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Author: robert cook

Displaying records 21 to 30 of 49 records.
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21. Elastic, adhesive, and charge transport properties of a metal-molecule-metal junction: the role of molecular orientation, order, and coverage
Published: 5/20/2010
Authors: Frank W DelRio, Kristen L Steffens, Cherno Jaye, Daniel A Fischer, Robert Francis Cook
Abstract: The elastic, adhesive, and charge transport properties of a metal-molecule-metal junction are studied via conducting-probe atomic force microscopy (AFM) and correlated with molecular structure by near edge x-ray absorption fine structure (NEXAFS) spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903177

22. Strength distribution of single-crystal silicon theta-like specimens
Published: 5/18/2010
Authors: Michael S. Gaither, Frank W DelRio, Richard Swift Gates, Edwin R. Fuller, Robert Francis Cook
Abstract: A new test specimen has been developed for micro-scale tensile strength measurements, allowing direct assessment of surface effects on strength. Specimens were formed by deep reactive ion etching, tested with instrumented indentation, and test resul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904988

23. Probing the Nanoscale
Published: 4/23/2010
Author: Robert Francis Cook
Abstract: Nanoscale probes can now measure all manner of nanomechanical properties, opening up opportunities for new science and new devices.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905145

24. Compressive stress effect on the radial elastic modulus of oxidized Si nanowires
Published: 3/23/2010
Authors: Gheorghe Stan, Sergiy Krylyuk, Albert Davydov, Robert Francis Cook
Abstract: Detailed understanding and optimal control of the properties of Si nanowires are essential steps in developing Si nanoscale circuitry. In this work, we have investigated mechanical properties of as-grown and oxidized Si nanowires as a function of the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904727

25. Theta-like specimen to determine tensile strength at the micro-scale
Published: 3/10/2010
Authors: Michael S. Gaither, Frank W DelRio, Richard Swift Gates, Edwin R. Fuller, Robert Francis Cook
Abstract: Micro- and nano-electromechanical systems are typically formed via lithographic and etching processes that leave residual surface features, stresses, and chemistry that ultimately control component strength and device reliability. Here, we describe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904555

26. The Nanomechanical Properties of Thin Film of Type I Collagen Fibrils
Published: 3/2/2010
Authors: Koo-Hyun Chung, Kiran Bhadriraju, Tighe Spurlin, Robert Francis Cook, Anne L Plant
Abstract: Cells sense and respond to the mechanical properties of the substrate to which they adhere. Matrices composed of collagen have been an important experimental system to study cell responses to the stiffness of the extracellular matrix. We had previo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824709

27. Nanomechanical Measurements and Tools
Published: 2/23/2010
Author: Robert Francis Cook
Abstract: Nanotechnology provides great opportunities for the development of advanced devices with enormous quality-of-life and economic benefits, with applications ranging from biomedical implantable actuators to environmental toxin detectors to infrastructur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904862

28. Size Measurement of Nanoparticles using Atomic Force Microscopy
Published: 10/1/2009
Authors: Jaroslaw Grobelny, Frank W DelRio, Pradeep Narayanan Namboodiri, Doo-In Kim, Vincent A Hackley, Robert Francis Cook
Abstract: In this assay protocol, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via intermittent contact mode AFM are first described. The procedures for AFM calibration and ope ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854085

29. Elastic modulus of low-k dielectric thin films measured by load-dependent contact-resonance atomic force microscopy
Published: 9/14/2009
Authors: Gheorghe Stan, Sean King, Robert Francis Cook
Abstract: Correlated force and contact-resonance versus displacement responses have been resolved using load-dependent contact-resonance atomic force microscopy (AFM) to determine the elastic modulus of low-k dielectric thin films. The measurements consisted ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902329

30. Stress-Intensity Factor and Toughness Measurement at the Nanoscale using Confocal Raman Microscopy
Published: 7/12/2009
Authors: Robert Francis Cook, Yvonne Beatrice Gerbig, Mark D Vaudin, Jeroen Schoenmaker, Stephan J Stranick
Abstract: A confocal Raman microscopy technique is presented that allows stress measurement at the nanoscale, which in turn enables measurement of stress-intensity factors (SIF) at crack tips and thus toughness to be estimated. Peak-fitting and super-resolutio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900910



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