‘Electron Trapping’ May Impact Future Microelectronics Measurements
Bright Idea Illuminates LED Standards
Compact High-Temperature Superconducting Cable Wins 'R&D 100' Award
JILA Frequency Comb System Detects Gas Impurities to Aid Semiconductor Manufacturing
Large Mass Calibration
NIST 'Catch and Release' Program Could Improve Nanoparticle Safety Assessment
NIST 'Nanowire' Measurements Could Improve Computer Memory
NIST 'Vision Science Facility' Aims for Lighting Revolution
NIST ‘Hybrid Metrology’ Method Could Improve Computer Chips
NIST Announces $2.6 Million in Funding for Novel Semiconductor Research
NIST Focuses on Testing Standards to Support Lab on a Chip Commercialization
NIST Nanoscale Dimensioning Technique Wins R&D 100 Award
NIST Polishes Method for Creating Tiny Diamond Machines
NIST Studies How New Helium Ion Microscope Measures Up
Nanoelectronics Conference Will Focus on Semiconductor Industry's Future
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