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International Organization for Standardization (ISO) TC172/SC5 Optics and Photonics/Microscopes and Endoscopes

Purpose:

This is the annual meeting of international delegations of experts for writing international standards for microscopes and endoscopes

Agenda:

Agenda and related meeting documents are available on the ISO Server.

Attendance at the meeting is by invitation only through national delegations to ISO TC172/SC5.

Details:

Start Date: Tuesday, September 20, 2011
End Date: Friday, September 23, 2011
Format: Conference

Registration:

Click here for Online Registration

Registration closes Tuesday, September 13, 2011.

On-Site registration is not possible for any conference held on NIST campus. All attendees must be pre-registered. Photo identification must be presented at the main gate Visitors Center to be admitted to the workshop. Foreign nationals are required to bring their passports for identification.

Registration Contact:

Janet Wenner
Nikon Instruments Inc.
1300 Walt Whitman Rd.
Melville, NY 11747
PH: 631-547-8535 
FAX: 631-547-8775
jwenner@nikon.net

Technical Contact:

Lee C. Shuett, head of delegation, USA TAG for ISO TC172/SC5
Nikon Instruments Inc. 
1300 Walt Whitman Rd. 
Melville, NY 11747 
PH: 631-547-8546 
FAX: 631-547-8775                                       lshuett@nikon.net