Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
My research interests focus on applications of non-imaging optical measurements, including scattering, reflectance/transmittance, and ellipsometry, to the characterization and metrology of materials. I am currently project lead on STARR II, a new NIST facility for ultraviolet to shortwave infrared spectral- and angle-resolved reflectance and scattering measurements.
Sensor Science Division
Laser Applications Group
2005-present, NIST, Gaithersburg, MD
2001-2004, Optinel Systems, Inc., Elkridge, MD
1995-2000, US Naval Research Laboratory, Washington, DC
1991-1995, NIST, Boulder, CO
Ph.D. Physics, University of Colorado, Boulder, CO
S.B. Physics, Massachusetts Institute of Technology, Boston, MA