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NIST Home > PML > Nanotechnology News in PML

Nanotechnology News in PML

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NIST 'Catch and Release' Program Could Improve Nanoparticle Safety Assessment

NIST 'Nanowire' Measurements Could Improve Computer Memory

NIST ‘Hybrid Metrology’ Method Could Improve Computer Chips

NIST Electromechanical Circuit Sets Record Beating Microscopic 'Drum'

NIST Focuses on Testing Standards to Support Lab on a Chip Commercialization

NIST Reference Materials Are 'Gold Standard' for Bio-Nanotech Research

NIST Studies How New Helium Ion Microscope Measures Up

NIST Team Advances in Translating Language of Nanopores

NIST to Cosponsor Conference in France on Nanoelectronics Metrology

NIST's 'Nanotubes on a Chip' May Simplify Optical Power Measurements

NIST’s Microscopic Drum Could Link Electromagnetic, Mechanical Motion at Quantum Level

NIST, UM Program To Support Nanotech Development

NIST-Cornell Team Builds World's First Nanofluidic Device with Complex 3-D Surfaces -- Chamber Separates Nanoparticles Like a 'Coin Sorter'

Nano 'Pin Art': NIST Arrays Are Step Toward Mass Production of Nanowires

Nanoelectronics Conference Will Focus on Semiconductor Industry's Future

« Prev 1 2 3 Next »
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Date created: December 17, 2009 | Last updated: October 5, 2010    Contact: Webmaster