NIST logo

Publications Portal

You searched on:
Author: steven choquette

Displaying records 21 to 25.
Resort by: Date / Title


21. Challenges in Providing Standard Reference Materials for Chemical and Pharmaceutical Process Analysis
Published: 2/2/1999
Authors: John Carlton Travis, Gary W Kramer, Melody V Smith, Steven J Choquette
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100829

22. SRM 2035: A Rare-Earth Oxide Glass for the Wavelength Calibration of Near-Infrared Dispersive and Fourier Transform Spectrometers
Published: 7/20/1998
Authors: Steven J Choquette, John Carlton Travis, David Lee Duewer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903946

23. Characterizing the Uncertainty in Near-Infrared Spectroscopic Prediction of Mixed Oxygenate Concentrations in Gasoline: Sample-Specific Prediction Intervals
Published: 7/15/1998
Authors: K Faber, David Lee Duewer, Steven J Choquette, T L Green, S. N. Chesler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902055

24. Raman Microprobe Study of the Visible and Near-Infrared Excited Fluorescence Spectra of Glasses Examined as Potential Raman Intensity Calibration Standards
Published: 2/12/1998
Authors: E S. Etz, Steven J Choquette, Wilbur Scott Hurst, Douglas H. Blackburn
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901739

25. Identification and Quantitation of Oxygenates in Gasoline Ampules Using Fourier Transform Near-Infrared Spectroscopy and Fourier Transform Raman Spectroscopy
Published: 10/15/1996
Authors: Steven J Choquette, S. N. Chesler, David Lee Duewer, S. Wang, T C O'haver
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100494



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series