Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Author: denis bergeron Sorted by: date

Displaying records 1 to 10 of 23 records.
Resort by: Date / Title


1. Micellar phase boundaries under the influence of ethyl alcohol
Published: 5/16/2016
Author: Denis E Bergeron
Abstract: The Compton spectrum quenching technique is used to monitor the effect of ethyl alcohol (EtOH) additions on phase boundaries in two systems. In toluenic solutions of the nonionic surfactant, Triton X-100, EtOH shifts the boundary separating the first ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918032

2. Comparison of C-14 liquid scintillation counting at NIST and NRC Canada
Published: 3/1/2016
Authors: Denis E Bergeron, Raphael Galea, Lizbeth Laureano-Perez, Brian Edward Zimmerman
Abstract: An informal bilateral comparison of 14C liquid scintillation (LS) counting at the National Research Council of Canada (NRC) and the National Institute of Standards and Technology (NIST) has been completed. Two solutions, one containing 14C-labeled so ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918474

3. Impact of recent change in NIST standard for 18F on the relative response of 68Ge-based mock syringe dose calibrator standards
Published: 7/16/2015
Authors: Brian Edward Zimmerman, Denis E Bergeron, Jeffrey T Cessna
Abstract: As a result of a recent change in the National Institute of Standards and Technology (NIST) activity standard for 18F, we have determined new relative response ratios for a 68Ge solid epoxy mock syringe source used in activity calibrators as a long-l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918048

4. Revision of the NIST Standard for 223Ra: New Measurements and Review of 2008 Data
Series: Journal of Research (NIST JRES)
Published: 7/1/2015
Authors: Denis E Bergeron, Jeffrey T Cessna, Leticia S Pibida
Abstract: After discovering a discrepancy in the transfer standard currently being disseminated by the National Institute of Standards and Technology (NIST), we have performed a new primary standardization of the alpha-emitter 223Ra using Live-timed Antico ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917481

5. Two determinations of the 223Ra half-life
Published: 5/1/2015
Authors: Denis E Bergeron, Ryan P Fitzgerald
Abstract: Ra-223 is an alpha-emitter that is being used as a bone-seeking radiotherapeutic agent. The relatively large uncertainty on its half-life (0.26 %, Bé et al., 2011) is an impediment to precision activity assays. We have performed two series of measure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917521

6. Determination of photon emission probabilities for the main gamma-rays of 223Ra in equilibrium with its progeny
Published: 3/11/2015
Authors: Leticia S Pibida, Brian Edward Zimmerman, Ryan P Fitzgerald, Lynne Emily King, Jeffrey T Cessna, Denis E Bergeron
Abstract: The currently published 223Ra gamma-ray emission probabilities display a wide variation in the values depending on the source of the data. The National Institute of Standards and Technology performed activity measurements on a 223Ra solution that was ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916239

7. Secondary standards for 223Ra revised
Published: 3/5/2015
Authors: Denis E Bergeron, Jeffrey T Cessna, Brian Edward Zimmerman
Abstract: Dose calibrator dial settings reported by NIST in 2010 (ARI v. 68, p. 1367) are now known to give erroneously low (by 10 %) activity readings. The original determinations were based on a chain of calibrations; a broken link in this chain was recentl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917094

8. Identification of phase boundaries in surfactant solutions via Compton spectrum quenching,Identification of phase boundaries in surfactant solutions via Compton spectrum quenching
Published: 9/18/2014
Author: Denis E Bergeron
Abstract: The critical micelle concentration and the phase boundary between isolated surfactant molecules and aggregates are probed via fluorescence spectroscopy and a Compton spectrum quenching technique for aqueous and toluenic solutions of Triton X-100 (TX- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915776

9. A review of NIST primary activity standards for 18F: 1982 to 2013
Series: Journal of Research (NIST JRES)
Published: 8/27/2014
Authors: Denis E Bergeron, Jeffrey T Cessna, Bert M Coursey, Ryan P Fitzgerald, Brian Edward Zimmerman
Abstract: The new NIST activity standardization for 18F differs from results obtained between 1998 and 2008 by 4 %. The new results are considered to be very reliable; they are based on a battery of robust primary measurement techniques and bring the NIST sta ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915421

10. Dose calibrator manufacturer-dependent bias in assays of 123I
Published: 3/26/2014
Authors: Denis E Bergeron, Jeffrey T Cessna, Daniel Benjamin Golas, Rheannan K Young, Brian Edward Zimmerman
Abstract: Calibration factors for commercial ionization chambers (i.e. dose calibrators) were determined for a solution of 123I; the activity was based on the 1976 NBS standard. A link between the NIST standard and the International Reference System (SIR) was ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915010



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series