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Author: steven choquette
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1. Performance Benchmarking and Intensity Calibration of a Widefield Fluorescence Microscope Using Fluorescent Glass
Published: 8/11/2014
Authors: Michael W Halter, Elianna Bier, Paul C DeRose, Gregory A Cooksey, Steven J Choquette, Anne L Plant, John T Elliott
Abstract: Widefield fluorescence microscopy is a highly used tool for visually assessing biological samples and for quantifying cell responses. Despite its widespread use in high content analysis and other screening applications, few published methods exist f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915188

2. Temperature Measurement and Optical Path-length Bias Improvement Modifications to NIST Ozone Reference Standards
Published: 5/1/2013
Authors: James E Norris, Steven J Choquette, Franklin R Guenther, Joele Viallon, Philippe Moussay, Robert Wielgosz
Abstract: Ambient ozone measurements in the U.S. and many other countries are traceable to a National Institute of Standards and Technology Standard Reference Photometer (NIST SRP). The NIST SRP serves as the highest level ozone reference standard in the U.S. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906879

3. Measurement of Scattering and Absorption Cross Sections of Dyed Microspheres
Series: Journal of Research (NIST JRES)
Report Number: 118.002
Published: 1/14/2013
Authors: Adolfas Kastytis Gaigalas, Steven J Choquette
Abstract: Measurements of absorbance and fluorescence emission were carried out on aqueous suspensions of polystyrene (PS) microspheres with a diameter of 2.5 µm. Microspheres with and without green BODIPY@ dye were measured. Placing the suspension inside ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910886

4. Measurement of Scattering and Absorption Cross Sections of Microspheres for Wavelengths between 240 nm and 800 nm
Series: Journal of Research (NIST JRES)
Report Number: 118.001
Published: 1/10/2013
Authors: Lili Wang, Steven J Choquette, Adolfas Kastytis Gaigalas
Abstract: A commercial spectrometer with a 150 mm integrating sphere (IS) detector was used to measure the scattering and absorption cross sections of polystyrene monodisperse microspheres suspended in water. Absorption measurements were performed with the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909635

5. Measurement of Scattering Cross Section with a Spectrophotometer with an Integrating Sphere Detector
Series: Journal of Research (NIST JRES)
Report Number: 117.012
Published: 9/13/2012
Authors: Lili Wang, Steven J Choquette, Yu-Zhong Zhang, Victoria Karpiak, Adolfas Kastytis Gaigalas
Abstract: A commercial spectrometer with an integrating sphere (IS) detector was used to measure the scattering cross section of microspheres. Analysis of the measurement process showed that two measurements of the extinction, one with the cuvette placed i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909272

6. Certified Transmittance Density Uncertainties for Standard Reference Materials using a Transfer Spectrophotometer
Series: Technical Note (NIST TN)
Report Number: 1715
Published: 11/28/2011
Authors: John Carlton Travis, Melody V Smith, Steven J Choquette, Hung-Kung Liu
Abstract: Overall uncertainties are evaluated for the certification of transmittance density (absorbance referred to air) and regular spectral transmittance for solid neutral density filter Standard Reference Materials by means of a transfer spectrophotometer. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908914

7. Automated Spectral Smoothing with Spatially Adaptive Penalized Least-Squares
Published: 6/1/2011
Authors: Aaron A Urbas, Steven J Choquette
Abstract: A variety of data smoothing techniques exist to address the issue of noise in spectroscopic data. The vast majority, however, require parameter specification by a knowledgeable user, which is typically accomplished by trial and error. In most situati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904908

8. Use of Standard Reference Material 2242 (Relative Intensity Correction Standard for Raman Spectroscopy) for Microarray Scanner Qualification
Published: 8/1/2008
Authors: Mary B Satterfield, Marc L Salit, Steven J Choquette
Abstract: As a critical component of any microarray experiment, scanner performance has the potential to contribute variability and bias, the magnitude of which is usually not quantified. Using Standard Reference Material (SRM) 2242, certified for Raman spec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901212

9. Relative intensity correction of Raman spectrometers: NIST SRMs 2241 through 2243 for 785 nm, 532 nm, and 488 nm/514.5 nm excitation
Published: 2/1/2007
Authors: Steven J Choquette, E S. Etz, Wilbur Scott Hurst, Douglas H. Blackburn, Stefan D Leigh
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906524

10. SRM 2036 Near Infrared Reflection Wavelength Standard
Published: 11/1/2005
Authors: David Lee Duewer, Steven J Choquette, Leonard M Hanssen, E A. Early
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904463



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