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      <title>NIST TechBeat</title>
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      <description>A biweekly tip sheet for journalists from the National Institute of Standards and Technology.</description>
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      <pubDate>Tue, 29 Apr 2008 15:32:39 -0400</pubDate>
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         <title>New 3-D Test Method for Biomaterials 'Flat Out' Faster</title>
         <link>http://www.nist.gov/public_affairs/techbeat/tb2008_0429.htm#3d</link>
         <description><![CDATA[<p><a href="http://www.nist.gov/public_affairs/techbeat/tb2008_0429.htm#3d"><img src="http://www.nist.gov/public_affairs/techbeat/rss/tb20080429a.gif?x=100&amp;y=79&amp;" align="left" height="79" width="100" alt="New 3-D Test Method for Biomaterials 'Flat Out' Faster" border="0" /></a>Researchers from NIST and Rutgers University report on a  novel, 3-D screening method for analyzing interactions between cells and new biomaterials could cut initial analysis times by more than half.</p><br clear=all>]]></description>
         <pubDate>Tue, 29 Apr 2008 15:32:39 -0400</pubDate>
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         <title>Making a Good Impression: Nanoimprint Lithography Tests at NIST</title>
         <link>http://www.nist.gov/public_affairs/techbeat/tb2008_0429.htm#nil</link>
         <description><![CDATA[<p><a href="http://www.nist.gov/public_affairs/techbeat/tb2008_0429.htm#nil"><img src="http://www.nist.gov/public_affairs/techbeat/rss/tb20080429b.gif?x=100&amp;y=69&amp;" align="left" height="69" width="100" alt="Making a Good Impression: Nanoimprint Lithography Tests at NIST" border="0" /></a>In what should be good news for integrated circuit manufacturers, recent studies by NIST have helped resolve two important questions about an emerging microcircuit manufacturing technology called nanoimprint lithography.</p><br clear=all>]]></description>
         <pubDate>Tue, 29 Apr 2008 15:32:39 -0400</pubDate>
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         <title>High-Flying Electrons May Provide New Test of Quantum Theory</title>
         <link>http://www.nist.gov/public_affairs/techbeat/tb2008_0429.htm#rydberg</link>
         <description><![CDATA[<p><a href="http://www.nist.gov/public_affairs/techbeat/tb2008_0429.htm#rydberg"><img src="http://www.nist.gov/public_affairs/techbeat/rss/tb20080429c.gif?x=100&amp;y=120&amp;" align="left" height="120" width="100" alt="High-Flying Electrons May Provide New Test of Quantum Theory" border="0" /></a>Researchers at NIST and the Max Planck Institute for Physics in Germany believe they can achieve a significant increase in the accuracy of one of the fundamental constants of nature by boosting an electron to an orbit as far as possible from the atomic nucleus that binds it. The experiment could put the modern theory of the atom to the most stringent tests yet.</p><br clear=all>]]></description>
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         <title>NIST World Metrology Day Forum Focuses on Anti-Doping Advances</title>
         <link>http://www.nist.gov/public_affairs/techbeat/tb2008_0429.htm#metrology</link>
         <description>NIST will celebrate World Metrology Day on May 20 with a look at how the science of measurement plays a critical role in enforcing today's stringent anti-doping rules in sports.</description>
         <pubDate>Tue, 29 Apr 2008 15:32:39 -0400</pubDate>
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         <title>NIST Signs Cooperative Agreement with U-Albany Nano College</title>
         <link>http://www.nist.gov/public_affairs/techbeat/tb2008_0429.htm#mou</link>
         <description>On April 21, NIST signed a Memorandum of Understanding with the College of Nanoscale Science and Engineering of the University at Albany-State University of New York, laying the groundwork for future cooperative efforts to develop science and technology for measuring materials at the nanometer scale as well as creating new standards for nanomanufacturing.</description>
         <pubDate>Tue, 29 Apr 2008 15:32:39 -0400</pubDate>
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         <title>Two New Honors for NIST Physicists</title>
         <link>http://www.nist.gov/public_affairs/techbeat/tb2008_0429.htm#phys-awd</link>
         <description>Recent awards announced for NIST physicists David Wineland and Deborah Jin.</description>
         <pubDate>Tue, 29 Apr 2008 15:32:39 -0400</pubDate>
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         <title>Award Recognizes Work of NIST Information Services Group</title>
         <link>http://www.nist.gov/public_affairs/techbeat/tb2008_0429.htm#award</link>
         <description>NIST's Information Services Division has received the 2007 Silver Maryland Quality Award.</description>
         <pubDate>Tue, 29 Apr 2008 15:32:39 -0400</pubDate>
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         <title>NIST Micro Sensor and Micro Fridge Make Cool Pair</title>
         <link>http://www.nist.gov/public_affairs/techbeat/tb2008_0415.htm#microfridge</link>
         <description><![CDATA[<p><a href="http://www.nist.gov/public_affairs/techbeat/tb2008_0415.htm#microfridge"><img src="http://www.nist.gov/public_affairs/techbeat/rss/tb20080415a.gif?x=100&amp;y=68&amp;" align="left" height="68" width="100" alt="NIST Micro Sensor and Micro Fridge Make Cool Pair" border="0" /></a>Researchers at NIST have combined two of their tiny but powerful inventions on a single microchip, a cryogenic sensor and a microrefrigerator. The combination offers the possibility of cheaper, simpler and faster precision analysis of materials such as semiconductors and stardust.</p><br clear=all>]]></description>
         <pubDate>Tue, 15 Apr 2008 14:44:06 -0400</pubDate>
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         <title>'Nanodrop' Test Tubes Created with a Flip of a Switch</title>
         <link>http://www.nist.gov/public_affairs/techbeat/tb2008_0415.htm#droplet</link>
         <description><![CDATA[<p><a href="http://www.nist.gov/public_affairs/techbeat/tb2008_0415.htm#droplet"><img src="http://www.nist.gov/public_affairs/techbeat/rss/tb20080415b.gif?x=100&amp;y=116&amp;" align="left" height="116" width="100" alt="'Nanodrop' Test Tubes Created with a Flip of a Switch" border="0" /></a>Researchers at NIST have demonstrated a new device that creates nanodroplet 'test tubes' for studying individual proteins under conditions that mimic the crowded confines of a living cell.</p><br clear=all>]]></description>
         <pubDate>Tue, 15 Apr 2008 14:44:06 -0400</pubDate>
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         <title>Prototype Terahertz Imager Promises Biochem Advances</title>
         <link>http://www.nist.gov/public_affairs/techbeat/tb2008_0415.htm#terahertz</link>
         <description><![CDATA[<p><a href="http://www.nist.gov/public_affairs/techbeat/tb2008_0415.htm#terahertz"><img src="http://www.nist.gov/public_affairs/techbeat/rss/tb20080415c.gif?x=100&amp;y=83&amp;" align="left" height="83" width="100" alt="Prototype Terahertz Imager Promises Biochem Advances" border="0" /></a>Researchers at NIST have demonstrated a new imaging system that detects naturally occurring terahertz radiation with unprecedented sensitivity and resolution.</p><br clear=all>]]></description>
         <pubDate>Tue, 15 Apr 2008 14:44:06 -0400</pubDate>
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         <title>NIST, Army Researchers Pave the Way for Anthrax Spore Standards</title>
         <link>http://www.nist.gov/public_affairs/techbeat/tb2008_0415.htm#anthrax</link>
         <description><![CDATA[<p><a href="http://www.nist.gov/public_affairs/techbeat/tb2008_0415.htm#anthrax"><img src="http://www.nist.gov/public_affairs/techbeat/rss/tb20080415d.gif?x=100&amp;y=99&amp;" align="left" height="99" width="100" alt="NIST, Army Researchers Pave the Way for Anthrax Spore Standards" border="0" /></a>Researchers from NIST and the U.S. Army Dugway Proving Ground have developed reliable methods based on DNA analysis to assess the concentration and viability of anthrax spores after prolonged storage. The techniques and data are essential steps in developing a reliable reference standard for anthrax detection and decontamination.</p><br clear=all>]]></description>
         <pubDate>Tue, 15 Apr 2008 14:44:06 -0400</pubDate>
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         <title>Carbon Nanotube Measurements: Latest in NIST 'How-To' Series</title>
         <link>http://www.nist.gov/public_affairs/techbeat/tb2008_0415.htm#nanotube</link>
         <description><![CDATA[<p><a href="http://www.nist.gov/public_affairs/techbeat/tb2008_0415.htm#nanotube"><img src="http://www.nist.gov/public_affairs/techbeat/rss/tb20080415e.gif?x=100&amp;y=88&amp;" align="left" height="88" width="100" alt="Carbon Nanotube Measurements: Latest in NIST 'How-To' Series" border="0" /></a>NIST, in collaboration with NASA, has published detailed guidelines for making essential measurements on samples of single-walled carbon nanotubes. The new guide constitutes the current 'best practices' for characterizing one of the most promising and heavily studied of the new generation of nanoscale materials.</p><br clear=all>]]></description>
         <pubDate>Tue, 15 Apr 2008 14:44:06 -0400</pubDate>
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         <title>Comments Requested on Draft Earthquake Hazards Plan</title>
         <link>http://www.nist.gov/public_affairs/techbeat/tb2008_0415.htm#nehrp</link>
         <description>NIST, the lead agency for the National Earthquake Hazards Reduction Program, has released a draft NEHRP strategic plan for public review and comment. The interagency program works reduce earthquake losses through improved design and construction techniques for new and existing buildings and lifelines, monitoring and early-warning systems, coordinated emergency preparedness plans, and public education.</description>
         <pubDate>Tue, 15 Apr 2008 14:44:06 -0400</pubDate>
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         <title>Comments Requested on Risk Management Publication</title>
         <link>http://www.nist.gov/public_affairs/techbeat/tb2008_0415.htm#risk</link>
         <description>NIST has released the second public draft of NIST Special Publication 800-39, 'Managing Risk from Information Systems: An Organizational Perspective,' for comment.</description>
         <pubDate>Tue, 15 Apr 2008 14:44:06 -0400</pubDate>
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         <title>Technology Grants Program to Offer Webcast Series</title>
         <link>http://www.nist.gov/public_affairs/techbeat/tb2008_0415.htm#tip</link>
         <description>The new Technology Innovation Program (TIP) at NIST is launching a series of webcasts to inform interested parties about the new grants program designed to fund high-risk, high-reward research in areas of critical national need.</description>
         <pubDate>Tue, 15 Apr 2008 14:44:06 -0400</pubDate>
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         <title>Metal Detectives: New Book Details Titanic Investigation</title>
         <link>http://www.nist.gov/public_affairs/techbeat/tb2008_0415.htm#titanic</link>
         <description>In a new book on the sinking of the Titanic, metallurgists Timothy Foecke and colleague Jennifer Hooper McCarty tell the full story of their investigation into how one of the most unassuming of villains, the deck plate rivet, brought about the loss of one of the world's most advanced ocean liners and more than 1,500 passengers and crew.</description>
         <pubDate>Tue, 15 Apr 2008 14:44:06 -0400</pubDate>
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