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You searched on: Author: wei chu

Displaying records 11 to 20 of 24 records.
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11. Topography measurements for correlations of standard cartridge cases
Published: 7/1/2010
Authors: Theodore Vincent Vorburger, Jun-Feng Song, Wei Chu, Thomas B Renegar, Xiaoyu A Zheng, James H Yen, Robert Meryln Thompson, Richard M Silver, Benjamin Bachrach, Martin Ols
Abstract: NIST Standard Reference Materials (SRM) 2460 Standard Bullets and 2461 Standard Cartridge Cases are intended for use as check standards for crime laboratories to help verify that their computerized optical imaging equipment for ballistics image acqui ...

12. Optimal Compression and Binarization of Signature Profiles for Automated Bullet Identification Systems
Published: 5/1/2010
Authors: Wei Chu, Jun-Feng Song, Theodore Vincent Vorburger, Robert Meryln Thompson, Thomas B Renegar, Richard M Silver

13. Applications of Cross-Correlation Functions
Published: 4/14/2010
Authors: Theodore Vincent Vorburger, Jun-Feng Song, Wei Chu, Li Ma, Xiaoyu A Zheng, Thomas B Renegar, Son H Bui
Abstract: We describe several examples where we use cross-correlation functions to quantify the similarity of 2D surface profiles or of 3D surface topography images. The applications have included 1) the manufacture of Standard Reference Material (SRM) bullet ...

14. Pilot Study of Automated Bullet Signature Identification Based on Topography Measurements and Correlations
Published: 3/1/2010
Authors: Wei Chu, Jun-Feng Song, Theodore Vincent Vorburger, James H Yen, Susan M Ballou, Benjamin Bachrach
Abstract: A procedure for automated bullet signature identification is described based on topography measurements using confocal microscope and correlations calculation. Automated search and retrieval systems are widely used for comparison of firearms evidence ...

15. An Iterative Image Registration Algorithm by Optimizing Similarity Measurement
Published: 1/1/2010
Authors: Wei Chu, Li Ma, Jun-Feng Song, Theodore Vincent Vorburger

16. An Improved Digital Image Correlation Method Applied to Scanning Probe Microscope Images
Published: 10/1/2009
Authors: Wei Chu, Joseph Fu, Theodore Vincent Vorburger
Abstract: Digital image correlation (DIC) is a method for measuring the surface displacements and displacement gradients in materials under deformation. During the calculation, the traditional DIC method directly uses the intensity values of compared images an ...

17. Influence of room temperature control system on AFM imaging
Published: 10/1/2009
Authors: Joseph Fu, Wei Chu, Theodore Vincent Vorburger
Abstract: As technology progresses, the control of environment for experiments is also getting more sophisticated; such as the control of lab temperature and vibration. Temperature controlled within ± 0.25° C for a general purpose lab is common place. We illus ...

18. A moving window correlation method to reduce the distortion of SPM images
Published: 8/20/2009
Authors: Wei Chu, Joseph Fu, Ronald G Dixson, Ndubuisi George Orji, Theodore Vincent Vorburger
Abstract: Many scanning probe microscopes (SPMs), such as the scanning tunneling microscope (STM) and atomic force microscope (AFM), use piezoelectric actuators operating in open loop for generating the scans of the surfaces. However, nonlinearities mainly cau ...

19. Nano- and Atomic-Scale Length Metrology
Published: 12/14/2007
Authors: Theodore Vincent Vorburger, Ronald G Dixson, Joseph Fu, Ndubuisi George Orji, Shaw C Feng, Michael W. Cresswell, Richard A Allen, William F Guthrie, Wei Chu

20. 3D Image Correction of Tilted Sample Through Coordinate Transformation
Published: 1/1/2007
Authors: Wei Chu, Joseph Fu, Ronald G Dixson, Theodore Vincent Vorburger
Abstract: In scanned probe measurements of micrometer- or nanometer-scale lines, it is nearly impossible to maintain the sample in a perfectly level position, and even a small amount of tilt angle can contribute to the accuracy of the result of measurand such ...

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
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