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Author: david allen

Displaying records 21 to 30 of 44 records.
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21. Characterization and Calibration of a Trap Detector Filter Radiometer
Published: 1/1/2003
Authors: David W Allen, George P Eppeldauer, Steven W Brown, E A. Early, Bettye C Johnson, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100955

22. Temperature Scales using Radiation Thermometers Calibrated using Absolute Irradiance and Radiance Responsivity
Published: 1/1/2003
Authors: Howard W Yoon, David W Allen, Charles E Gibson, Robert D. Saunders, Bettye C Johnson, Steven W Brown, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104811

23. The Development and the Characterization of an Absolute Pyrometer Calibrated for Spectral Radiance Responsivity
Published: 1/1/2003
Authors: David W Allen, Robert D. Saunders, Bettye C Johnson, Charles E Gibson, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104299

24. Wafer Emissivity Effects on Light Pipe Radiometry in RTP Tools
Published: 5/1/2002
Authors: Kenneth Gruber Kreider, David W Allen, D H Chen, D P DeWitt, Christopher W Meyer, Benjamin K Tsai
Abstract: We investigated the effect of different wafer emissivities and the effect of low emissivity films on RTP wafer temperature measurements using light pipe radiation thermometers (LPRTs). These tests were performed in the NIST RTP test bed. We used a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830778

25. Comparison of Near-infrared Transmittance and Reflectance Measurements using Dispersive and Fourier Transform Spectrophotometers
Published: 1/1/2002
Authors: David W Allen, E A. Early, Leonard M Hanssen, Simon Grant Kaplan, E Nadal m
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100958

26. Intercomparison of Transmittance and Reflectance Measurements Using Dispersive and Fourier Transform Spectrophotometers
Published: 1/1/2002
Authors: Simon Grant Kaplan, Leonard M Hanssen, E A. Early, Maria E Nadal, David W Allen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103912

27. Radiometric Calibration of the Scripps Earth Polychromatic Imaging Camera
Published: 1/1/2002
Authors: E A. Early, B C Bush, Steven W Brown, David W Allen, Bettye C Johnson
Abstract: As part of the Triana mission, the Scripps Earth Polychromatic Imaging Camera (Scripps-EPIC) will view the full sunlit side of Earth from the Lagrange-1 point. The National Institute of Standards and Technology and the Scripps Institution of Oceanog ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841757

28. Effects of Wafer Emissivity on Light-Pipe Rediometry in RTP Tools
Published: 9/1/2001
Authors: Kenneth Gruber Kreider, David W Allen, D H Chen, D P DeWitt, Christopher W Meyer, Benjamin K Tsai
Abstract: We investigated the effect of different wafer emissivities and the effect of low emissivity films on rapid thermal processing (RTP) wafer temperature measurements using lightpipe radiation thermometers (LPRTs). These tests were performed in the NIST ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830751

29. Effects of Wafer Emissivity on Lightpipe Radiometry in RTP Tools
Published: 1/1/2001
Authors: K G Kreider, David W Allen, D H Chen, D P DeWitt, C W Meyer, Benjamin K Tsai
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104581

30. Radiometric Calibration of the Scripps Earth Polychromatic Imaging Camera, ed. by W.L. Barnes
Published: 1/1/2001
Authors: E A. Early, B C Bush, Steven W Brown, David W Allen, Bettye C Johnson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104423