Dr. Pernstich is a guest researcher and principle investigator in the CMOS Reliability and Advanced Devices Group (683.06) in the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST). He graduated in Electrical Engineering from Graz University of Technology and received his PhD degree from the Laboratory of Solid State Physics at ETH Zurich and was a post doctoral researcher at the Materials Department of ETH Zurich. His research focuses on developing metrology of thermophysical properties of thin film semiconductors.
Semiconductor & Dimensional Metrology Division
CMOS Reliability and Advanced Devices Group