Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Author: jeffrey cessna Sorted by: date

Displaying records 1 to 10 of 37 records.
Resort by: Date / Title


1. Long-term stability of carrier-added Ge-68 standardized solutions
Published: 3/1/2016
Authors: Brian Edward Zimmerman, Denis E Bergeron, Ryan P Fitzgerald, Jeffrey T Cessna
Abstract: Tests for chemical stability were carried out on carrier-added 68Ge solutions prepared and calibrated in 2007 and 2011 to evaluate the suitability of the specific composition as a potential Standard Reference Material. Massic count rates of the store ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918733

2. Impact of recent change in NIST standard for 18F on the relative response of 68Ge-based mock syringe dose calibrator standards
Published: 7/16/2015
Authors: Brian Edward Zimmerman, Denis E Bergeron, Jeffrey T Cessna
Abstract: As a result of a recent change in the National Institute of Standards and Technology (NIST) activity standard for 18F, we have determined new relative response ratios for a 68Ge solid epoxy mock syringe source used in activity calibrators as a long-l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918048

3. Revision of the NIST Standard for 223Ra: New Measurements and Review of 2008 Data
Series: Journal of Research (NIST JRES)
Published: 7/1/2015
Authors: Denis E Bergeron, Jeffrey T Cessna, Leticia S Pibida
Abstract: After discovering a discrepancy in the transfer standard currently being disseminated by the National Institute of Standards and Technology (NIST), we have performed a new primary standardization of the alpha-emitter 223Ra using Live-timed Antico ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917481

4. Determination of photon emission probabilities for the main gamma-rays of 223Ra in equilibrium with its progeny
Published: 3/11/2015
Authors: Leticia S Pibida, Brian Edward Zimmerman, Ryan P Fitzgerald, Lynne Emily King, Jeffrey T Cessna, Denis E Bergeron
Abstract: The currently published 223Ra gamma-ray emission probabilities display a wide variation in the values depending on the source of the data. The National Institute of Standards and Technology performed activity measurements on a 223Ra solution that was ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916239

5. Secondary standards for 223Ra revised
Published: 3/5/2015
Authors: Denis E Bergeron, Jeffrey T Cessna, Brian Edward Zimmerman
Abstract: Dose calibrator dial settings reported by NIST in 2010 (ARI v. 68, p. 1367) are now known to give erroneously low (by 10 %) activity readings. The original determinations were based on a chain of calibrations; a broken link in this chain was recentl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917094

6. A review of NIST primary activity standards for 18F: 1982 to 2013
Series: Journal of Research (NIST JRES)
Published: 8/27/2014
Authors: Denis E Bergeron, Jeffrey T Cessna, Bert M Coursey, Ryan P Fitzgerald, Brian Edward Zimmerman
Abstract: The new NIST activity standardization for 18F differs from results obtained between 1998 and 2008 by 4 %. The new results are considered to be very reliable; they are based on a battery of robust primary measurement techniques and bring the NIST sta ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915421

7. Dose calibrator manufacturer-dependent bias in assays of 123I
Published: 3/26/2014
Authors: Denis E Bergeron, Jeffrey T Cessna, Daniel Benjamin Golas, Rheannan K Young, Brian Edward Zimmerman
Abstract: Calibration factors for commercial ionization chambers (i.e. dose calibrators) were determined for a solution of 123I; the activity was based on the 1976 NBS standard. A link between the NIST standard and the International Reference System (SIR) was ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915010

8. A New NIST Primary Standardization of 18F
Published: 2/1/2014
Authors: Ryan P Fitzgerald, Brian Edward Zimmerman, Denis E Bergeron, Jeffrey T Cessna, Leticia S Pibida, Denise S Moreira
Abstract: A new primary standardization of 18F by NIST is reported. The standard is based on live-timed beta- gamma anticoincidence counting with confirmatory measurements by three other methods: (i) liquid scintillation (LS) counting using CIEMAT/NIST 3H e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914677

9. Calibration of traceable solid mock I-131 phantoms used in an international SPECT image quantification comparison
Series: Journal of Research (NIST JRES)
Report Number: 118.017
Published: 8/15/2013
Authors: Brian Edward Zimmerman, Leticia S Pibida, Lynne Emily King, Denis E Bergeron, Jeffrey T Cessna, Matthew Merril Mille
Abstract: The International Atomic Energy Agency (IAEA) has organized an international comparison to assess Single Photon Emission Computed Tomography (SPECT) image quantification capabilities in 12 countries. Iodine-131 was chosen as the radionuclide for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913572

10. Results of an international comparison for the activity measurement of 177Lu
Published: 3/6/2012
Authors: Brian Edward Zimmerman, Denis E Bergeron, Jeffrey T Cessna
Abstract: An international Key Comparison of 177Lu has recently been carried out. Twelve laboratories performed assays for radioactivity content on aliquots of a common master solution of 177Lu, leading to eleven results submitted for entry into the Key Compar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910327



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series