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Tam H. Duong

Mr. Duong is an electrical engineer in the Microelectronics Device Integration Group (683.05) in the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST). Mr. Duong came to the United States from Vietnam in 1996 and became a U.S. Citizen in 2001. His research interests include (1) characterization, modeling, and simulation of power devices and (2) modeling, simulation, and design of power electronics circuits.

Tam H. Duong


Electrical Engineer
Semiconductor & Dimensional Metrology Division
Microelectronics Device Integration Group

Employment History:

Since 2008, Researcher in the Semiconductor Electronics Division

2004-2008, Guest Researcher in the Power Device and Thermal Metrology Project

Summer of 2002 and 2003, SURF Intern at NIST


Associate Degrees in Mathematics and Engineering, San Diego City College, 2000

Bachelor Degrees in Electrical Engineering and Computer Engineering, University of California at Irvine (UCI), 2003

M.S. degree in Electrical Engineering with a concentration on Power Electronics, UCI, 2006


Phone: 301-975-2081