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You searched on: Author: steven brown

Displaying records 141 to 150 of 155 records.
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141. Development and Application Issues of a Spectrally Tunable LED Source
Published: Date unknown
Authors: George P Eppeldauer, Steven W Brown, G Dezsi, Irena Fryc, Yoshihiro Ohno
Abstract: A spectrally tunable solid state source based on Light Emitting Diodes (LEDs) is being developed at the National Institute of Standards and Technology (NIST). The tunable source will emulate the spectral distributions of various light sources and can ...

142. Four-Color Matrix Method for Correction of Tristimulus Colorimeters Part 2
Published: Date unknown
Authors: Yoshihiro Ohno, Steven W Brown
Abstract: The Four-Color Method was developed to improve the accuracy of tristimulus colorimeters for measurements of color displays. It was verified that the method works well for CRTs. The accuracy of this method has been studied further for spectral variat ...

143. LED-Based Spectrally Tunable Source for Radiometric, Photometric and Colorimetric Applications
Published: Date unknown
Authors: Irena Fryc, Steven W Brown, George P Eppeldauer, Yoshihiro Ohno

144. Metrology for Remote Sensing Radiometry
Published: Date unknown
Authors: Bettye C Johnson, Steven W Brown, Joseph Paul Rice
Abstract: Metrology, the science of measurement, is discussed in terms of measurements of radiant flux and associated quantities. Radiometric measurements are naturally remote, that is, they are non-contact. A broad application is Earth science, as global meas ...

145. NIST Calibration Facility for Display Colorimeters
Published: Date unknown
Authors: Steven W Brown, Yoshihiro Ohno
Abstract: A calibration facility has been developed at the National Institute of Standards and Technology (NIST) to address the need for high accuracy color measurementsof displays. Calibration services tailored to display measuremets are planned for colimeter ...

146. NIST Reference Spectroradiometer for Color Display Calibrations
Published: Date unknown
Authors: Steven W Brown, Yoshihiro Ohno
Abstract: A program has recently been established at the National Institute of Standards and Technology (NIST) to develop calibration services for color-measuring instruments to address commercial and industrial needs for higher-accuracy measurements of displa ...

147. Radiometric Validation of NASA's Ames Research Center's Sensor Calibration Laboratory
Published: Date unknown
Authors: Steven W Brown, Bettye C Johnson, S F Biggar, E F Zalewski, J W Cooper, P Hajek, E Hildum, P Grant, R Barnes, James J. Butler

148. Simultaneous Measurement of Up-Welling Spectral Radiance Using a Fiber-Coupled CCD Spectrograph
Published: Date unknown
Authors: M Yarbrough, S Flora, M Feinholz, Terrance Houlihan, Yong S. Kim, Steven W Brown, Bettye C Johnson, Kenneth Voss, Dennis Clark
Abstract: Determination of the water-leaving spectral radiance using in-water instrumentation requires measurements of the up-welling spectral radiance (Lu) at several depths. If these measurements are separated in time, changes in the measurement conditions ...

149. Spectral Matching With an LED-Based Spectrally Tunable Light Source
Published: Date unknown
Authors: Irena Fryc, Steven W Brown, Yoshihiro Ohno
Abstract: A spectrally tunable light source using a large number of LEDs and an integrating sphere has been designed and constructed at the National Institute of Standards and Technology (NIST). The source is designed to have a capability of producing any visi ...

150. System-Level Pre-Launch Calibration of Onboard Solar Diffusers
Published: Date unknown
Authors: R Barnes, Steven W Brown, Keith R. Lykke, Gerald T Fraser, James J. Butler
Abstract: Onboard diffuse reflecting plaques are carried to orbit as radiometric reference standards for Earth-observing satellite instruments. For many instruments the reflectance properties of the plaque are characterized independent of the instrument, and ...

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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
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