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Heather J. Patrick
My research interests focus on applications of non-imaging optical measurements, including scattering, reflectance/transmittance, and ellipsometry, to the characterization and metrology of materials. I am currently project lead on STARR II, a new NIST facility for ultraviolet to shortwave infrared spectral- and angle-resolved reflectance and scattering measurements. Research projects:STARR II – gonioreflectometer for enhanced UV-SWIR reflectance calibrations Optical scattering from surfaces Selected Publications
Latest Publications
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 Position: Physicist
Sensor Science Division Laser Applications Group Employment History:2005-present, NIST, Gaithersburg, MD 2001-2004, Optinel Systems, Inc., Elkridge, MD 1995-2000, US Naval Research Laboratory, Washington, DC 1991-1995, NIST, Boulder, CO Education:Ph.D. Physics, University of Colorado, Boulder, CO S.B. Physics, Massachusetts Institute of Technology, Boston, MA Contact
Phone: 301-975-4684 |