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Software
for the Semiconductor and Microelectronics Industries
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High
Speed Microelectronics Software: Features MultiCal®--on-wafer
measurement software developed by a NIST Consortium; focuses
on monolithic microwave integrated circuits, packaging, and
interconnects. |
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Integrated
Gate Bipolar Transistors (IGBPT): Modeling software
developed by the Metrology for Simulation and Computer Aided
Design Project |
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Microscopy
and Microanalysis-Related NIST Software: Includes Desktop
Spectrum Analyzer and Monte Carlo Programs. |
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OOF-Object
Oriented Fine Element Analysis of Real Material Microstructures:
Helps materials scientists calculate macroscopic properties
from images of real or simulated microstructures; voted Industry
Week magazine technology of the year (1999). |
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SCATMECH:
Polarized Light Scattering C++ Class Library: This new C++ object
class library was developed to distribute models of polarized
light scattering from surfaces, a subject of interest to makers
of wafer-inspection tools, optics companies, manufacturers of
data storage media and devices, and others. |
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Semiconductor
Electronics Division Software: Lists NIST programs available
for thermal analysis, two- and four-probe resistance calculations,
linewidth metrology, circuit simulation, measurements of electronic
properties, and dopant profiling. |
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Software
for Solder Interconnect Design: This software archive
is maintained by the Solder Interconnect Design Group, which
develops and evaluates methods for modeling the geometries arise
in solder interconnects. |
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Date
created: 7/13/01
Last updated: 7/13/01
Contact: inquiries@nist.gov
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