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FOR IMMEDIATE RELEASE:
June 7, 2000

Contacts: Michael Newman
(301) 975-3025

MA 2000-12


Media Advisory

Groudbreaking Ceremony to Mark Beginning for NIST Advanced Measurement Laboratory  
 

Event: Reporters are invited to attend as Commerce Secretary William Daley, Senator

Paul Sarbanes, Senator Barbara Mikulski, Congresswoman Connie Morella and Montgomery County Executive Doug Duncan participate in the groundbreaking for what will be the world’s most advanced measurement research laboratory.

Commerce Under Secretary for Technology Cheryl Shavers and NIST Director Ray Kammer also will participate in the ceremonies.
Date: Friday, June 9, 2000 1 p.m. (media registration starts at 12:15 p.m.)
Place: Site of future Advanced Measurement Laboratory
NIST
I-270 and Route 117 West (Clopper Road), Gaithersburg, Md.
(Take Exit 10 off I-270 if coming north and Exit 11 if coming south)
Agenda: Reporters are welcome at all of the following:
  • Brief remarks by Secretary Daley, Senator Sarbanes, Senator Mikulski, Congresswoman Morella, County Executive Duncan and Under Secretary for Technology Shavers
  • Groundbreaking ceremony
  • Tour of NIST laboratory project similar to those planned for the AML
Note: The 47,480-square-meter (511,070-square-foot) AML will allow NIST to provide U.S. industry and science with higher quality reference materials, improved measurements and standards, and more rapidly developed research advances. It will feature stringent controls on particulate matter, temperature, vibration and humidity that are unattainable in current NIST buildings. Such conditions are vital for housing the institute’s most advanced metrology, physics, chemistry, electronics, engineering and materials science research, and will enable NIST to keep pace with rapid developments in semiconductors, industrial robots, computers, pharmaceuticals and emerging technologies requiring molecular and atomic-level precision.

Additional information on the AML, including downloadable graphics, will be available concurrently with the event on the World Wide Web at www.ta.nist.gov.

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