Robert Francis Cook
Abstract: Brushes of polyethylene glycol (PEG) were directly anchored onto bare gold substrates in solution. The nucleation kinetics of PEG binding were investigated successively in solution and dry air using atomic force microscopy (AFM) imaging. In additio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906238

34. Bending manipulation and measurements of fracture strength of silicon and oxidized silicon nanowires by atomic force microscopy
Published: 2/2/2012
Authors: Gheorghe Stan, Sergiy Krylyuk, Albert Davydov, Robert Francis Cook
Abstract: In this work, the ultimate bending strengths of as-grown Si and fully oxidized Si nanowires were investigated by using a new atomic force microscopy (AFM) bending method. Nanowires dispersed on Si substrates were bent into hook and loop configuration ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908917

35. PROBING MATERIAL PROPERTIES WITH SHARP INDENTERS: A REVIEW
Published: 1/2/2012
Authors: Brian Ronald Lawn, Robert Francis Cook
Abstract: A review on the use of sharp, fixed-profile indenters as materials probes is presented. Indentation is proposed as a simple but powerful methodology for evaluating basic mechanical properties,elastic modulus, hardness, toughness, etc.,in all class ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908865

36. Size Measurement of Nanoparticles Using Atomic Force Microscopy, ASTM E2859-11
Report Number: 1200-7
Published: 1/2/2012
Authors: Jaroslaw Grobelny, Frank W DelRio, Pradeep Narayanan Namboodiri, Doo-In Kim, Vincent A Hackley, Robert Francis Cook
Abstract: The purpose of this document is to provide guidance on the quantitative application of atomic force microscopy (AFM) to determine the size of nanoparticles2 deposited in dry form on flat substrates using height (z-displacement) measurement. Unlike el ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910685

37. Deformation and fracture of single-crystal silicon theta-like specimens
Published: 10/28/2011
Authors: Michael S. Gaither, Frank W DelRio, Richard Swift Gates, Robert Francis Cook
Abstract: Miniaturized test specimens of single-crystal silicon, fabricated by lithography and deep reactive ion etching (DRIE), were used to measure deformation and fracture properties at the micro scale. Two specimen geometries, both in the form of a Greek l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908887

38. Micro-scale measurement and modeling of stress in silicon surrounding a tungsten-filled through-silicon via
Published: 10/11/2011
Authors: Ryan P. Koseski, William A Osborn, Stephan J Stranick, Frank W DelRio, Mark D Vaudin, Thuy Dao, Vance H. Adams, Robert Francis Cook
Abstract: The stress in silicon surrounding a tungsten-filled through-silicon via (TSV) is measured using confocal Raman microscopy line scans across the TSV both before and after etch removal of an oxide stack used as a mask to define the TSV during fabricati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908908

39. Prototype cantilevers for quantitative lateral force microscopy
Published: 9/27/2011
Authors: Mark Reitsma, Richard Swift Gates, Lawrence H Friedman, Robert Francis Cook
Abstract: Prototype cantilevers that enable quantitative micro- to nano-scale surface force measurements using contact-mode atomic force microscopy (AFM) are presented. The ,HammerheadŠ cantilevers allow precise optical lever system calibrations for cantilever ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907018

40. Structure-property relationships for methyl-terminated alkyl self-assembled monolayers
Published: 7/20/2011
Authors: Frank W DelRio, Dave Rampulla, Cherno Jaye, Gheorghe Stan, Richard Swift Gates, Daniel A Fischer, Robert Francis Cook
Abstract: Structure-property relationships for methyl-terminated alkyl self-assembled monolayers (SAMs) are developed using near-edge X-ray absorption fine structure spectroscopy (NEXAFS) and atomic force microscopy (AFM). NEXAFS C K-edge spectra are used to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908238



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