CMOS Reliability and Advanced Devices Group
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Welcome
The CMOS Reliability and Advanced Devices Group performs research and development for the metrology, test structures, and reference materials required for CMOS and Beyond devices and their constituent materials. THE GROUP
Programs/Projects
Electronics-Based Bio-Sensing, Single Molecule Metrology, and Membrane Protein Structure-Function—Nearly 14 years ago, we demonstrated that a single nanopore could be used to electrically detect individual molecules of single-stranded RNA and DNA (PNAS, 1996). Each polynucleotide that is driven … Nanoelectronic Device Metrology—The Nanoelectronic Device Metrology Project will develop the required measurement infrastructure and scientific knowledge-base to address technology barriers and enable the successful development … Thin Film Electronics—The Thin Film Electronics Project is developing measurements on active thin film electronic devices like transistors which currently enable user interfaces (sensors, touch pads, displays) in large … CMOS Device and Reliability —The CMOS Device and Reliability Project will develop advanced metrology tools to enable high performance CMOS devices with sufficient reliability. CMOS (Complementary Metal Oxide Semiconductor) … |
Contact
Physical Measurement Laboratory (PML) |