The CMOS Reliability and Advanced Devices Group develops measurement science to accelerate the commercialization and manufacture of high performance and reliable electron devices for the electronics industry by developing new characterization techniques, physics-based models, and data analysis methods. The Group develops the advanced metrology tools to enable quantitative and mechanistic assessment of reliability issues in emerging electronic devices. Another key thrust is to develop new measurements, physical models, and data analysis techniques to accelerate the development and commercialization of nanoelectronic device-based medical technology for life sciences and personalized health care.
Power Device and Thermal Metrology—The Power Devices and Thermal Metrology Project develops electrical and thermal measurement methods and equipment to support development and application of advanced power semiconductor devices and …
Metrology for Advanced Bioelectronics—We are developing electronic chip-based technology for DNA and protein analysis for industry. This research will help revolutionize health care, emergency rooms and personalized medicine.
CMOS Device and Reliability —The CMOS Device and Reliability Project will develop advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide Semiconductor) devices with sufficient reliability. This …
Back-End-of-Line Reliability Metrology Development—The Back-End-of-Line (BEOL) Reliability Metrology Development project aims to develop the metrology to enable quantitative and mechanistic assessment of performance limiting reliability issues in …
High-speed, amplified probe tip used to collect reliability data in the NIST Advanced Device Characterization and Reliability laboratory.
Physical Measurement Laboratory (PML)