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You searched on: Author: john bonevich

Displaying records 61 to 70 of 72 records.
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61. Strong Anisotropy in Thin Magnetic Films Deposited on Obliquely Sputtered Ta Underlayers
Published: 11/1/2000
Authors: Robert D McMichael, C G Lee, John E Bonevich, P J Chen, W Wyatt Miller, William F. Egelhoff Jr.
Abstract: Anisotropy fields in excess of 120 kA/m (1500 Oe) have been produced in 3-5 nm- thick polycrystalline films of Co by oblique sputtering of Ta underlayers. The unusually high anisotropy is magnetostatic in origin, and is induced by corrugations on th ...

62. Comparison of Electrical CD Measurements and Cross-Section Lattice-Plane Counts of Sub-Micrometer Features Replicated in (100) Silicon-on-Insulator Material
Published: 6/1/2000
Authors: Michael W. Cresswell, John E Bonevich, T J. Headley, Richard A Allen, Lucille A. Giannuzzi, Sarah C. Everist, Rathindra Ghoshtagore, Patrick J. Shea
Abstract: Test structures of the type known as cross-bridge resistors have been patterned in (100) epitaxial silicon material that was seeded on Bonded and Etched-Back silicon-on-Insulator (BESOI) substrates. The electrical CDs (Critical Dimensions) of a limit ...

63. Correlation of the optical gap of (Ba,Sr)yTiO^d2+y^ thin films with film composition
Published: 6/1/2000
Authors: L D. Rotter, Mark D Vaudin, John E Bonevich, Debra L Kaiser, S 0. Park
Abstract: A series of (Ba^d1-x^,Sr^dx^)yTiO^d2+y^ films with a wide range of y and x < 0.07 was grown by metalorganic chemical vapor deposition. The composition of the films was determined by wavelength dispersive x-ray spectrometry. Transmission spectra ...

64. Thermal Transport Through Thin Films: Mirage Technique Measurements on Aluminum/Titanium Multilayers
Published: 3/1/2000
Authors: E J Gonzalez, John E Bonevich, Gery R Stafford, Grady S White, Daniel Josell
Abstract: Thermal transport properties of multilayer thin films both normal and parallel to the layers were measured. Al/Ti multilayer films 3 m thick, with individual layers systematically varied from 2.5 to 40 nm, were studied on Si substrates. Layers of ...

65. Measuring the Interface Stress: Silver/Nickel Interfaces
Published: 11/1/1999
Authors: Daniel Josell, John E Bonevich, I Shao, R C Cammarata
Abstract: Interface stress is a surface thermodynamics quantity associated with the reversible work of elastically straining an internal solid interface. In a multilayered thin film, the combined effect of the interface stress of each interface results in an i ...

66. Face-Centered Cubic Titanium: An Artifact in Titanium/Aluminum Multilayers
Published: 5/1/1999
Authors: John E Bonevich, D van Heerden, Daniel Josell
Abstract: The present investigation is the first comprehensive comparative study of x-ray diffraction (XRD) and transmission electron microscopy (TEM) results to address the important issue of fcc Ti formation in nanoscale multilayers Ti/Al multilayers with 7. ...

67. Effect of Film Composition on the Orientation of (Ba,Sr)TiO^d3^ Grains in (Ba,Sr)^dy^TiO^d2+y^ Thin Films
Published: 1/12/1999
Authors: Debra L Kaiser, Mark D Vaudin, L D. Rotter, John E Bonevich, J T. Armstrong
Abstract: (Ba,Sr)^dy^TiO^d2+y^ thin films with 0.34 {< or =} y {< or =} 1.64 were deposited by metalorganic chemical vapor deposition (MOCVD) on (100) MgO substrates at various growth conditions. X-ray diffraction and transmission electron microscopy studies ...

68. The Growth Kinetics of Nanocrystalline ZnO Colloidal Solutions
Published: 9/11/1998
Authors: E M Wong, John E Bonevich, P C Searson
Abstract: Colloidal chemistry techniques were used to synthesize ZnO particles in the nanometer size regime. Although the synthesis and unique properties of these materials are well known, the kinetics of the growth process are not well understood. The parti ...

69. Stability of Multilayer Structures: Capillary Effects
Published: 6/1/1998
Authors: Daniel Josell, W Carter, John E Bonevich
Abstract: The long term stability of multilayer materials composed of nonreactive, immiscible materials is related to the equilibrium shapes of the individual grains within the layers. These shapes are determined by the free energies and locations of the inte ...

70. Coercivities Above 10 kOe in CoPd Superlattices
Published: Date unknown
Authors: William F. Egelhoff Jr., Cedric John Powell, L Gan, P J Chen, H Ettedgui, D Tirosh, Robert D McMichael, Mark D Stiles, J Mallett, Alexander J. Shapiro, John E Bonevich, J H Judy, Erik B. Svedberg, A. E. Berkowitz
Abstract: We have achieved excellent grain isolation in CoPd superlattices by using 10 nm Au as both an underlayer and an overlayer and diffusing Au into the grain boundaries by annealing for {approximately equal to} 30 min. at 300 degrees C. The grain isola ...

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