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You searched on: Author: richard allen

Displaying records 121 to 126.
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121. A New Test Structure for the Electrical Measurement of the Width of Short Features with Arbitrarily Wide Voltage Taps
Published: 6/1/1992
Authors: Richard A Allen, Michael W. Cresswell, Laurence M. Buck

122. A Modified Sliding Wire Potentiometer Test Structure for Mapping Nanometer-Level Distances
Published: 12/31/1991
Authors: Michael W. Cresswell, Michael Gaitan, Richard A Allen, Loren W. Linholm

123. Extending Electrical Measurements to the 0.5-um Regime
Published: 12/31/1991
Authors: P. Troccolo, L. Mantalas, Richard A Allen, Loren W. Linholm

124. Knowledge Verification of Machine-Learning Procedures Based on Test Structure Measurements
Published: 12/31/1991
Authors: D. Khera, Loren W. Linholm, Richard A Allen, Michael W. Cresswell, V. C. Tyree, W. Hansford, C. Pina

125. Test Chip for the Evaluation of Surface Diffusion Phenomena in Sputtered Aluminum Planarization Processes
Published: 12/31/1991
Authors: M. A. Jones, John W. Roberts, Colleen E. Hood, Michael W. Cresswell, Richard A Allen

126. CMOS Process Monitor
Published: 12/31/1988
Authors: M. G. Buehler, Loren W. Linholm, V. C. Tyree, Richard A Allen, B. R. Blaes, K. A. Hicks, G. A. Jennings

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