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You searched on: Author: robert cook

Displaying records 21 to 30 of 78 records.
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21. Decoupling small-scale roughness and long-range features on deep reactive ion etched silicon surfaces
Published: 9/19/2013
Authors: Frank W DelRio, Lawrence H Friedman, Michael S. Gaither, William A Osborn, Robert Francis Cook
Abstract: Roughness scaling of three different deep reactive ion etched (DRIE) silicon surfaces is investigated using atomic force microscopy. At small distances, height-height correlations H reveal power-law behavior with equal scaling exponents for all surf ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913812

22. Development of a Precision Nanoindentation Platform
Published: 7/18/2013
Authors: Douglas T Smith, Bartosz K. (Bartosz Karol) Nowakowski, Robert Francis Cook, Stuart T Smith, Luis F Correa
Abstract: This paper presents the design, construction and performance of a surface- referenced nanoindentation instrument termed a precision nanoindentation platform (PNP). The PNP is a symmetrically designed instrument with a centrally located indenter tip a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912510

23. On the bending strength of single-crystal silicon theta-like specimens
Published: 7/10/2013
Authors: Rebecca R. Kirkpatrick, William A Osborn, Michael S. Gaither, Richard Swift Gates, Frank W DelRio, Robert Francis Cook
Abstract: A new theta geometry was developed for micro-scale bending strength measurements. The new ,gapŠ theta specimen was a simple modification of the arch theta specimen that enabled micro-scale tensile testing. The gap theta was demonstrated here on sin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913369

24. Etching process effects on surface structure, fracture strength, and reliability of single-crystal silicon theta-like specimens
Published: 5/30/2013
Authors: Michael S. Gaither, Richard Swift Gates, Rebecca R. Kirkpatrick, Robert Francis Cook, Frank W DelRio
Abstract: The etching processes used to produce microelectromechanical systems (MEMS) leave residual surface features that typically limit device strength and, consequently, device lifetime and reliability. In order to optimize MEMS device reliability, it is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912389

25. Surface-Engineered Nanomaterials as X-ray Absorbing Adjuvant Agents for Auger-Mediated Chemo-Radiation
Published: 4/30/2013
Authors: Robert Francis Cook, Sang-Min Lee, De-Hao D. Tsai, Vincent A Hackley, Martin W. Brechbiel
Abstract: We demonstrate a prototype approach to formulate gold nanoparticle (AuNP)‹based X‹ray absorbing adjuvant agents through surface‹engineering of cisplatin pharmacophore (PtII) with lipoic acid‹modified polyacrylate (denoted as PtII‹AuNPs). Design of Pt ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911911

26. Accuracy and Resolution of Nanoscale Strain Measurement Techniques
Published: 3/26/2013
Authors: William A Osborn, Lawrence H Friedman, Mark D Vaudin, Stephan J Stranick, Michael S. Gaither, Justin M Gorham, Victor H Vartanian, Robert Francis Cook
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913178

27. Interfacial Mechanical Properties of n-Alkylsilane Monolayers on Silicon Substrates
Published: 2/1/2013
Authors: Brian G Bush, Frank W DelRio, Cherno Jaye, Daniel A Fischer, Robert Francis Cook
Abstract: The interfacial properties of n-alkylsilane self-assembled monolayers on silicon were investigated by normal force spectroscopy and lateral force measurements and correlated with molecular structure via near-edge X-ray absorption fine structure (NEXA ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911464

28. Indentation device for in situ Raman spectroscopic and optical studies
Published: 12/12/2012
Authors: Yvonne Beatrice Gerbig, Chris A Michaels, Aaron M Forster, John W Hettenhouser, Walter Eric Byrd, Dylan J. Morris, Robert Francis Cook
Abstract: Instrumented indentation is a widely used technique to study the mechanical behavior of materials at small length scales and thus has been exploited in particular for metals, ceramics, glasses, and polymers. Mechanical tests of bulk materials, micros ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911470

29. High Confidence Level Calibration for AFM Based Fracture Testing of Nanobeams
Published: 6/11/2012
Authors: Scott Grutzik, Richard Swift Gates, Yvonne Beatrice Gerbig, Robert Francis Cook, Melissa Hines, Alan Zehnder
Abstract: When designing micro- or nanoelectromechanical systems, (MEMS and NEMS), it is important to consider whether structural elements will withstand loads experienced during operation. Fracture behavior at length scales present in MEMS and NEMS is much di ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911026

30. Nanoscale mapping of contact stiffness and damping by contact-resonance atomic force microscopy
Published: 5/3/2012
Authors: Gheorghe Stan, Robert Francis Cook
Abstract: In this work, a new procedure is demonstrated to retrieve the conservative and dissipative contributions to contact-resonance atomic force microscopy (CR-AFM) measurements from the contact resonance frequency and resonance amplitude. By simultaneous ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910667



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