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1. 400-Fold Reduction in Saturation Field by Interlayering
Published: 1/13/2009
Authors: William F. Egelhoff Jr., John E Bonevich, Philip Pong, John Unguris, Robert D McMichael, Gery R Stafford, Carlos R Beauchamp
Abstract: The buildup of stress with increasing thickness of magnetic thin films is a common phenomenon that often induces undesirable saturation fields that can convert an otherwise magnetically soft film into a magnetically hard one. We have found that by i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854046

2. A Bayesian/Maximum Entropy Method for the Certification of a Nanocrystallite-Size NIST Standard Reference Material
Published: 7/1/2004
Authors: N G Armstrong, W Kalceff, James P Cline, John E Bonevich
Abstract: A Bayesian/Maximum Entropy (MaxEnt) method for determining crystallite size distribution and morphology from size-broadened x-ray line profiles is presented. This method will be used in certifying a nanocrystallite-size standard reference material ( ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851134

3. A Method for Fabricating Conductometric Gas Sensors of Metal Oxide Nanotubes Formed in Porous Aluminum Oxide Membranes
Published: 2/2/2009
Authors: Reit Artzi-Gerlitz, Kurt D Benkstein, David L. Lahr, Joshua L. Hertz, Christopher B Montgomery, John E Bonevich, Stephen Semancik, Michael J Tarlov
Abstract: We describe a general, simple strategy for fabricating conductometric gas sensors from metal oxide nanotubes formed in nanoporous aluminum oxide membranes. In this approach, the aluminum oxide membrane serves as both a template for growth of the sens ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832271

4. A Simple Equation for Predicting Superconformal Electrodeposition in Submicrometer Trenches
Published: 11/2/2001
Authors: Daniel Josell, Daniel Wheeler, W H Huber, John E Bonevich, Thomas P Moffat
Abstract: We present a single variable first-order differential equation for predicting the occurrence of superconformal electrodeposition. The equation presumes that the dependence of deposition rate on surface coverage of accelerator is known (e.g., derived ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853067

5. AC susceptibility studies of magnetic relaxation in nanoparticles of Ni dispersed in silica
Published: 4/1/2009
Authors: V Singh, M Seehra, John E Bonevich
Abstract: Temperature dependence of AC susceptibilities χ' and χ'' are reported using frequencies fm = 0.1 Hz, 1 Hz, 99 Hz, 499 Hz and 997 Hz for nanoparticles (NPs) of Ni dispersed in silica (Ni/SiO2:15/85) with the mean sizes D=3.8 nm, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900254

6. Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles
Series: Journal of Research (NIST JRES)
Published: 2/1/2004
Authors: N G Armstrong, W Kalceff, James P Cline, John E Bonevich
Abstract: A single and self-contained method for determining the crystallite-size distribution and shape from experimental line profile data is presented. We have shown that the crystallite-size distribution can be determined without assuming a functional for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850655

7. Coercivities Above 10 kOe in CoPd Superlattices
Published: Date unknown
Authors: William F. Egelhoff Jr., Cedric John Powell, L Gan, P J Chen, H Ettedgui, D Tirosh, Robert D McMichael, Mark D Stiles, J Mallett, Alexander J. Shapiro, John E Bonevich, J H Judy, Erik B. Svedberg, A. E. Berkowitz
Abstract: We have achieved excellent grain isolation in CoPd superlattices by using 10 nm Au as both an underlayer and an overlayer and diffusing Au into the grain boundaries by annealing for {approximately equal to} 30 min. at 300 degrees C. The grain isola ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853305

8. Coercivities above 10 kOe in CoPd Superlattices
Published: 1/1/2004
Authors: William F. Egelhoff Jr., Cedric John Powell, L Gan, P J Chen, H Ettendgui, D Tirosh, Robert D McMichael, Mark D Stiles, J Mallett, Alexander J. Shapiro, John E Bonevich
Abstract: We have achieved excellent grain isolation in CoPd superlattices by using 10 nm Au as both an underlayer and an overlayer and diffusing Au into the grain boundaries by annealing for {approximately equal to} 30 min. at 300 degrees C. The grain isola ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620001

9. Comparison of Electrical CD Measurements and Cross-Section Lattice-Plane Counts of Sub-Micrometer Features Replicated in (100) Silicon-on-Insulator Material
Published: 6/1/2000
Authors: Michael W Cresswell, John E Bonevich, T J. Headley, Richard A Allen, Lucille A. Giannuzzi, Sarah C. Everist, Rathindra Ghoshtagore, Patrick J. Shea
Abstract: Test structures of the type known as cross-bridge resistors have been patterned in (100) epitaxial silicon material that was seeded on Bonded and Etched-Back silicon-on-Insulator (BESOI) substrates. The electrical CDs (Critical Dimensions) of a limit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5697

10. Compositional Control in Electrodeposited Ni (subscript x) Pt (subscript 1-x) Films
Published: 10/29/2007
Authors: J Mallett, Erik B. Svedberg, John E Bonevich, Alexander J. Shapiro, William F. Egelhoff Jr., Thomas P Moffat
Abstract: Electrochemical co-deposition of a series of fcc Ni(subscript x)PT(subscript 1-x) alloys is demonstrated. The alloy composition is a monotonic function of potential. The Pt-rich Ni(subscript x)PT(subscript 1-x) alloys are formed at potentials posit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853495