| Chemical Mapping of Meteorite Samples |
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| NIST Research chemist Sonya Roberson examines the chemical composition of silicon carbide grains with a time-of-flight secondary ion mass spectrometer. A beam of gallium ions is scanned across the surface of the sample knocking charged atoms into a flight chamber. Heavy atoms take longer to fly the length of the chamber than lighter ones, allowing the instrument to construct a chemical map of the surface. NIST researchers used the data from these images in a collaborative project with NASA and university researchers to determine the precise composition of meteorite samples containing silicon carbide. They found that the meteorite contained dust grains that may have come from an ancient supernova, arriving there by a light-years-long journey through interstellar space. |
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Copyright is owned by the photographer. This photo is available without charge for use in materials that describe NIST programs directly. All other uses require permission from the photographer. For further information or to receive a high resolution version of this image contact: Gail Porter, (301) 975-3392. |
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Analytical
Microscopy Group |