‘Electron Trapping’ May Impact Future Microelectronics Measurements
Bright Idea Illuminates LED Standards
Compact High-Temperature Superconducting Cable Wins 'R&D 100' Award
JILA Frequency Comb System Detects Gas Impurities to Aid Semiconductor Manufacturing
NIST 'Catch and Release' Program Could Improve Nanoparticle Safety Assessment
NIST 'Nanowire' Measurements Could Improve Computer Memory
NIST 'Vision Science Facility' Aims for Lighting Revolution
NIST Announces $2.6 Million in Funding for Novel Semiconductor Research
NIST Nanoscale Dimensioning Technique Wins R&D 100 Award
NIST Polishes Method for Creating Tiny Diamond Machines
NIST Studies How New Helium Ion Microscope Measures Up
Nanoscale Dimensioning Is Fast, Cheap with New NIST Optical Technique
New Report on NIST Tests of Wireless Environment in Auto Factories
Paintable Electronics? NIST Studies Spray-On Manufacturing of Transistors
Robots Big and Small Showcase Their Skills at NIST Alaskan Events
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