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Author: david allen
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1. A Comparison of ITS-90 and Detector-Based Scales Between NPL and NIST Using Metal-Carbon Eutectics
Published: Date unknown
Authors: Graham Machin, Charles E Gibson, D L Lowe, David W Allen, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841844

2. A collection and statistical analysis of skin reflectance signatures for inherent variability over the 250 nm to 2500 nm spectral range
Published: 6/4/2014
Authors: Catherine C Cooksey, Benjamin K Tsai, David W Allen
Abstract: The spectral reflectance signature of human skin provides opportunities to advance observations ranging from medical treatment to security applications. In this study 28 volunteers participated in a skin reflectance measurement of the inside of the r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916057

3. A comparison of ITS-90 and a detector-based scale between NPL and NIST using metal-carbon eutectics
Published: 1/1/2004
Authors: David W Allen, Charles E Gibson, D L Lowe, Graham Machin, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104298

4. Calibration Wafer for Temperature Measurement in RTP Tools
Published: 1/1/1998
Authors: K G Kreider, D P DeWitt, Benjamin K Tsai, Francis John Lovas, David W Allen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104583

5. Calibration and Characterization of Trap Detector Filter Radiometers
Published: 11/1/2003
Authors: David W Allen, George P Eppeldauer, Steven W Brown, E A. Early, Bettye C Johnson, Keith R Lykke
Abstract: We describe the development of a mechanically simple, radiometrically stable transfer radiometer designed for both radiance and irradiance measurements. The filter radiometer consists of a six-element Si trap detector, a temperature stabilized filter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841781

6. Chamber Radiation Effects on Calibration of Radiation Thermometers With a Thin-Film Thermocouple Test Wafer
Published: 6/1/1999
Authors: Benjamin K Tsai, D P DeWitt, Francis John Lovas, Kenneth Gruber Kreider, Christopher W Meyer, David W Allen
Abstract: In the semiconductor industry, Rapid Thermal Processing (RTP) utilizes a prescribed temperature-time recipe to silicon wafers undergoing processes such as annealing and oxide film formation. The National Technology Roadmap for Semiconductors (NTRS) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841364

7. Chamber Radiation Effects on Calibration of Radiation Thermometers with a Thin-Film Thermocouple Test Wafer, ed. by J.F. Dubbeldam and M.J. de Groot
Published: 1/1/1999
Authors: Benjamin K Tsai, D P DeWitt, Francis John Lovas, K G Kreider, C W Meyer, David W Allen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104792

8. Characterization and Calibration of a Trap Detector Filter Radiometer
Published: 1/1/2003
Authors: David W Allen, George P Eppeldauer, Steven W Brown, E A. Early, Bettye C Johnson, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100955

9. Comparison of Near-infrared Transmittance and Reflectance Measurements using Dispersive and Fourier Transform Spectrophotometers
Published: 1/1/2002
Authors: David W Allen, E A. Early, Leonard M Hanssen, Simon Grant Kaplan, E Nadal m
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100958

10. Comparison of the NIST radiance temperature scale with the detector-based radiance temperature scale from 1200 K to 2800 K
Published: 1/1/2004
Authors: David W Allen, George P Eppeldauer, Charles E Gibson, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104294



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