Journal and Conference Publications

by Dylan Williams

Journal Publications

•  D.F. Williams, "Comparison of sub-millimeter-wave scattering-parameter calibrations with imperfect electrical ports," IEEE Trans. Terahertz Science and Technol., 2011.
• D.F. Williams, "500 GHz-750 GHz rectangular-waveguide vector-network-analyzer calibrations," IEEE Trans. Terahertz Science and Technol., vol. 1, no. 2, pp. 364-377, 2011.
• A. Mortazawi and D.F. Williams, "Editorial: Message from the outgoing editors," IEEE Trans. Microwave Theory Tech., vol. 58, no. 9, pp. 2317-1318, Sept. 2010.
• A. Lewandowski, D.F. Williams, P.D. Hale, C. M. Wang, and A. Dienstfrey, "Covariance-Matrix-Based Vector-Network-Analyzer Uncertainty Analysis for Time-and Frequency-Domain Measurements," IEEE Trans. Microwave Theory Tech, vol. 58, no. 7, pp. 1877-1886, July 2010.
• D.F. Williams, K.A. Remley, J.M. Gering, G.S. Lyons, C. Lineberry, G.S. Aivazian, "Comparison of large-signal-network-analyzer calibrations," IEEE Microwave and Wireless Components Letters, vol. 20, no. 2, pp. 118-120, Feb. 2010.
• K.A. Remley, D.F. Williams, D. Schreurs, M. Myslinski, "Measurement bandwidth extension using multisine signals: Propagation of error," IEEE Trans. Microwave Theory Tech., vol. 58, no. 2, pp. 458-467, Feb. 2010.
• H.P. Romero, K.A. Remley, D.F. Williams, C.M. Wang, T.X. Brown, "Identifying RF identification cards from measurements of resonance and carrier harmonics," IEEE Trans. Microwave Theory Tech., pp. 1758-1765, July 2010.
• D.F. Williams, A. Lewandowski, D. LeGolvan and R. Ginley, "Electronic vector-network-analyzer verification," IEEE Microwave Magazine, pp. 118-123, Oct. 2009.
• C.M. Wang, P.D. Hale and D.F. Williams, "Uncertainty of timebase corrections," IEEE Trans. Instr. Meas., vol. 58, no. 10, pp 3468-3472, Oct. 2009.
• P.D. Hale, A. Dienstfrey, C.M. Wang, D.F. Williams, A. Lewandowski, D.A. Keenan and T.S. Clement "Traceable waveform calibration With a covariance-Based uncertainty analysis," IEEE Trans. Instr. Meas., vol. 58, no. 10, pp 3554-3568, Oct. 2009.
• D.F. Williams and A. Mortazawi, "The beginnings of this Transactions," IEEE Trans. Microwave Theory Tech., vol. 56, no. 3, pp 565-567, March 2008.
• H.P. Romero, K.A. Remley, D.F. Williams and C.M. Wang, "Electromagnetic measurements for counterfeit detection of radio frequency identification cards," IEEE Trans. Microwave Theory Tech., vol. 57, no. 5, pp. 1383-1387, May 2009.
• H.C. Reader, D.F. Williams, P.D. Hale and T.S. Clement, "Comb-generator characterization," IEEE Trans. Microwave Theory Tech., vol. 56, no. 2, pp. 515-521, Feb. 2008.
• D. F. Williams, T.S. Clement, K. A. Remley, and P. D. Hale, "Systematic error of the nose-to-nose sampling oscilloscope calibration," IEEE Trans. Microwave Theory Tech., vol. 55, no. 9, Sept. 2007, pp. 1951-1963.
• D.F. Williams, P.D. Hale, K.A. Remley, "The sampling oscilloscope as a microwave instrument," IEEE Microwave Magazine, Aug. 2007, pp. 59-68.
• P. D. Hale, C. M. Wang, D. F. Williams, K. A. Remley, and J. Wepman, "Compensation of random and systematic timing errors in sampling oscilloscopes," IEEE Trans. Instrum. Meas., vol. 55, no. 6. pp. 2146-2154, Dec. 2006.
• A. Dienstfrey, P. D. Hale, D. A. Keenan, T. S. Clement, D. F. Williams, " Minimum-phase calibration of sampling oscilloscopes," IEEE Trans. Microwave Theory Tech., pp. 3197 - 3208, Aug. 2006.
• T.S. Clement, P.D. Hale, D.F. Williams, C. M. Wang, A. Dienstfrey, and D.A. Keenan, "Calibration of sampling oscilloscopes with high-speed photodiodes," IEEE Trans. Microwave Theory Tech., pp. 3173 - 3181, Aug. 2006.
• D. F. Williams, H. Khenissi, F. Ndagijimana, K. A. Remley, J. P. Dunsmore, P. D. Hale, C. M. Wang, and T. S. Clement, "Sampling-Oscilloscope Measurement of a Microwave Mixer with Single-Digit Phase Accuracy," IEEE Trans. Microwave Theory Tech. vol. 53, no. 3, pp. 1210-1217, March 2006.
• D. F. Williams, A. Lewandowski, T. S. Clement, C. M. Wang, P. D. Hale, J. M. Morgan, D. Keenan, and A. Dienstfrey, "Covariance-Based Uncertainty Analysis of the NIST Electro-optic Sampling System," IEEE Trans. Microwave Theory Tech., vol. 54, no. 1, pp. 481-491, Jan. 2006.
• J. Verspecht, D.F. Williams, D. Schreurs, K.A. Remley, and M.D. McKinley, "Linearization of large-signal scattering functions," IEEE Trans. Microwave Theory and Tech., vol. 53, no. 4, pp. 1369-1376, April, 2005.
• D.F. Williams, P.D. Hale, T.S. Clement, and J.M. Morgan, "Calibrated 200 GHz Waveform Measurement," IEEE Trans. Microwave Theory and Tech., vol. 53, no. 4, pp. 1384-1389, April, 2005.
• D.F. Williams, "Editorial: How to get your manuscript published in this transactions in six months or less," IEEE Trans. Microwave Theory and Tech., vol. 53, no. 3, pp. 797-798, March 2005.
• D.F. Williams, F. Ndagijimana, K.A. Remley, J. Dunsmore, and S. Hubert, "Scattering-parameter models and representations for microwave mixers," IEEE Trans. Microwave Theory and Tech., vol. 53, no. 1. pp. 314-321, Jan. 2005.
• D.F. Williams, P.D. Hale, T.S. Clement, C.M. Wang, "Uncertainty of the NIST electrooptic sampling system," NIST Tech. Note 1535, Dec. 2004.
• P. Kabos, U. Arz, and D.F. Williams, "Multiport investigation of the coupling of high-impedance probes, IEEE Microwave and Wireless Components Letters, vol. 14, no. 11, pp. 510-512, Nov. 2004.
• K. A. Remley, D. F. Williams, D. F. Schreurs, and J. Wood, "Simplifying and interpreting two-tone measurements," IEEE Trans. Microwave Theory and Tech., vol. 52, no. 11, pp. 2576-2584, Nov. 2004.
• D.F. Williams, C.M. Wang, and U. Arz, "An optimal vector-network-analyzer calibration algorithm," IEEE Trans. Microwave Theory and Tech., vol. 51, no. 12, pp. 2391-2401, Dec. 2003.  
• D. F. Williams, B.K. Alpert, U. Arz, D.K. Walker, and H. Grabinski, "Causal characteristic impedance of planar transmission lines," IEEE Transactions on Advanced Packaging, vol. 26, no. 2,pp. 165-171, May, 2003.
• P.D. Hale and D.F. Williams, "Calibrated measurement of optoelectronic frequency response," IEEE Trans. Microwave Theory Tech., vol. 51, no. 4, pp. 1422-1429, April 2003. (Winner of the NIST Electronics and Electrical Engineering Laboratory 2003 Outstanding Authorship Award.)
• P. Kabos, H.C. Reader, U. Arz, and D.F. Williams, "Calibrated waveform measurement with high-impedance probes," IEEE Trans. Microwave Theory and Tech., vol. 51, no. 2, pp. 530-535, February 2003.
• M.D. Janezic, D.F. Williams, V. Blaschke, A. Karamcheti, and C.S. Chang, "Permittivity characterization of low-k thin films from transmission-line measurements," IEEE Trans. Microwave Theory and Tech., vol. 51, no. 1, pp. 132-136, January 2003.  
• D.F. Williams, U. Arz, H. Grabinski, "Characteristic-Impedance Measurement Error on Lossy Substrates," IEEE Microwave and Wireless Components Letters, vol. 11, no. 7, pp. 299-301, July 2001.
• P.D. Hale, T.S. Clement, D.F. Williams, E. Balta, and N.D. Taneja, "Measuring the Frequency Response of Gigabit Chip Photodiodes," J. Lightwave Technol., vol. 19, no. 9, pp. 1333-1339, September 2001.
• D. F. Williams and K.A. Remley, "Analytic sampling-circuit model," IEEE Transactions on Microwave Theory and Techniques, vol. 49, no. 6, pp. 1013-1019, June 2001.
• K.A. Remley, D. F. Williams, D.C. DeGroot, J. Verspecht, and J. Kerley, "Effects of nonlinear diode junction capacitance on the nose-to-nose calibration," IEEE Microwave and Wireless Components Letters, vol. 11, no. 5, pp. 196-198, May 2001.  
• D. F. Williams and B.K. Alpert, "Causality and waveguide circuit theory," IEEE Transactions on Microwave Theory and Techniques, vol. 49, no. 4, pp. 615-623, April 2001.
• D.K. Walker, D.F. Williams, A. Padilla, U. Arz, and H. Grabinski, "Four-Port Microwave Measurement System Speeds On-Wafer Calibration and Test," Microwave Journal, pp. 144-150, March 2001.
• P.D. Hale, T.S. Clement, and D.F. Williams, "Measuring frequency response of high-speed optical receivers requires microwave measurements," SPIE's OE Magazine, p. 56, March 2001.
• U. Arz, D.F. Williams, D.K. Walker, and H. Grabinski, "Asymmetric Coupled CMOS Lines: An Experimental Study," IEEE Transactions on Microwave Theory and Techniques, vol. 48, no. 12, pp. 2409-2414, Dec. 2000.
• D. F. Williams and B.K. Alpert, "Characteristic impedance, power, and causality," IEEE Microwave and Guided Wave Lett., vol. 9, no. 5, pp. 181-182, May 1999.
• D. F. Williams, "Metal-insulator-silicon transmission lines," IEEE Transactions on Microwave Theory and Techniques, vol. 47, no. 2, pp. 176-181, Feb. 1999.
• D. F. Williams, J. E. Rogers, and C. L. Holloway, "Multiconductor transmission line characterization: representations, approximations, and accuracy," IEEE Transactions on Microwave Theory and Techniques, vol. 47, no. 4, pp. 403-409, April 1999.  
• D. F. Williams, L. A. Hayden, and R. B. Marks, "A Complete Multimode Equivalent-Circuit Theory for Electrical Design," NIST Journal of Research, vol. 102, no. 4, pp. 405-423, July-Aug. 1997.  
• D. F. Williams, J.-M. Belquin, A. Spisser, A. Cappy, and D. Dambrine, "Characterization of coplanar waveguide on epitaxial layers," Electronics Letters, vol. 33, no. 17, pp. 1468-1469, Aug. 1997.
• D. F. Williams, "Multiconductor Transmission Line Characterization," IEEE Transactions on Components, Packaging, and Manufacturing Technology-Part B, vol. 20, no. 2, pp. 129-132, May 1997.
• D. Walker and D.F. Williams, "Compensation for Geometrical Variation in Coplanar Waveguide Probe-tip Calibration," IEEE Microwave and Guided Wave Letters, vol. 7, no. 4, pp. 97-99, April 1997.
• D. F. Williams and F. Olyslager, "Modal Cross Power in Quasi-TEM Transmission Lines", IEEE Microwave and Guided Wave Letters, vol. 6, no. 11, pp. 413-415, November 1996.
• D. F. Williams, "Thermal Noise in Lossy Waveguides," IEEE Transactions on Microwave Theory and Techniques, vol. 44, no. 7, July 1996.
• R. B. Marks and D. F. Williams, "Electrical characterization methods for high-speed interconnections," International Journal of Microelectronics and Electronic Packaging, vol. 18, pp. 207-216, 1995.  
• J. A. Jargon, R. B. Marks, and D. F. Williams, "Coaxial Line-Reflect-Match Calibration," Proc. of the Asia-Pacific Microwave Conf., Oct. 1995.
• R. B. Marks and D. F. Williams, "Comments on 'Conversions Between S, Z, Y, h, ABCD, and T Parameters which are Valid for Complex Source and Load Impedances," IEEE Transactions on Microwave Theory and Techniques, vol. 43, no. 4, pp. 914-915, April 1995.
• D. F. Williams and R. B. Marks, "LRM Probe-Tip Calibrations using Nonideal Standards," IEEE Microwave Theory and Techniques, vol. 43, no. 2, pp. 466-469, Feb. 1995.
• D. F. Williams and R. B. Marks, "On-Wafer Impedance Measurement on Lossy Substrates," IEEE Microwave and Guided Wave Letters, vol. 4, no. 6, pp. 175-176, June 1994.  
• D. F. Williams and R. B. Marks, "Accurate Transmission Line Characterization," IEEE Microwave and Guided Wave Letters, vol. 3, no. 8, pp. 247-249, Aug. 1993.
• D. F. Williams and R. B. Marks, "Reciprocity Relations in Waveguide Junctions," IEEE Transactions on Microwave Theory and Techniques, vol. 41, no. 7, pp. 1105-1110, July 1993.  
• D. F. Williams, R. B. Marks, D. K. Walker, and F. R. Clague, "Wafer Probe Transducer Efficiency," IEEE Microwave and Guided Wave Letters, vol. 2, no. 10, pp. 388-390, Oct. 1992.  
• R. B. Marks and D. F. Williams, "A General Waveguide Circuit Theory," Journal of Research of the National Institute of Standards and Technology, vol. 97, no. 5, pp. 533-562, Sep.-Oct. 1992. (Best paper award, Electronics and Electrical Engineering Laboratory)
• R. B. Marks and D. F. Williams, "Accurate Experimental Characterization of Interconnects: A Discussion of 'Experimental Electrical Characterization of Interconnects and Discontinuities in High-Speed Digital Systems'," IEEE Transactions on Components, Hybrids, and Manufacturing Technology, vol. 15, no. 8, pp. 601-602, Aug. 1992.
• D. F. Williams and R. B. Marks, "Comments on 'Characterization of resistive transmission lines by short pulse propagation'," IEEE Microwave and Guided Wave Letters, vol. 2, no. 8, pp. 346, Aug. 1992.
• D. F. Williams and R. B. Marks, "Transmission Line Capacitance Measurement," IEEE Microwave and Guided Wave Letters, vol. 1, no. 9, pp. 243-245, Sept. 1991.
• R. B. Marks and D. F. Williams, "Characteristic Impedance Determination using Propagation Constant Measurement," IEEE Microwave and Guided Wave Letters, vol. 1, no. 6, pp. 141-143, June 1991.
• D. F. Williams, R. B. Marks, and K. R. Phillips, "Translate LRL and LRM calibrations," Microwaves and RF, vo. 30, pp. 78-84, Feb. 1991.
• D. F. Williams, "De-embedding and unterminating microwave test fixtures with nonlinear least squares," IEEE Trans. Microwave Theory and Techniques, vol. 38, no. 6, pp. 787-791, June 1990.
• D. F. Williams, "Damping of the Resonant Modes of a Rectangular Metal Package," IEEE Trans. Microwave Theory and Techniques, vol. 37, no. 1, pp. 253-256, Jan. 1989.
• D. F. Williams and T. H. Miers, "De-embedding Coplanar Probes with Planar Distributed Standards," IEEE Trans. Microwave Theory and Techniques 36, pp. 1876-1880, Dec. 1988.
• D. F. Williams and T. H. Miers, "A Coplanar Probe to Microstrip Transition," IEEE Trans. Microwave Theory and Techniques 36, pp. 1219-1223, July 1988.
• D. F. Williams and S. E. Schwarz, "Adjustable Tuning for Planar Millimeter-Wave Circuits," International Journal of Infrared and Millimeter Waves, Dec. 1986.
• D. F. Williams and S. E. Schwarz, "A Planar Subharmonically-Pumped 71 GHz Receiver with Integral Feed Antenna," International Journal of Infrared and Millimeter Waves, Feb. 1986.
• D. F. Williams and S. E. Schwarz, "Design and Performance of Coplanar Waveguide Bandpass Filters," IEEE Trans. Microwave Theory and Techniques, vol. 31, pp. 558-566, July 1983.
• D. F. Williams and F. Y. Cho, "Temperature Variation of SAW Power Flow Angle," Electronics Letters, pp. 164-165, February 1981.

Conference Publications

• D.F. Williams, "Rectangular-waveguide vector-network-analyzer calibrations with imperfect test ports," 76th ARFTG Microwave Measurement Symposium, pp. 1-8, Dec. 2010. (winner Best Paper Award)

• N.M. Ridler, R.A. Ginley, J.L. Hesler, A.R. Kerr, R.D. Pollard and D.F. Williams, "Towards standardized waveguide sizes and interfaces for submillimeter wavelengths," 21st Int. Symp. Space Therahertz Technol., Oxford, 23-25 March 2010.

• A. Lewandowski, W. Waitr, D. Williams, "Multi-frequency approach to vector-network-analyzer scattering-parameter measurements," 2010 European Microwave Conference, pp. 260-263, 28-30 Sept. 2010.

• D.F. Williams, A. Lewandowski, D. LeGolvan, R. Ginley, C.M. Wang and J. Splett, "Use of Electronic Calibration Units for Vector-Network-Analyzer Verification," 74th ARFTG Microwave Measurement Conference, Boulder, Colorado, Dec. 1-4, 2009.

• A. Lewandowski and D.F. Williams, "Stochastic modeling of coaxial-connector repeatability errors," 74th ARFTG Microwave Measurement Conference, Boulder, Colorado, Dec. 1-4, 2009.

• P.D. Hale, D.F. Williams, A. Dienstfrey, C.M. Wang, A. Lewandowski, T.S. Clement, D. Keenan, "Complete waveform characterization at NIST," Precision Electromagnetic Measurements Digest, 2008, pp. 680-681, 2008.

• A. Lewandowski and D.F. Williams, "Characterization and modeling of random vector network analyzer measurement errors," 17th International Conf. on Microwaves, Radar and Wireless Communications, 19-21 May, 2008.

• D.F. Williams, T.S. Clement, P.D. Hale, and A. Dienstfrey, "Terminology for high-speed sampling-oscilloscope calibration," ARFTG Conf. Dig., pp. 9-14, Dec. 2006. (Best Paper Award)

• D.F. Williams, C.M. Wang, U. Arz, "In-Phase/Quadrature Covariance-Matrix Representation of the Uncertainty of Vectors and Complex Numbers," ARFTG Conf. Dig., Dec. 2006.

• D.F. Williams, C.M. Wang, and U. Arz, "An optimal multiline TRL calibration algorithm," 2003 Int. Microwave Symp. Dig., pp. 1819-1822, June 10-12, 2003.

• K.A. Remley, D.F. Williams, Dominique Schreurs, Giovanni Loglio, and Alessandro Cidronali, "Phase detrending for measured multisine signals," 61st ARFTG Microwave Measurement Conference Digest, pp. 73-83, June 13, 2003. (Best Paper Award)
• K.A. Remley and D.F. Williams, "Sampling oscilloscope models and calibrations," 2003 Int. Microwave Symp. Dig., pp. 1507-1510, June 10-12, 2003. (invited)
• A. Louh, U. Arz, H. Grabinski, D.F. Williams, D.K. Walker, and A.Weisshaar, "Broadband impedance parameters of assymetric coupled CMOS interconnects: new closed-form expressions and comparison with measurements," 7th IEEE Workshop on Signal Propagation on Interconnects., Siena, Italy, May 11-14, 2003.  
• U. Arz, P. Kabos, and D.F. Williams, "Measureing the invasiveness of high-impedance probes," 7th IEEE Workshop on Signal Propagation on Interconnects., Siena, Italy, May 11-14, 2003.  
• T.S. Clement, P.D. Hale, D.F. Williams, and J.M. Morgan, "Calibrating photoreciever response to 110 GHz," 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society Confrence Digest, Nov. 10-14, 2002, Glasglow, Scotland.
• U. Arz, D.F. Williams, and H. Grabinski, "Characteristic impedance measurement of planar transmission lines," URSI-GA 2002, Aug. 17-24, 2002.
• U. Arz and D.F. Williams, "Applications of calibration comparison in on-wafer measurement," URSI-GA 2002, Aug. 17-24, 2002.
• U. Arz, H.C. Reader, P. Kabos, D.F. Williams, "Wideband Frequency-Domain Characterization of High-Impedance Probes," 58th ARFTG Conference Digest, pp. 117-124, Nov. 29-30, 2001.
• D.F. Williams, P.D. Hale, T.S. Clement, and J.M. Morgan, "Calibrating electro-optic sampling systems," Int. Microwave Symposium Digest, Phoenix, AZ, pp. 1527-1530, May 20-25, 2001.
• P.D. Hale, T.S. Clement, and D.F. Williams, "Frequency response metrology for high-speed optical receivers, "Optical Fiber Conference (OFC'01) Digest, Anaheim, CA, pp. WQ1-1-3, March 17-22, 2001.
• D.F. Williams, P.D. Hale, T.S. Clement, and J.M. Morgan, "Mismatch corrections for electro-optic sampling systems," 56th ARFTG Conference Digest, pp. 141-145, Nov. 30-Dec. 1, 2000. (Best Poster Award)
• U. Arz, D.F. Williams, D.K. Walker, H. Grabinski, "High-Frequency Behavior of Coupled CMOS Interconnects Built in Different Metallization Layers,"56th ARFTG Conference Digest, pp. 32-37, Nov. 30-Dec. 1, 2000.
• D.K. Walker, R.F. Kaiser, D.F. Williams, and K.J. Coakley, "Lumped-element models for high-frequency calibration,"56th ARFTG Conference Digest, pp. 89-92, Nov. 30-Dec. 1, 2000.
• D.F. Williams, A.C. Byers, V.C. Tyree, D.K. Walker, J.J. Ou, X. Jin, M. Piket-May, and C. Hu, "Contact-pad design for high-frequency silicon measurements," 9^th Topical Conference on Electrical Performance of Electronic Packaging, pp. 131-134, Oct. 23-25, 2000.
• U. Arz, D.F. Williams, D.K. Walker, and H. Grabinski, "Accurate electrical measurement of coupled lines on lossy silicon," 9^th Topical Conference on Electrical Performance of Electronic Packaging, pp. 181-184, Oct. 23-25, 2000.
• K.A. Remley, D.F. Williams, and D.C. DeGroot, "Realistic sampling-circuit model for a nose-to-nose simulation,"2000 International Microwave Symposium Digest, pp. 1473-1476, June 11-16, 2000.
• D.F. Williams and R.C. Wittmann, "Computation of causal characteristic impedances,"2000 International Microwave Symposium Digest, pp. 1813-1816, June 11-16, 2000.
• U. Arz, D.F. Williams, D.K. Walker, J.E. Rogers, M. Rudack, D. Treytnar, and H. Grabinski, "Characterization of Asymmetric Coupled CMOS Lines,"2000 International Microwave Symposium Digest, pp. 609-702, June 11-16, 2000.
• W. Waitr, D.K. Walker, and D.F. Williams, "Coplanar-waveguide-to-microstrip-transition model,"2000 International Microwave Symposium Digest, pp. 1797-1800, June 11-16, 2000.
• D.F. Williams, K.A. Remley, and D.C. DeGroot, "Nose-to-Nose Response of a 20-GHz Sampling Circuit," 54^thARFTG Conference Digest, Dec. 1-2, 1999.
• R.F. Kaiser and D.F. Williams, "Sources of Error in Coplanar-Waveguide TRL Calibrations," 54^th ARFTG Conference Digest, Dec. 1-2, 1999.
• U. Arz, H. Grabinski, and D.F. Williams, "Influence of the Substrate Resistivity on the Broadband Propagation Characteristics of Silicon Transmission Lines," 54^th ARFTG Conference Digest, Dec. 1-2, 1999.
• D.F. Williams and B.K. Alpert, "Causality and characteristic impedance," 54^th ARFTG Conference Digest, Dec. 1-2, 1999.
• D.F. Williams and B.K. Alpert, "Characteristic impedance of microstrip on silicon," 8^th Topical Conference on Electrical Performance of Electronic Packaging, pp. 181-184, Oct. 25-27, 1999.
• H. Grabinski, U. Arz, D. F. Williams, "Accurate Experimental Characterization of On-Chip Interconnects," 1999 URSI General Assembly, Toronto, Canada, August 13-21, 1999.
• D.F. Williams and B.K. Alpert, "A causal microwave circuit theory and its implications," 1999 URSI General Assembly, Toronto, Canada, August 13-21, 1999.
• D.F. Williams and D. C. DeGroot, "Electrical Measurements for Electronic Interconnections at NIST," 1999 URSI General Assembly, Toronto, Canada, August 13-21, 1999.
• D.F. Williams and B.K. Alpert, "Characteristic impedance, causality, and microwave circuit theory," IEEE Workshop on Signal Propagation on Interconnects, Titisee-Neustadt, Germany, May 19-21, 1999.
• D.F. Williams and D.K. Walker, "0.1-10 GHz CMOS Voltage Standard," IEEE Workshop on Signal Propagation on Interconnects, Titisee-Neustadt, Germany, May 19-21, 1999.
• D. F. Williams, "High frequency limitations of the JEDEC 123 guideline," 7^th Topical Meeting on Electrical Performance of Electronic Packaging, pp. 54-57, Oct. 26-28, 1998.  
• D.C. DeGroot and D. F. Williams, "National Institute of Standards and Technology programs in electrical measurements for electronic interconnections," 7^th Topical Meeting on Electrical Performance of Electronic Packaging, pp. 45-49, Oct. 26-28, 1998.
• D. F. Williams and D. K. Walker, "Lumped-element impedance standards," 51^st ARFTG Conference Digest, pp. 91- 93, June 12, 1998.
• D. F. Williams and D. K. Walker, "In-line multiport calibration," 51^st ARFTG Conference Digest, pp. 88-90, June 12, 1998.
• D. F. Williams, "Metal-insulator-silicon transmission line model," 51^st ARFTG Conference Digest, pp. 65-71, June 12, 1998.
• D. K. Walker and D. F. Williams, "Comparison of SOLR and TRL calibrations," 51^st ARFTG Conference Digest, pp. 83-87, June 12, 1998.
• D. F. Williams, U. Arz, and H. Grabinski "Accurate Characteristic Impedance Measurement on Silicon," 1998 IEEE MTT-S Symposium Digest, pp. 1917-1920, June 9-11, 1998.
• D. F. Williams and D. Walker, "Series-Resistor Calibration," 50^th ARFTG Conference Digest, pp. 131-137, Dec. 4-5, 1997.
• D. F. Williams, M. D. Janezic, A. Ralston, S. List, "Quasi-TEM model for coplanar waveguide on silicon," 1997 EPEP Conference Digest, pp. 225-228, Oct. 27-29, 1997.
• D. F. Williams, "Embedded multiconductor transmission line characterization," IEEE International Microwave Symposium Digest, vol. 3, pp. 1773-1776, June 10-12, 1997.
• M. D. Janezic and D. F. Williams, "Permittivity Characterization from Transmission-Line Measurement," IEEE International Microwave Symposium Digest, vol. 3, pp. 1343-1345, June 10-12, 1997.
• D. F. Williams, "Calibration in Multiconductor Transmission Lines," 48th ARFTG Conference Digest (Orlando, FL), pp. 46-53, Dec. 4-6, 1996.
• D. F. Williams, J. M. Belquin, G. Dambrine, and R. Fenton, "On-Wafer Measurement at Millimeter Wave Frequencies", 1996 IEEE MTT-S Symposium Digest, vol. 3, pp. 1683-1686, June 17-21, 1996.  
• D. F. Williams and J. B. Schappacher, "Line-Reflect-Match Calibrations with Nonideal Microstrip Standards," 46th ARFTG Conference Digest, pp. 35-38, Nov. 30-Dec. 1, 1995.
• J. A. Jargon, R. B. Marks, and D. F. Williams, "Coaxial Line-Reflect-Match Calibration," Proc. of the Asia-Pacific Microwave Conf., Oct. 1995.
• D. F. Williams and R. B. Marks, "Compensation for Substrate Permittivity in Probe-Tip Calibration," 44th ARFTG Conference Digest, pp. 20-30, Dec. 1994.
• R. B. Marks, L. A. Hayden, J. A. Jargon, F. Williams, "Time Domain Network Analysis Using the Multiline TRL Calibration," 44th ARFTG Conference Digest, pp. 47-55, Dec. 1994.
• R. B. Marks and D. F. Williams, "Accurate electrical characterization of high-speed interconnections," Proceedings, 1994 International Symposium on Microelectronics, pp. 96-101, Nov. 1994. (Best Paper of Session Award)
• R. B. Marks and D. F. Williams, "Microwave Characterization of Printed Circuit Transmission Lines," NEPCON East, pp. 520-527, June 1994.
• R. B. Marks and D. F. Williams, "Verification of Commercial Probe-Tip Calibrations," 42nd ARFTG Conference Digest, pp. 37-44, Dec. 1993.
• D. F. Williams and R. B. Marks, "LRM Probe-Tip Calibrations with Imperfect Resistors and Lossy Lines," 42nd ARFTG Conference Digest, pp. 32-36, Dec. 1993. (Best Paper Award)
• R. B. Marks and D. F. Williams, "Interconnection Transmission Line Parameter Characterization," 40th ARFTG Conference Digest, pp. 88-95, Dec. 1992.
• D. F. Williams and R. B. Marks, "Calibrating On-Wafer Probes to the Probe Tips," 40th ARFTG Conference Digest, pp. 136-143, Dec. 1992.
• D. K. Walker, D. F. Williams, and J. M. Morgan, "Planar Resistors for Probe Station Calibration," 40th ARFTG Conference Digest, pp. 1-9, Dec. 1992.
• D. F. Williams and R. B. Marks, "Verification of scattering parameter measurements," Conference on Precision Electromagnetic Measurements, pp. 371-372, June 1992.
• R. B. Marks and D. F. Williams, "Traceability for on-wafer MMIC measurements," Conference on Precision Electromagnetic Measurements, pp. 371-372, June 1992.
• D. F. Williams and R. B. Marks, "Frequency-Dependent Transmission Line Parameters'," IEEE Topical Meeting on Electrical Performance of Electronic Packaging, pp. 125-127, Apr. 1992.
• E. J. Vanzura, C. M. Weil, and D. F. Williams, "Complex permittivity measurements of gallium arsenide using a high-precision resonant cavity," Proceeding of the 1992 Conference on Precision Electromagnetic Measurements, pp. 103-104, 1992.  
• D. F. Williams, R. B. Marks, and A. Davidson, "Comparison of On-Wafer Calibrations," 38th ARFTG Conference Digest, pp. 68-81, Dec. 1991.
• R. B. Marks and D. F. Williams, "Reciprocity relations for on-wafer power measurement," 38th ARFTG Conference Digest, pp. 82-89, Dec. 1991.
• R. Furlow, R. Y. Shimoda, D. F. Williams, R. B. Marks, and K. C. Gupta, "Benchmark for the Validation of Microwave CAD Software," 38th ARFTG Conference Digest, pp. 97-106, Dec. 1991.
• T. H. Miers, A. Cangellaris, D. Williams, and R. Marks, "Anomalies Observed in Wafer Level Microwave Testing," 1991 International Microwave Symposium Digest, pp. 1121-1124, June 1991.
• D. F. Williams and R. B. Marks, "The Interpretation and Use of S-Parameters in Lossy Lines," 36th ARFTG Conference Digest, pp. 84-90, Nov. 1990. (Best Paper Award)
• D. F. Williams, R. B. Marks, K. Phillips, and T. Miers "Progress toward MMIC on-wafer standards," 36th ARFTG Conference Digest, pp. 73-83, Nov. 1990.
• K. Phillips and D. Williams, "MMIC Package Characterization with Active Loads," 36th ARFTG Conference Digest, pp. 64-72, Nov. 1990.
• D. F. Williams and F. Y. Cho, "Power Flow Angle and Pressure Dependence of SAW Propagation Characteristics in Quartz," Proceedings of the 1981 IEEE Ultrasonics Symposium.
• D. F. Williams and F. Y. Cho, "Numerical Analysis of Doubly Rotated Cuts of Quartz," Proceedings of the 1979 IEEE Ultrasonics Symposium.