NIST logo

Publications Portal

You searched on: Author: david allen Sorted by: title

Displaying records 1 to 10 of 54 records.
Resort by: Date / Title


1. A Comparison of ITS-90 and Detector-Based Scales Between NPL and NIST Using Metal-Carbon Eutectics
Published: Date unknown
Authors: Graham Machin, Charles E Gibson, D L Lowe, David W Allen, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841844

2. A collection and statistical analysis of skin reflectance signatures for inherent variability over the 250 nm to 2500 nm spectral range
Published: 6/4/2014
Authors: Catherine C Cooksey, Benjamin K Tsai, David W Allen
Abstract: The spectral reflectance signature of human skin provides opportunities to advance observations ranging from medical treatment to security applications. In this study 28 volunteers participated in a skin reflectance measurement of the inside of the r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916057

3. A comparison of ITS-90 and a detector-based scale between NPL and NIST using metal-carbon eutectics
Published: 1/1/2004
Authors: David W Allen, Charles E Gibson, D L Lowe, Graham Machin, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104298

4. Algorithm Validation Using Multicolor Phantoms
Published: 5/9/2012
Authors: Daniel Victor Samarov, Matthew Lawrence Clarke, Ji Y. Lee, David W Allen, Maritoni Abatayo Litorja, Jeeseong Hwang
Abstract: We present a framework for hyperspectral image (HSI) analysis validation, specifically abundance fraction estimation based on HSI measurements of water soluble dye mixtures printed on microarray chips. In our work we focus on the performance of tw ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911285

5. Bidirectional reflectance scale comparison between NIST and PTB
Published: 5/1/2015
Authors: Catherine C Cooksey, Maria E Nadal, David W Allen, Kai-Olaf Hauer, Andreas Hoepe
Abstract: A comparison of bidirectional reflectance scales between the National Institute of Standards and Technology (NIST) and the Physikalisch-Technische Bundesanstalt (PTB) has been performed. Measurements of two sets of white diffuse reflectance standard ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913371

6. Calibration Wafer for Temperature Measurement in RTP Tools
Published: 1/1/1998
Authors: K G Kreider, D P DeWitt, Benjamin K Tsai, Francis John Lovas, David W Allen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104583

7. Calibration and Characterization of Trap Detector Filter Radiometers
Published: 11/1/2003
Authors: David W Allen, George P Eppeldauer, Steven W Brown, E A. Early, Bettye C Johnson, Keith R Lykke
Abstract: We describe the development of a mechanically simple, radiometrically stable transfer radiometer designed for both radiance and irradiance measurements. The filter radiometer consists of a six-element Si trap detector, a temperature stabilized filter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841781

8. Chamber Radiation Effects on Calibration of Radiation Thermometers With a Thin-Film Thermocouple Test Wafer
Published: 6/1/1999
Authors: Benjamin K Tsai, D P DeWitt, Francis John Lovas, Kenneth Gruber Kreider, Christopher W Meyer, David W Allen
Abstract: In the semiconductor industry, Rapid Thermal Processing (RTP) utilizes a prescribed temperature-time recipe to silicon wafers undergoing processes such as annealing and oxide film formation. The National Technology Roadmap for Semiconductors (NTRS) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841364

9. Chamber Radiation Effects on Calibration of Radiation Thermometers with a Thin-Film Thermocouple Test Wafer, ed. by J.F. Dubbeldam and M.J. de Groot
Published: 1/1/1999
Authors: Benjamin K Tsai, D P DeWitt, Francis John Lovas, K G Kreider, C W Meyer, David W Allen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104792

10. Characterization and Calibration of a Trap Detector Filter Radiometer
Published: 1/1/2003
Authors: David W Allen, George P Eppeldauer, Steven W Brown, E A. Early, Bettye C Johnson, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100955



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series