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The Nanoelectronics Group conducts basic research to advance the optical and electrical measurement science infrastructure necessary for innovation in future nanoelectronic and thin-film devices, and their component materials. The Group pushes the frontiers of optical spectroscopies (e.g., Raman spectroscopy, spectroscopic ellipsometry, and infrared spectroscopy) and electrical measurements (e.g., magnetotransport, nanoelectronic test structure development, and temperature dependent current-voltage spectroscopy). The Group develops and advances novel measurements that combine and correlate optical and electrical methods such as internal photoemission, magneto-optical spectroscopy, and transient photocurrent spectroscopy. This new metrology supports the measurement and standards needs of the electronics, semiconductor, energy, health, defense, and other industries.
Thin Film Electronics—The Thin Film Electronics Project develops rigorous measurements and methodology needed for continued U.S. leadership in manufacturing and innovation of emerging electronic devices. Technical …
Nanoelectronic Device Metrology—The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable innovation and advanced manufacturing of emerging nanoelectronic information …
Optical Spectroscopy of Nanostructures—Understanding the underlying chemistry and physics of nanomaterials, including noble and transition metallic nanoparticles, carbon nanotubes, and graphene is the driver. While the tool of choice …
Physical Measurement Laboratory (PML)
100 Bureau Drive, M/S 8120
Gaithersburg, Maryland 20899-8120