Tam H. Duong

Mr. Duong is an electrical engineer in the Microelectronics Device Integration Group (683.05) in the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST). Mr. Duong came to the United States from Vietnam in 1996 and became a U.S. Citizen in 2001. His research interests include (1) characterization, modeling, and simulation of power devices and (2) modeling, simulation, and design of power electronics circuits.