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Author: david allen

Displaying records 21 to 30 of 45 records.
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21. The Development and Characterization of an Absolute Pyrometer Calibrated for Radiance Responsivity
Published: 9/1/2003
Authors: David W Allen, Robert D. Saunders, Bettye C Johnson, Charles E Gibson, Howard W Yoon
Abstract: The International Temperature Scale of 1990 (ITS-90), for temperatures above the freezing temperature of silver, is defined with pyrometers which rely upon spectral radiance ratios to one of the silver, gold or copper freezing temperature blackbodies ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841673

22. Characterization and Calibration of a Trap Detector Filter Radiometer
Published: 1/1/2003
Authors: David W Allen, George P Eppeldauer, Steven W Brown, E A. Early, Bettye C Johnson, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100955

23. Temperature Scales using Radiation Thermometers Calibrated using Absolute Irradiance and Radiance Responsivity
Published: 1/1/2003
Authors: Howard W Yoon, David W Allen, Charles E Gibson, Robert D. Saunders, Bettye C Johnson, Steven W Brown, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104811

24. The Development and the Characterization of an Absolute Pyrometer Calibrated for Spectral Radiance Responsivity
Published: 1/1/2003
Authors: David W Allen, Robert D. Saunders, Bettye C Johnson, Charles E Gibson, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104299

25. Wafer Emissivity Effects on Light Pipe Radiometry in RTP Tools
Published: 5/1/2002
Authors: Kenneth Gruber Kreider, David W Allen, D H Chen, D P DeWitt, Christopher W Meyer, Benjamin K Tsai
Abstract: We investigated the effect of different wafer emissivities and the effect of low emissivity films on RTP wafer temperature measurements using light pipe radiation thermometers (LPRTs). These tests were performed in the NIST RTP test bed. We used a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830778

26. Comparison of Near-infrared Transmittance and Reflectance Measurements using Dispersive and Fourier Transform Spectrophotometers
Published: 1/1/2002
Authors: David W Allen, E A. Early, Leonard M Hanssen, Simon Grant Kaplan, E Nadal m
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100958

27. Intercomparison of Transmittance and Reflectance Measurements Using Dispersive and Fourier Transform Spectrophotometers
Published: 1/1/2002
Authors: Simon Grant Kaplan, Leonard M Hanssen, E A. Early, Maria E Nadal, David W Allen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103912

28. Radiometric Calibration of the Scripps Earth Polychromatic Imaging Camera
Published: 1/1/2002
Authors: E A. Early, B C Bush, Steven W Brown, David W Allen, Bettye C Johnson
Abstract: As part of the Triana mission, the Scripps Earth Polychromatic Imaging Camera (Scripps-EPIC) will view the full sunlit side of Earth from the Lagrange-1 point. The National Institute of Standards and Technology and the Scripps Institution of Oceanog ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841757

29. Effects of Wafer Emissivity on Light-Pipe Rediometry in RTP Tools
Published: 9/1/2001
Authors: Kenneth Gruber Kreider, David W Allen, D H Chen, D P DeWitt, Christopher W Meyer, Benjamin K Tsai
Abstract: We investigated the effect of different wafer emissivities and the effect of low emissivity films on rapid thermal processing (RTP) wafer temperature measurements using lightpipe radiation thermometers (LPRTs). These tests were performed in the NIST ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830751

30. Effects of Wafer Emissivity on Lightpipe Radiometry in RTP Tools
Published: 1/1/2001
Authors: K G Kreider, David W Allen, D H Chen, D P DeWitt, C W Meyer, Benjamin K Tsai
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104581



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