Dr. Nguyen is a physicist in the Nanoelectronics Group in the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST). He joined the Semiconductor Electronics Division at NIST as a National Research Postdoctoral Fellow in 1990 and became a permanent research staff in 1992. Dr. Nguyen was born in Vietnam in 1958 and came to US in 1980. He received his B. S degree from the University of Wisconsin – River Falls, and his Ph. D. from the Pennsylvania State University, in Physics in 1984 and 1989, respectively. His research interest involves the investigation of optical properties of semiconductor and dielectric thin films that are technologically important. He has a great experience in optical metrology instrumentation and modeling.
Semiconductor & Dimensional Metrology Division