NIST logo

Publications Portal

You searched on:
Author: andrew allen

Displaying records 51 to 60 of 73 records.
Resort by: Date / Title


51. Effective Pinhole-Collimated Ultra-Small-Angle X-Ray Scattering Instrument for Measuring Anisotropic Microstructures
Published: 3/1/2002
Authors: J Ilavsky, Andrew John Allen, Gabrielle Gibbs Long, P Jemain
Abstract: Small-angle scattering is widely used for measuring materials microstructure in the 1 nm to 100 nm size range. Ultra-small-angle x-ray scattering (USAXS), typically achieved through crystal collimation, extends this size range to include features ove ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850553

52. Neutron Methods Link Microstructure to Processing and Performance for Thermal Barrier Coatings
Series: Journal of Research (NIST JRES)
Published: 1/1/2002
Author: Andrew John Allen
Abstract: Although coatings are used in the electric utility and aircraft industries to protect advanced gas turbines from increasingly high operating temperatures, there is presently no single industrial technique that can quantify the component void microstr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850604

53. National Institute of Standards and Technology Synchrotron Radiation Facilities for Materials Science
Series: Journal of Research (NIST JRES)
Published: 12/1/2001
Authors: Gabrielle Gibbs Long, Andrew John Allen, David R Black, H E. Burdette, Daniel A Fischer, R D Spal, Joseph C Woicik
Abstract: Synchrotron Radiation Facilities, supported by the Materials Science and Engineering Laboratory of the National Institute of Standards and Technology, include beam stations at the National Synchrotron Light Source at Brookhaven National Laboratory an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850593

54. Fracture of a Textured Anisotropic Ceramic
Published: 9/1/2001
Authors: M H Zimmerman, D M Baskin, K T Faber, Lin-Sien H Lum, Andrew John Allen, D T Keane
Abstract: The role of crystallographic texture in determining the fracture behavior of a highly anisotropic ceramic, iron titantate, has been examined. By exploiting the anisotropy in its single crystal magnetic susceptibility, crystallographically textured a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850439

55. Microstructural Characterization Studies to Relate the Properties of Thermal Spray Coatings to Feedstock and Spray Conditions
Published: 9/1/2001
Authors: Andrew John Allen, Gabrielle Gibbs Long, H Boukari, J Ilavsky, A Kulkarni, S Sampath, H Herman, A N Goland
Abstract: This paper reports how the microstructural information, obtainable for thick plasma-sprayed ceramic deposits by small-angle scattering can be used to explore the relationships among the feedstock or spray process conditions, the anisotropic void and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850500

56. The Ultra-Small-Angle X-Ray Scattering Instrument on UNICAT at the APS
Published: 10/1/2000
Authors: Gabrielle Gibbs Long, Andrew John Allen, J Ilavsky, P R Jemian, P Zchack
Abstract: A new ultra-small-angle X-ray scattering (USAXS) instrument has been commissioned as part of the UNICAT facility on the 33-ID line at the Advanced Photon Source. The instrument offers continuously-tunable optics for anomalous USAXS, 1000 times the t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850358

57. Microstructural Characterization of Yttria-Stabilized Zirconia Plasma-Sprayed Deposits Using Multiple Small-Angle Neutron Scattering
Published: 5/1/2000
Authors: Andrew John Allen, J Ilavsky, Gabrielle Gibbs Long, Jay S Wallace, C C Berndt, H Herman
Abstract: Density, electron microscopy, elastic modulus, and small-angle neutron scattering studies are used to characterize the microstructures of yttria-stabilized zirconis plasma-sprayed deposits as a function fo both feedstock morphology and annealing. In ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851125

58. Anisotropic Small-Angle Neutron Scattering Studies of Ceramics
Published: 10/1/1999
Authors: Andrew John Allen, Lin-Sien H Lum, K T Faber, M H Zimmerman, Jay S Wallace
Abstract: This paper discusses how small-angle neutron scattering studies can be applied in two variations to obtain a representative characterization of the large, densely-populated, and anisotropic features that occur in the microstructures of various materi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850309

59. Microstructural Changes in YSZ Deposits During Annealing
Published: 3/1/1999
Authors: Andrew John Allen, J Ilavsky, Gabrielle Gibbs Long, Jay S Wallace, C C Berndt, H Herman
Abstract: Various methods have been applied to the microstructural characterization of thermally-sprayed depostis. However, coexisting anisotropic distributions of intra-splat cracks and interlamellar pores, and the broad size range of rounded globular pores, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850245

60. The Role of Feedstock Particle Size on the Microstructural Behavior of Plasma-Sprayed YSZ Deposits During Annealing
Published: 3/1/1999
Authors: H Boukari, Andrew John Allen, Gabrielle Gibbs Long, J Ilavsky, Jay S Wallace, C C Berndt, H Herman
Abstract: We have studied the microstructure of thick plasma-sprayed yttrium-stabilized zirconia deposits fabricated from different initial feedstock particle size (32, 47, 56 and 88) m in a series of mulitiple and Porod small-angle neutron scattering experim ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850247



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series