Semiconductors Programs/Projects in PML

Loading 12” wafer containing state-of-the-art CMOS devices into a probe station in preparation of making high-speed measurements of transient changes in device characteristics due to temperature-bias stress. 

Loading 12” wafer containing state-of-the-art CMOS devices into a probe station in preparation of making high-speed measurements of transient changes in device characteristics due to temperature-bias stress.

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301-975-4091 Facsimile

100 Bureau Drive, M/S 8100
Gaithersburg, MD 20899-8110