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Author: david allen
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1. A Comparison of ITS-90 and Detector-Based Scales Between NPL and NIST Using Metal-Carbon Eutectics
Published: Date unknown
Authors: Graham Machin, Charles E Gibson, D L Lowe, David W Allen, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841844

2. A comparison of ITS-90 and a detector-based scale between NPL and NIST using metal-carbon eutectics
Published: 1/1/2004
Authors: David W Allen, Charles E Gibson, D L Lowe, Graham Machin, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104298

3. Calibration Wafer for Temperature Measurement in RTP Tools
Published: 1/1/1998
Authors: K G Kreider, D P DeWitt, Benjamin K Tsai, Francis John Lovas, David W Allen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104583

4. Calibration and Characterization of Trap Detector Filter Radiometers
Published: 11/1/2003
Authors: David W Allen, George P Eppeldauer, Steven W Brown, E A. Early, Bettye C Johnson, Keith R Lykke
Abstract: We describe the development of a mechanically simple, radiometrically stable transfer radiometer designed for both radiance and irradiance measurements. The filter radiometer consists of a six-element Si trap detector, a temperature stabilized filter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841781

5. Chamber Radiation Effects on Calibration of Radiation Thermometers With a Thin-Film Thermocouple Test Wafer
Published: 6/1/1999
Authors: Benjamin K Tsai, D P DeWitt, Francis John Lovas, Kenneth Gruber Kreider, Christopher W Meyer, David W Allen
Abstract: In the semiconductor industry, Rapid Thermal Processing (RTP) utilizes a prescribed temperature-time recipe to silicon wafers undergoing processes such as annealing and oxide film formation. The National Technology Roadmap for Semiconductors (NTRS) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841364

6. Chamber Radiation Effects on Calibration of Radiation Thermometers with a Thin-Film Thermocouple Test Wafer, ed. by J.F. Dubbeldam and M.J. de Groot
Published: 1/1/1999
Authors: Benjamin K Tsai, D P DeWitt, Francis John Lovas, K G Kreider, C W Meyer, David W Allen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104792

7. Characterization and Calibration of a Trap Detector Filter Radiometer
Published: 1/1/2003
Authors: David W Allen, George P Eppeldauer, Steven W Brown, E A. Early, Bettye C Johnson, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100955

8. Comparison of Near-infrared Transmittance and Reflectance Measurements using Dispersive and Fourier Transform Spectrophotometers
Published: 1/1/2002
Authors: David W Allen, E A. Early, Leonard M Hanssen, Simon Grant Kaplan, E Nadal m
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100958

9. Comparison of the NIST radiance temperature scale with the detector-based radiance temperature scale from 1200 K to 2800 K
Published: 1/1/2004
Authors: David W Allen, George P Eppeldauer, Charles E Gibson, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104294

10. Development of Surgical Lighting for Enhanced Color Contrast
Published: 5/14/2007
Authors: Maritoni Abatayo Litorja, Steven W Brown, Maria E Nadal, David W Allen, Alexander Gorbach
Abstract: The National Institute of Standards and Technology and the National Institutes of Health have started a collaborative study on the development of lighting that will provide enhanced, specific to various tissues, contrast with respect to its surroundi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841075



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