NIST Focuses on Testing Standards to Support Lab on a Chip Commercialization
NIST Reference Materials Are 'Gold Standard' for Bio-Nanotech Research
NIST Studies How New Helium Ion Microscope Measures Up
NIST Team Advances in Translating Language of Nanopores
NIST to Cosponsor Conference in France on Nanoelectronics Metrology
NIST ‘Hybrid Metrology’ Method Could Improve Computer Chips
NIST's 'Nanotubes on a Chip' May Simplify Optical Power Measurements
NIST, UM Program To Support Nanotech Development
NIST-Cornell Team Builds World's First Nanofluidic Device with Complex 3-D Surfaces -- Chamber Separates Nanoparticles Like a 'Coin Sorter'
NIST’s Microscopic Drum Could Link Electromagnetic, Mechanical Motion at Quantum Level
Nano 'Pin Art': NIST Arrays Are Step Toward Mass Production of Nanowires
Nanoelectronics Conference Will Focus on Semiconductor Industry's Future
Nanoscale Dimensioning Is Fast, Cheap with New NIST Optical Technique
New NIST Measurement Tool Is On Target for the Fast-Growing MEMS Industry
New NIST Microscope Measures Nanomagnet Property Vital to 'Spintronics'
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Date created: December 17, 2009 | Last updated: October 5, 2010